INTEGRATED CIRCUIT, TESTER FOR THE INTEGRATED CIRCUIT, TESTING METHOD FOR INTEGRATED CIRCUIT, TESTING METHOD PROGRAM FOR THE INTEGRATED CIRCUIT, AND RECORDING MEDIUM WITH RECORDED PROGRAM OF TESTING METHOD FOR THE INTEGRATED CIRCUIT 集積回路、集積回路の試験装置、集積回路の試験方法、集積回路の試験方法のプログラム及び集積回路の試験方法のプログラムを記録した記録媒体。 - 特許庁
SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN SUPPORT DEVICE, SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN SUPPORT METHOD, SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN SUPPORT PROGRRAM, SEMICONDUCTOR INTEGRATED CIRCUIT, AND METHOD FOR MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT 半導体集積回路設計支援装置、半導体集積回路設計支援方法、半導体集積回路設計支援プログラム、半導体集積回路、半導体集積回路の製造方法 - 特許庁