「Defect」を含む例文一覧(18306)

＜前へ 1 2 .... 5 6 7 8 9 10 11 12 13 .... 366 367 次へ＞
  • DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD FOR SOLAR BATTERY
    太陽電池の欠陥検査装置及び欠陥検査方法 - 特許庁
  • WAFER DEFECT DETECTION METHOD
    ウェーハの欠陥検出方法 - 特許庁
  • DEFECT ANALYZER FOR MEMORY LSI AND DEFECT ANALYSIS METHOD
    メモリＬＳＩの不良解析装置及び不良解析方法 - 特許庁
  • PRISM DEFECT DETECTING METHOD AND PRISM DEFECT DETECTING DEVICE
    プリズム不良検出方法及びプリズム不良検出装置 - 特許庁
  • DEFECT DETECTING APPARATUS AND DEFECT DETECTION METHOD FOR HOLOGRAM
    ホログラムの欠陥検出装置および欠陥検出方法 - 特許庁
  • DEFECT DETECTION METHOD FOR SUBSTRATE AND DEFECT DETECTION SYSTEM THEREFOR
    基板の欠陥検出方法及びその欠陥検出システム - 特許庁
  • DEFECT INSPECTION DEVICE AND METHOD FOR SETTING THRESHOLD OF DEFECT INSPECTION
    欠陥検査装置および欠陥検査の閾値設定方法 - 特許庁
  • ARTICLE DEFECT INSPECTION APPARATUS AND ARTICLE DEFECT INSPECTION METHOD
    物品の欠陥検査装置、及び、物品の欠陥検査方法 - 特許庁
  • DEFECT INFORMATION MANAGEMENT SYSTEM AND DEFECT INFORMATION MANAGEMENT METHOD
    不具合情報管理システム及び不具合情報管理方法 - 特許庁
  • SUBSTRATE DEFECT INSPECTION METHOD AND SUBSTRATE DEFECT INSPECTION SYSTEM
    基板の欠陥検査方法および基板の欠陥検査システム - 特許庁
  • SUBSTRATE DEFECT INSPECTION SYSTEM AND SUBSTRATE DEFECT DETECTING METHOD
    基板の欠陥検査システム及び基板の欠陥検出方法 - 特許庁
  • DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS OF MICROSTRUCTURE
    微細構造物の欠陥検査方法及び欠陥検査装置 - 特許庁
  • DEFECT INFORMATION STORAGE DEVICE AND DEFECT INFORMATION STORAGE METHOD
    不良情報保存装置および不良情報保存方法 - 特許庁
  • DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD USING THE SAME
    欠陥検査装置およびそれを用いた欠陥検査方法 - 特許庁
  • METHOD FOR REPAIRING CASTING DEFECT
    鋳物欠陥の補修方法 - 特許庁
  • OPTICAL DISK DEFECT PROCESSING DEVICE
    光ディスク欠陥処理装置 - 特許庁
  • DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD FOR DISPLAY DEVICE
    表示体の欠陥検査装置および欠陥検査方法 - 特許庁
  • METHOD FOR CORRECTING OPC MASK DEFECT AND DEFECT CORRECTION DEVICE
    ＯＰＣマスク欠陥修正方法及び欠陥修正装置 - 特許庁
  • BONDING DEFECT DETECTOR AND BONDING DEFECT DETECTION METHOD
    接合不良検知装置、並びに、接合不良検知方法 - 特許庁
  • DEFECT OBSERVATION METHOD FOR SUBSTRATE
    基板の欠陥観察方法 - 特許庁
  • SURFACE DEFECT INSPECTION METHOD AND SURFACE DEFECT INSPECTION DEVICE
    表面欠陥検査方法および表面欠陥検査装置 - 特許庁
  • SURFACE DEFECT INSPECTION DEVICE AND SURFACE DEFECT INSPECTION METHOD
    表面欠陥検査装置および表面欠陥検査方法 - 特許庁
  • DEFECT-INSPECTION OPTICAL SYSTEM AND SURFACE-DEFECT INSPECTION APPARATUS
    欠陥検出光学系および表面欠陥検査装置 - 特許庁
  • COLOR FILTER DEFECT INSPECTING METHOD
    カラーフィルタ欠陥検査方法 - 特許庁
  • A defect-full-length measuring means 10 measures the entire length of the defect based on the defect position information and the area of the defect.
    欠陥全長測定手段１０は欠陥位置情報及び欠陥の面積から欠陥の全長を測定する。 - 特許庁
  • DISPLAY DEVICE, DEFECT DETECTING SYSTEM AND DEFECT DETECTING METHOD
    表示装置、欠陥検出システムおよび欠陥検出方法 - 特許庁
  • DEFECT INSPECTION DEVICE FOR FACE PLATE
    面板の欠陥検査装置 - 特許庁
