「ray diffraction」を含む例文一覧(1018)
＜前へ 1 2 3 4 5 6 7 8 9 10 11 .... 20 21 次へ＞- AIRTIGHT SAMPLE HOLDER FOR X-RAY DIFFRACTION MEASUREMENT
Ｘ線回折測定用気密試料ホルダー - 特許庁 - To provide an X-ray diffraction measuring method facilitating X-ray diffraction measurement in a transmission method.
透過法のＸ線回折測定を容易としうるＸ線回折測定方法の提供。 - 特許庁 - STRESS HOLDING DEVICE AND X-RAY DIFFRACTION DEVICE
応力保持装置およびＸ線回折装置 - 特許庁 - X-RAY DIFFRACTION AND THERMAL ANALYSIS SIMULTANEOUS MEASUREMENT DEVICE
Ｘ線回折・熱分析同時測定装置 - 特許庁 - CALIBRATION METHOD OF ULTRA-PRECISE X-RAY DIFFRACTION APPARATUS
超精密Ｘ線回折装置の校正法 - 特許庁 - SAMPLE PRETREATMENT METHOD IN X-RAY DIFFRACTION
Ｘ線回折における試料前処理方法 - 特許庁 - DEVICE FOR OBSERVING BACK-REFLECTION X-RAY DIFFRACTION IMAGE
背面反射Ｘ線回折像観察装置 - 特許庁 - X-RAY ANALYZER FOR HAVING FLUORESCENCE AND DIFFRACTION FOR COMMON USE
蛍光・回折共用Ｘ線分析装置 - 特許庁 - TRANSMISSION TYPE DIFFRACTION GRATING FOR X-RAY, X-RAY TALBOT INTERFEROMETER AND X-RAY IMAGING APPARATUS
Ｘ線用透過型回折格子、Ｘ線タルボ干渉計およびＸ線撮像装置 - 特許庁 - SUPERCONDUCTING MAGNET UNIT FOR X-RAY DIFFRACTION APPARATUS
Ｘ線回折装置用超電導磁石装置 - 特許庁 - The gallium phthalocyanine compound has a diffraction peak at a Bragg angle of 26.4° to X-ray diffraction.
Ｘ線回折に対するブラッグ角２６．４度に回折ピークを有する。 - 特許庁 - X-RAY DIFFRACTION DEVICE, DATA ANALYSIS METHOD OF X-RAY DIFFRACTION DEVICE, CONTROL METHOD OF X-RAY DIFFRACTION DEVICE AND PROGRAM FOR IMPLEMENTING THE METHOD
Ｘ線回折装置、Ｘ線回折装置のデータ解析方法、Ｘ線回折装置の制御方法およびその方法を実現するためのプログラム - 特許庁 - A measuring device 2 performs X-ray diffraction measurement.
測定装置２はＸ線回折測定を行う。 - 特許庁 - X-RAY DIFFRACTION MEASURING CONTAINER FOR THIN-FILM SAMPLE
薄膜状試料用Ｘ線回折測定容器 - 特許庁 - A diffraction X-ray 5 diffraction at the sample 3 is measured in its intensity by an X-ray detector 6.
試料３で回折した回折Ｘ線５は、Ｘ線検出器６でその強度が測定される。 - 特許庁 - X-RAY DIFFRACTION MICROSCOPE APPARATUS AND X-RAY DIFFRACTION MEASURING METHOD BY THE SAME
Ｘ線回折顕微鏡装置およびＸ線回折顕微鏡装置によるＸ線回折測定方法 - 特許庁 - X-RAY DIFFRACTION MEASURING INSTRUMENT EQUIPPED WITH DEBYE-SCHERRER OPTICAL SYSTEM AND X-RAY DIFFRACTION MEASURING METHOD THEREFOR
デバイシェラー光学系を備えたＸ線回折測定装置とそのためのＸ線回折測定方法 - 特許庁 - MANUFACTURING METHOD FOR X-RAY PHASE TYPE DIFFRACTION GRATING AND AMPLITUDE TYPE DIFFRACTION GRATING USED FOR X-RAY TALBOT INTERFEROMETER
Ｘ線タルボ干渉計に用いられる位相型回折格子と振幅型回折格子の製造方法 - 特許庁 - METHOD AND PROGRAM FOR MEASURING/ANALYZING X-RAY DIFFRACTION
Ｘ線回折測定解析方法及びプログラム - 特許庁 - METHOD FOR CONTROLLING SCATTERING ANGLE OF INCIDENCE X RAY IN X-RAY DIFFRACTION DEVICE
Ｘ線回折装置における入射Ｘ線の発散角制御方法 - 特許庁 - MICRO X-RAY DIFFRACTION MEASURING METHOD AND MICRO X- RAY DIFFRACTOMETER
微小部Ｘ線回折測定方法及び微小部Ｘ線回折装置 - 特許庁 - The positive electrode active material has a diffraction peak at 8.4-10.4° of a diffraction angle 2θ in X-ray diffraction by a CuKα ray.
