To provide a fault location specifying device of a memory cellarray part in which potential conditions in a cell core can be adjusted without function operation when an analysis tool for specifying a fault location is applied and abnormal current caused by a fault can be generation-promoted. 故障箇所特定用解析ツール適用時にファンクション動作を行わずにセルコア内電位条件を調整可能とし、故障起因の異常電流を発生促進できるメモリセルアレイ部故障箇所特定装置を提供する。 - 特許庁