板状試料の英語

試料セル２００は、平板状の試料セル下板と複数の開口部を有する試料セル側板と平板状の試料セル上板とを接合して作られた閉鎖型セルであり、試料あるいは試料生成物を収容する複数の空間部を有している。例文帳に追加

The sample cell 200 is a closed cell formed by bonding a flat sample cell lower plate, a sample cell side plate having plural opening parts, and a flat sample cell upper plate, and has plural space parts for storing the sample or a sample product. - 特許庁

板状試料の流体処理方法ならびにその装置例文帳に追加

METHOD AND DEVICE OF LIQUID TREATMENT OF PLATE MATERIAL - 特許庁

半導体ウェハ等の板状の試料を装填する試料ホルダ及び荷電粒子ビーム装置例文帳に追加

SAMPLE HOLDER FOR LOADING PLATE-LIKE SAMPLE SUCH AS SEMICONDUCTOR WAFER AND CHARGED PARTICLE BEAM DEVICE - 特許庁

ウェハ１から採取した試料片３を、平板状の試料台４の側面４ａに設置する。例文帳に追加

The sample piece 3 collected from a wafer 1 is mounted to a side surface 4a of a flat-plate sample base 4. - 特許庁

試料を、支持ホルダに保持された固定板にて固定できる試料ホルダを提供することで、従来固定が困難だった小片の試料やフィルム状の試料も走査型プローブ顕微鏡の試料ステージに容易に固定できる。例文帳に追加

Small piece samples or film-like samples, which had previously been difficult to be fixed, can be easily fixed on a sample stage of scanning probe microscopes, by providing the sample holder can fix samples by a fixing plate held with a support holder. - 特許庁

板状の試料を試料台の所定の位置に吸着させるために、試料の外周面を押さえて試料を所定の位置に保持したまま、試料を平坦化や吸着しても、試料を擦らずに発塵しない位置決め装置を提供する。例文帳に追加

To provide a positioning device that does not rub off a sample not to scatter a dust even the sample is flattened and sucked with the circumference surface of the sample pressed and with the sample held to the predetermined position in order to keep the plate-like sample sucked to the predetermined position of the sample support. - 特許庁

平板状セル及びその製造方法並びに平板状セルへの試料導入方法と平板状セル内での試料流形成方法例文帳に追加

PLATE CELL, METHOD OF MANUFACTURING THE SAME, METHOD OF LEADING SAMPLE INTO PLATE CELL AND METHOD OF FORMING SAMPLE FLOW IN PLATE CELL - 特許庁

試料基板内の所望観察領域を試料基板を細かく分離せずに正確に位置出しして試料基板表面から任意の深さの領域についての平面試料を容易に作製することのできる薄片状試料の作製方法及び装置を提供すること。例文帳に追加

To provide a method and an apparatus for preparing a thin piece sample which accurately position a desired observation region in a sample substrate, without finely separating the sample substrate, and easily prepare a planar sample with regard to a region, at an arbitrary depth from the surface of the sample substrate. - 特許庁