  • CIRCUIT DEFECT-DETECTING SYSTEM AND METHOD FOR DETECTING CIRCUIT DEFECT
    回路欠陥検出システム及び回路欠陥検出方法 - 特許庁
  • PATTERN DEFECT CORRECTION METHOD AND PATTERN DEFECT CORRECTION DEVICE
    パターン欠陥修正方法およびパターン欠陥修正装置 - 特許庁
  • TRANSPARENT PLATE DEFECT INSPECTION APPARATUS
    透明板欠陥検査装置 - 特許庁
  • DEFECT DETECTION APPARATUS, DEFECT DETECTION METHOD, AND COMPUTER PROGRAM
    欠陥検出装置、欠陥検出方法及びコンピュータプログラム - 特許庁
  • DEFECT IMAGE PROCESSING DEVICE, DEFECT IMAGE PROCESSING METHOD, AND SEMICONDUCTOR DEFECT CLASSIFICATION DEVICE AND SEMICONDUCTOR DEFECT CLASSIFICATION METHOD
    欠陥画像処理装置、欠陥画像処理方法、半導体欠陥分類装置および半導体欠陥分類方法 - 特許庁
  • DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE OF GRAY TONE MASK, AND DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE OF PHOTOMASK
    グレートーンマスクの欠陥検査方法及び欠陥検査装置、並びにフォトマスクの欠陥検査方法及び欠陥検査装置 - 特許庁
  • Defect information is stored in a defect information storage area (17).
    欠陥の情報が、欠陥情報記憶部(17)に記憶される。 - 特許庁
  • TRANSFER FOIL DEFECT INSPECTION DEVICE
    転写箔欠点検査装置 - 特許庁
  • DEFECT DETECTING OPTICAL SYSTEM AND SURFACE DEFECT INSPECTING APPARATUS
    欠陥検出光学系および表面欠陥検査装置 - 特許庁
  • PHOTONIC CRYSTAL DEFECT WAVEGUIDE AND PHOTONIC CRYSTAL DEFECT DEVICE
    フォトニック結晶欠陥導波路、フォトニック結晶欠陥デバイス - 特許庁
  • POLYIMIDE FILM HAVING LITTLE DEFECT
    欠陥の少ないポリイミドフィルム - 特許庁
  • DEFECT DETECTING DEVICE, DEFECT DETECTING METHOD, AND COMPUTER PROGRAM
    欠陥検出装置、欠陥検出方法及びコンピュータプログラム - 特許庁
  • METHOD FOR DETERMINING PHOTOMASK DEFECT
    フォトマスク欠陥判定方法 - 特許庁
  • SURFACE LAYER DEFECT DETECTION DEVICE
    表層欠陥検出装置 - 特許庁
  • DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD USING IT
    欠陥検査装置およびそれを用いた欠陥の検査方法 - 特許庁
  • UNDERWATER DEFECT INSPECTION DEVICE AND UNDERWATER DEFECT INSPECTION METHOD
    水中欠陥検査装置及び水中欠陥検査方法 - 特許庁
  • SURFACE DEFECT DETECTING METHOD
    表面欠陥検出方法 - 特許庁
  • A defect detection and correction part 40 is composed so that defect detection processing has a plurality of defect detection modes and defect correction processing has a plurality of defect correction modes.
    欠陥検出修正部４０は、欠陥検出処理は複数の欠陥検出モードを有し、欠陥修正処理は複数の欠陥修正モードを有する。 - 特許庁
  • To provide a defect inspection method capable of capturing surely a deformation defect, and discriminating easily the deformation defect and the other defect such as a foreign matter defect, and a defect inspection device.
    変形欠陥の捕捉が確実に行えるとともに、変形欠陥と異物欠陥など他の欠陥との判別が容易に行える欠陥検査方法および欠陥検査装置の提供。 - 特許庁
  • METHOD FOR REPAIRING DEFECT ON SUBSTRATE
    基板欠陥の修理方法 - 特許庁
  • APPARATUS FOR ANALYZING SEMICONDUCTOR DEFECT
    半導体不良解析装置 - 特許庁
  • CYLINDRICAL BODY DEFECT INSPECTION APPARATUS
    円筒体欠陥検査装置 - 特許庁
  • FRONT PLATE DEFECT MEASURING APPARATUS
    前面板欠陥測定装置 - 特許庁
＜前へ 1 2 .... 5 6 7 8 9 10 11 12 13 .... 366 367 次へ＞

例文データの著作権について

  • 特許庁
    Copyright © Japan Patent office. All Rights Reserved.