reflection X-rayとは 意味・読み方・使い方

X-RAY REFLECTION DEVICE AND METHOD FOR MANUFACTURING THE SAME例文帳に追加

Ｘ線反射装置及びその製造方法 - 特許庁

SPECIMEN DRIP SUBSTRATE FOR TOTAL-REFLECTION FLUORESCENCE X-RAY ANALYSIS, TOTAL REFLECTION FLUORESCENT X-RAY ANALYZER, AND TOTAL REFLECTION FLUORESCENT X-RAY ANALYSIS METHOD例文帳に追加

全反射蛍光Ｘ線分析用試料点滴基板および全反射蛍光Ｘ線分析装置ならびに全反射蛍光Ｘ線分析方法 - 特許庁

The x-ray analysis apparatus has a reflection mirror having an x-ray transmission part between an x-ray source and a sample stage irradiated with an x-ray, and has a light condensing optical element for x-ray between the x-ray source and the reflection mirror.例文帳に追加

Ｘ線源とＸ線が照射される試料台との間にＸ線透過部を有する反射ミラーを有し、前記Ｘ線源と反射ミラーの間に、Ｘ線集光用光学素子を有するＸ線分析装置。 - 特許庁

ALIGNER FOR TOTAL REFLECTION LOCAL FLUORESCENT X-RAY ANALYSIS例文帳に追加

全反射局所蛍光Ｘ線分析用アライナー - 特許庁

METHOD AND APPARATUS FOR TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS例文帳に追加

全反射蛍光Ｘ線分析方法および装置 - 特許庁

TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS AND DEVICE FOR IT例文帳に追加

全反射蛍光Ｘ線分析法およびその装置 - 特許庁

X-RAY PHOTOELECTRON SPECTROMETER, TOTAL REFLECTION X-RAY PHOTOELECTRON SPECTROMETER AND ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROMETER例文帳に追加

Ｘ線光電子分光装置及び全反射Ｘ線光電子分光装置並びに角度分解Ｘ線光電子分光装置 - 特許庁

X-RAY REFLECTION MASK, METHOD FOR PROTECTING THE MASK, X-RAY EXPOSURE SYSTEM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE例文帳に追加

Ｘ線反射マスク、その保護方法、Ｘ線露光装置及び半導体デバイスの製造方法 - 特許庁