測定治具の接触部の英語

接触式形状測定治具は、進退自由に、かつ平行に配列された同一長さの多数の測定棒体と、この測定棒体を進退自在に支持し前記軸線方向に延びる支持部材を有する。例文帳に追加

This contact type shape measuring tool has a large number of measuring rod bodies arrayed in parallel to be advanced and retracted, and a support member for supporting the measuring rod bodies to be advanced and retreated, and extended axis-directionally. - 特許庁

ランス孔２７から板バネ１１の弾性力測定治具２９を略垂直に挿入すると、これがバネ部１１Ｂの接触部１１Ａに略垂直に接触するようにされている。例文帳に追加

An elasticity measuring jig 29 of the leaf spring 11, when it is inserted almost vertically from the lance hole 27, is so made to come in almost vertical contact with the contact part 11A of the spring part 11B. - 特許庁

清掃治具１００は、複数の測定端子を有する電子部品検査装置の複数の測定端子とそれぞれ対応する配置で設けられ、複数の測定端子とそれぞれ接触されて該測定端子を清掃する複数の清掃部１４を有している。例文帳に追加

A cleaning mending tool 100 includes a plurality of cleaning parts 14 arranged corresponding to a plurality of measurement terminals of an electronic component inspection device having the plurality of measurement terminals so as to be brought into contact with the plurality of measurement terminals for cleaning the measurement terminals. - 特許庁

この測定治具３の基準面４ａを、ドラム２の任意の円錐形状部に当て、他の任意の円錐形状部に測定ゲージ５の接触子５ａを当てる。例文帳に追加

The reference surface 4a of the measuring tool 3 is butted on any conical section of the drum 2, and a contact 5a of the measuring gauge 5 is butted on any other conical section. - 特許庁

測定には、接触部６１として３つの同径の球体６５を有し、支持部６２として支柱６４および基台６３を有し、プローブ１７の先端球１７Ａに対して３つの接点で同時に接触する校正治具６０を用いる。例文帳に追加

For the measurement, a calibration jig 60 that has three spheres 65 of the same diameter as contact parts 61 and a supporting pillar 64 and a base table 63 making up a supporting unit 62 and comes into contact at three contact points at the same time with a tip sphere 17A of a probe 17 is used. - 特許庁

基板の微細化及び複雑化に対応することができるとともに、部品点数を低減した簡素化した構造の四端子測定用の接触子を備える検査用治具の提供。例文帳に追加

To provide a tool for inspection equipped with contacts for four-terminal measurement for coping with miniaturization and complication of a substrate while having a simplified structure with its component count reduced. - 特許庁

恒温液３内に電子部品を保持した熱伝達治具５の前記電子部品の保持部７を除く外面を浸漬し、上記電子部品に測定端子１９を接触させて特性検査を行う電子部品の検査方法と検査装置を提供する。例文帳に追加

The method and device for inspecting electronic component is provided by soaking an outer surface excluding a holding part 7 of the electronic component of a heat transmitting jig 5 which holds the electronic component in constant temperature liquid 3 and by making the electronic component contact a measurement terminal 19. - 特許庁