該正極活物質は、ＣｕＫα線によるＸ線回折において、回折角２θの８．４〜１０．４度の位置に回折ピークを有する。 - 特許庁 - CALIBRATION METHOD FOR TEMPERATURE IN X-RAY DIFFRACTION MEASUREMENT APPARATUS
Ｘ線回折測定装置の温度較正方法 - 特許庁 - MICRO-PORTION X-RAY IRRADIATION DEVICE AND MICRO-PORTION X-RAY IRRADIATION METHOD OF X-RAY DIFFRACTION DEVICE
Ｘ線回折装置の微小部Ｘ線照射装置及び微小部Ｘ線照射方法 - 特許庁 - The sample for X-ray diffraction measurement is analyzed by an X-ray diffraction device, to thereby measure the asbestos content.
このＸ線回折測定用試料をＸ線回折装置で分析しアスベスト含有量を測定する。 - 特許庁 - METHOD AND APPARATUS FOR CONTROLLING X-RAY DIFFRACTION INSTRUMENT
Ｘ線回折装置の制御方法及び制御装置 - 特許庁 - METHOD OF DYNAMICALLY DISPLAYING SCATTERING VECTOR OF X-RAY DIFFRACTION
Ｘ線回折の散乱ベクトルの動的表示方法 - 特許庁 - SAMPLE STAND-EXCHANGING DEVICE IN X-RAY DIFFRACTION APPARATUS
Ｘ線回折装置における試料台交換装置 - 特許庁 - PARALLEL X-RAY BEAM EXTRACTING METHOD AND APPARATUS, AND X-RAY DIFFRACTION SYSTEM
平行Ｘ線ビームの取り出し方法及び装置並びにＸ線回折装置 - 特許庁 - The X-ray diffraction intensity of the composite material by CuKα is represented by expression (1): I_1/I_2≤2 (1), wherein I_1 is the peak diffraction intensity at 2θ=5.5-6.5°; and I_2 is the peak diffraction intensity at 2θ=5.5-6.5°.
ここで、I_1:２θ＝5.5〜6.5°間のヒ゜ーク回折強度、I_2:２θ＝5.5〜6.5°間のヒ゜ーク回折強度である。 - 特許庁 - PROCESSING METHOD OF TWO-DIMENSIONAL X-RAY DETECTION DATA, TWO-DIMENSIONAL X-RAY DETECTION DEVICE, AND X-RAY DIFFRACTION DEVICE
二次元Ｘ線検出データの処理方法、二次元Ｘ線検出装置、およびＸ線回折装置 - 特許庁 - When calculating them, vector compensation is applied on X-ray diffraction intensity of each diffraction peak.
算出に際しては、各回折ピークのＸ線回折強度についてベクトル補正を行う。 - 特許庁 - To provide manufacturing methods for an X-ray phase type diffraction grating and an X-ray amplitude type diffraction grating used for an X-ray Talbot interferometer.
