英和和英

出典:『Wikipedia』 (2010/11/09 14:16 UTC 版)

英語による解説

引用

A Highly Accelerated Life Test (HALT), is a stress testing methodology for accelerating product reliability during the engineering development process. It is commonly applied to electronic equipment and is performed to identify and thus help resolve design weaknesses in newly-developed equipment. Thus it greatly reduces the probability of in-service failures (i.e., it increases the product's reliability). Progressively more severe environmental stresses are applied building to a level significantly beyond what the equipment will see in-service. By this method weaknesses can be identified using a small number of samples (sometimes one or two but preferably at least five) in the shortest possible time and at least expense. A second function of HALT testing is that it characterises the equipment under test, and identifies the equipment's safe operating limits and design margins. Data from a HALT test is therefore used as a basis for the design of an optimal "HASS" or "ESS" test, which is used to screen every piece of production equipment for latent manufacturing defects and defective components. HASS or "Highly Accelerated Stress Screening" is an extension of HALT, but is applied during production.