In the method, KAM values which indicate the differences in in-crystal orientations in the crystal grains, crystal grain boundaries, etc. of a test material which has consumed its material life time to prepare a master curve which represents the relation between the measured KAM values; the degree of consumption of material lifetimes in a first process. 本方法によれば、第1工程として材料寿命を消費した試験材料の結晶粒内,結晶粒界等の結晶方位差を示すKAM値を測定し、これと材料寿命の消費度との関係を表すマスターカーブを作成する。 - 特許庁