Ｘ線タルボ干渉計に用いられるＸ線位相型回折格子及びＸ線振幅型回折格子の製造方法を提案する。 - 特許庁 - REFLECTION TYPE DIFFRACTION GRATING HOLOGRAM AND X-RAY CONVERGING SYSTEM
反射型回折格子ホログラム及びＸ線集光システム - 特許庁 - ISOTROPIC HIGH-PRESSURE APPLYING DEVICE FOR X-RAY DIFFRACTION ANALYSIS
Ｘ線回折解析用等方性高圧力印加装置 - 特許庁 - To provide an X-ray diffraction device excellent in angle resolving power, reduced in the lowering of X-ray intensity and simplified in its structure in an X-ray diffraction method using a parallel beam method, and the X-ray diffraction method.
平行ビーム法を用いたＸ線回折法において、角度分解能が優れていて、Ｘ線強度の低下が少なく、構造が簡素化されたＸ線回折装置およびＸ線回折方法を提供する。 - 特許庁 - When the surface layer is subjected to X-ray diffraction, a diffraction peak corresponding to a (111) crystal plane is observed.
表層のＸ線回折により、（１１１）結晶面に対応した回折ピークが観察される。 - 特許庁 - INSTRUMENT AND METHOD FOR MEASURING X-RAY DIFFRACTION
Ｘ線回折測定装置およびＸ線回折測定方法 - 特許庁 - X-RAY DIFFRACTION MEASURING INSTRUMENT AND METHOD THEREFOR
Ｘ線回折測定装置およびＸ線回折測定方法 - 特許庁 - MEASUREMENT OF CRITICAL DIMENSIONS USING X-RAY DIFFRACTION IN REFLECTION MODE
反射モードのＸ線回折を用いた限界寸法の測定 - 特許庁 - DIFFRACTION GRATING FOR X-RAY INTERFEROMETER AND MANUFACTURING METHOD THEREOF
Ｘ線干渉計用の回折格子及びその製造方法 - 特許庁 - SAMPLE HOLDING DEVICE AND X-RAY DIFFRACTION APPARATUS USING DEVICE
試料保持装置および同装置を用いたＸ線回折装置 - 特許庁 - METHOD AND APPARATUS FOR X-RAY DIFFRACTION IMAGE CONTRAST BY MICROBALLOONS
マイクロバルーンによるＸ線回折造影方法および同装置 - 特許庁 - In X-ray diffraction, the Ewald sphere is drawn with a small radius.
X線回折においては、エワルド球は小さな半径で描かれる。 - 科学技術論文動詞集 - The crystal of compound A is one in which the characteristic diffraction peak at a diffraction angle 2θ(°) as measured by powder X-ray diffraction has a specified powder X-ray pattern.
化合物Ａの結晶であって、粉末Ｘ線回折で測定した回折角２θ（°）の特徴的回折ピークが特定の粉末Ｘ線回折パターンを有する結晶。 - 特許庁 - COMPACT MULTI-FOCUS X-RAY SOURCE, X-RAY DIFFRACTION IMAGING SYSTEM, AND METHOD FOR FABRICATING COMPACT MULTI-FOCUS X-RAY SOURCE
小型多焦点ｘ線源、ｘ線回折イメージングシステム、及び小型多焦点Ｘ線源を製作するための方法 - 特許庁 - DIFFRACTION GRATING FOR X-RAY TALBOT INTERFEROMETER, METHOD FOR MANUFACTURING THE SAME, AND X-RAY TALBOT INTERFEROMETER
Ｘ線タルボ干渉計用回折格子及びその製造方法、並びにＸ線タルボ干渉計 - 特許庁 - INTENSITY CORRECTION AT OBLIQUE INCIDENCE TO DETECTOR OF DIFFRACTION X-RAY IN X-RAY STRUCTURE ANALYSIS
Ｘ線構造解析における回折Ｘ線の検出器への斜め入射時の強度補正 - 特許庁 - The protective film has the X-ray diffraction peak intensity of (110) plane of chromium higher than the X-ray diffraction peak intensity of (200) plane.
保護膜は、Ｘ線回折によるクロムの（１１０）面の回折ピーク強度が、クロムの（２００）面の回折ピーク強度よりも大きい。 - 特許庁 - X-RAY DIFFRACTION DEVICE AND MEASURING METHOD OF SAMPLE USING THIS DEVICE
Ｘ線回折装置及び該装置を用いた試料の測定方法 - 特許庁
- 特許庁
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