試料温度データの英語

電子ビーム描画装置の試料ステージ１０６の温度変動と試料１０５の位置ずれ量との関係をデータとして求めておき、補正量演算器１１０の記憶手段に記憶しておく。例文帳に追加

The relationship between the temperature fluctuation of a sample stage 106 of an electron beam drawer and the positional deviation amount of a sample 105 is acquired as data, which is stored in a storage means of a correction amount calculator 110. - 特許庁

冷却過程の示差走査熱量測定結果から試料が潜熱により凝固温度で一定温度の状態を示す範囲を特定することが可能であることを発見し、この範囲のデータから試料の凝固点を求める方法を示した。例文帳に追加

In this method, it is found that the sample can specify a range showing the state of a constant state at the freezing temperature, by latent heat from the differential scanning calorimetry result in the cooling process, and the freezing point of the sample is determined, based on the data in this range. - 特許庁

はんだ濡れ性試験時の金属試料片温度とはんだペーストとの温度差及び、試験装置の設定温度と実測温度との差による影響を減少させ、試験データの精度及び信頼性を向上させるはんだ濡れ性試験方法及びはんだ濡れ性試験装置を提供することを目的とする。例文帳に追加

To obtain a solderability-testing method and device for improving the accuracy and reliability of test data by reducing influence due to the temperature difference between the temperature of a metal test piece and that of solder paste when testing solderability and the difference between a setting temperature and actually measured temperature of the testing device. - 特許庁

試料側および基準側で発生する熱量が異なるため温度差が生じ、温度差に応じた電圧が温度検出部５の熱電対３５に発生し、データ処理部４２により電圧値に基づく温度差が算出される。例文帳に追加

Temperature difference is produced because the heat values produced on the sample side and the reference side are different from each other while the voltage corresponding to the temperature difference is produced in the thermocouple 35 of a temperature detection part 5 and the temperature difference based on a voltage value is calculated by a data processing part 42. - 特許庁

試料表面の形状測定で、温度変化による形状測定データの誤差を適切に補正する手法を実現し正確な形状管理を行える形状測定データの補正方法等を提供する。例文帳に追加

To provide a method of correcting measured shape data etc., in a shape measurement of a sample surface capable of performing correct surface shape management by realizing a means for properly correcting the error of shape measurement data due to temperature fluctuation. - 特許庁

パターン描画時に、試料ステージの温度変動をもとに、予め記憶しておいたデータから試料の位置ずれ量を求め、偏向制御系１１５またはレーザ測定系１０９、電子レンズ制御系１１７で位置ずれ量の補正を行う。例文帳に追加

At pattern drawing, the positional deviation amount of a sample is acquired from the pre-stored data based on the temperature fluctuation of the sample stage, and the positional deviation amount is corrected by a deflection control system 115 or a laser measurement system 109, and an electron lens control system 117. - 特許庁

例えば或る温度で長時間放置した後に急激に変化が生じるような試料を分析する際に、急激な変化を正確に捉えつつデータ量を抑制する。例文帳に追加

To suppress the data quantity, while grasping accurately a sudden change, when analyzing, for example, a sample generating the sudden change after being left for long hours at a temperature. - 特許庁

酵素、金ナノ粒子および無機触媒を表面に固定させた電極を用い、試料の電流変化を検出すると共に、検出されたデータを温度補償により調整する。例文帳に追加

An electrode is used with an enzyme, gold nanoparticles, and an inorganic catalyst fixed on its surface to detect the change in the electric current flowing through a specimen, while adjusting the detected data through temperature compensation. - 特許庁