「Particle」を含む例文一覧(40853)

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  • PARTICLE COATING METHOD AND PARTICLE COATING APPARATUS
    粒子コーティング方法及び粒子コーティング装置 - 特許庁
  • RESIN PARTICLE AND MANUFACTURING METHOD OF RESIN PARTICLE
    樹脂粒子及び樹脂粒子の製造方法 - 特許庁
  • CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM PROCESSING METHOD
    荷電ビーム装置及び荷電ビーム加工方法 - 特許庁
  • INORGANIC PARTICLE AGGREGATE
    無機粒子凝集体 - 特許庁
  • PARTICLE BEAM TREATMENT DEVICE
    粒子線治療装置 - 特許庁
  • PROCESS FOR PRODUCING RESIN PARTICLE AND RESIN PARTICLE
    樹脂粒子の製造方法及び樹脂粒子 - 特許庁
  • CHARGED PARTICLE BEAM SYSTEM
    荷電粒子ビーム装置。 - 特許庁
  • PARTICLE IMAGE PROCESSOR
    粒子画像処理装置 - 特許庁
  • COBALT HYDROXIDE PARTICLE AND COBALT OXIDE PARTICLE
    水酸化コバルト粒子および酸化コバルト粒子 - 特許庁
  • NICKEL PARTICLE WITH DIELECTRIC PARTICLE AND METHOD OF PRODUCING THE NICKEL PARTICLE WITH DIELECTRIC PARTICLE
    誘電材粒子付ニッケル粒子及びその誘電材粒子付ニッケル粒子の製造方法 - 特許庁
  • PARTICLE REMOVING METHOD
    パーティクルの除去方法 - 特許庁
  • HIGH PERFORMANCE PARTICLE SOURCE FOR CHARGED PARTICLE RAY EQUIPMENT
    荷電粒子線装置用高性能粒子源 - 特許庁
  • METHOD FOR PRODUCING RESIN PARTICLE AND RESIN PARTICLE
    樹脂粒子の製造方法及び樹脂粒子 - 特許庁
  • FINE PARTICLE DETECTION APPARATUS
    微粒子検出装置 - 特許庁
  • ADHESIVE RESIN PARTICLE
    接着性樹脂粒子 - 特許庁
  • PARTICLE BEAM PROCESSING DEVICE
    粒子ビーム処理装置 - 特許庁
  • SiC PARTICLE MONITORING WAFER
    SiCパーティクルモニタウェハ - 特許庁
  • GROWTH METHOD OF FINE PARTICLE, GROWTH APPARATUS OF FINE PARTICLE, AND FINE PARTICLE
    微粒子の成長方法、微粒子の成長装置および微粒子 - 特許庁
  • METHOD OF PRODUCING CARBON PARTICLE, AND CARBON PARTICLE
    炭素粒子の製造方法及び炭素粒子 - 特許庁
  • QUASI-PARTICLE FOR SINTERING
    焼結用擬似粒子 - 特許庁
  • PARTICLE DISPERSION FOR FORMING PARTICLE FILM, AND PARTICLE FILM FORMING METHOD
    粒子膜形成用の粒子分散液、及び粒子膜形成方法 - 特許庁
  • PRODUCTION OF PARTICLE HAVING UNIFORM PARTICLE DIAMETER
    均一粒子径を有する粒子の製造方法 - 特許庁
  • FLUORESCENT SEMICONDUCTOR PARTICLE
    蛍光半導体粒子 - 特許庁
  • ULTRAFINE SEMICONDUCTOR PARTICLE
    半導体超微粒子 - 特許庁
  • NANO-PARTICLE COMPOSITE POLYMER
    ナノ粒子複合ポリマー - 特許庁
  • INORGANIC POROUS FINE PARTICLE
    無機多孔性微粒子 - 特許庁
  • GRINDING PARTICLE SLURRY FOR POLISHING
    研磨用砥粒スラリー - 特許庁
  • (b) The ratio (R/r) of the particle diameter (R) of the coarse particle to the particle diameter (r) of the fine particle is 4≤(R/r)≤30.
    (b)粗粒の粒径(R)と微粒の粒径(r)との比(R/r)は、4≦(R/r)≦30である。 - 特許庁
  • ALKALI AGENT-CONTAINING PARTICLE
    アルカリ剤含有粒子 - 特許庁
  • PARTICLE DETECTOR AND PARTICLE DETECTING METHOD
    粒子検出装置及び粒子検出方法 - 特許庁
  • PIGMENT-COMBINED PARTICLE
    顔料複合化粒子 - 特許庁
  • PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD
    粒子計測装置および粒子計測方法 - 特許庁
  • ANTIBACTERIAL COMPOSITE PARTICLE
    抗菌性複合粒子 - 特許庁
  • STANDARD PARTICLE COATING MACHINE
    標準粒子塗布機 - 特許庁
  • PERFUME PARTICLE COMPOSITION
    香料粒子組成物 - 特許庁
  • MANUFACTURING METHOD OF PARTICLE
    粒子の製造方法 - 特許庁
  • CHARGED PARTICLE BEAM SYSTEM
    荷電粒子ビーム装置 - 特許庁
  • PARTICLE AND PHOTON DETECTOR
    粒子・光子検出器 - 特許庁
  • CHARGED PARTICLE GENERATION SOURCE
    荷電粒子発生源 - 特許庁
  • PARTICLE BEAM THERAPY SYSTEM
    粒子線治療システム - 特許庁
  • PARTICLE BEAM TREATMENT SYSTEM
    粒子線治療システム - 特許庁
  • PARTICLE WASHING DEVICE AND PARTICLE WASHING METHOD
    粒子洗浄装置及び粒子洗浄方法 - 特許庁
  • PARTICLE PRODUCING METHOD AND PARTICLE PRODUCING APPARATUS
    粒子の製造方法及び粒子製造装置 - 特許庁
  • IRON OXIDE PARTICLE POWDER
    酸化鉄粒子粉末 - 特許庁
  • POLYMER FINE PARTICLE AND CONDUCTIVE FINE PARTICLE
    重合体微粒子および導電性微粒子 - 特許庁
  • PARTICLE CAPTURE DEVICE, PARTICLE ARRAYING METHOD AND PARTICLE ARRAYING DEVICE
    粒子捕捉装置、並びに粒子配列方法及び粒子配列装置 - 特許庁
  • PARTICLE MIXING DEVICE
    粉粒体混合装置 - 特許庁
  • FINE PARTICLE SEPARATOR
    微細粒子分離装置 - 特許庁
  • FINE PARTICLE INTRODUCING APPARATUS
    微粒子導入装置 - 特許庁
  • FINE PARTICLE MEASURING SYSTEM
    微粒子計測方式 - 特許庁
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