出典:Wikipedia
出典:『Wikipedia』 (2011/04/21 22:54 UTC 版)
Automatic or Automated Test Equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.