「Defect」を含む例文一覧(18306)

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  • DISCRIMINATION METHOD FOR CASTING DEFECT
    鋳造欠陥の識別方法 - 特許庁
  • METHOD FOR CORRECTING DEFECT OF DISPLAY SUBSTRATE AND DEFECT CORRECTING DEVICE
    表示基板の欠陥修正方法および欠陥修正装置 - 特許庁
  • DEFECT INSPECTION METHOD, DEFECT INSPECTING APPARATUS, DEFECT INSPECTION PROGRAM, RECORDING MEDIUM STORING THE PROGRAM RECORDED THEREON
    欠陥検査方法、欠陥検査装置、欠陥検査プログラム、及びそのプログラムを記録した記録媒体 - 特許庁
  • POTENTIAL-DIFFERENCE-METHOD TERMINAL FOR DEFECT DETECTION AND DEFECT DETECTING APPARATUS
    欠陥検出用電位差法端子並びに欠陥検出装置 - 特許庁
  • DEFECT INSPECTION METHOD AND APPARATUS
    欠陥検査方法及び装置 - 特許庁
  • DEFECT INSPECTION DEVICE AND METHOD
    欠陥検査装置及び方法 - 特許庁
  • DEFECT DETECTING DEVICE AND DEFECT DETECTING METHOD OF ROLLED FILM
    ロール状フィルムの欠陥検出装置及び欠陥検出方法 - 特許庁
  • DEFECT DETECTION DEVICE FOR TRANSPARENT MEMBER AND DEFECT DETECTION METHOD
    透明部材の欠陥検出装置及び欠陥検出方法 - 特許庁
  • DEFECT INSPECTION METHOD, DEFECT INSPECTION DEVICE, DEFECT INSPECTION PROGRAM, AND STORAGE MEDIUM FOR STORING PROGRAM
    欠陥検査方法、欠陥検査装置、欠陥検査プログラム、このプログラムを記憶した記憶媒体 - 特許庁
  • RING END FACE DEFECT INSPECTION APPARATUS
    リング端面欠陥検査装置 - 特許庁
  • TRANSPARENT OBJECT DEFECT INSPECTION METHOD AND DEFECT INSPECTING APPARATUS
    透過物体の欠陥検査方法、透過物体欠陥検査装置 - 特許庁
  • DEFECT DETECTING METHOD AND DEFECT DETECTING DEVICE OF SHEET-LIKE MATERIAL
    シート状物の欠陥検出方法及び欠陥検出装置 - 特許庁
  • DEFECT IDENTIFICATION METHOD, DEFECT IDENTIFICATION APPARATUS, PROGRAM, AND RECORDING MEDIUM
    欠陥識別方法、欠陥識別装置、プログラム、及び記録媒体 - 特許庁
  • MASTER DISK DEFECT MEASURING DEVICE AND MASTER DISK DEFECT MEASURING METHOD
    原盤ディフェクト測定装置、及び原盤ディフェクト測定方法 - 特許庁
  • DEFECT ANALYZING DEVICE FOR SEMICONDUCTOR DEVICE, AND METHOD FOR ANALYZING DEFECT
    半導体装置の不良解析装置及び不良解析方法 - 特許庁
  • POINT DEFECT DETECTION METHOD AND POINT DEFECT PIXEL VALUE CORRECTION METHOD
    点欠陥検出方法および点欠陥画素値補正方法 - 特許庁
  • DEFECT CLASSIFICATION SYSTEM, IMAGE FORMING APPARATUS AND DEFECT CLASSIFICATION PROGRAM
    欠陥分類システム、画像形成装置および欠陥分類プログラム - 特許庁
  • PHOTOELECTRIC CONVERSION ELEMENT, DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
    光電変換素子、欠陥検査装置及び欠陥検査方法 - 特許庁
  • SURFACE DEFECT DETECTING METHOD AND SURFACE DEFECT DETECTING DEVICE
    表面欠陥検出方法および表面欠陥検出装置 - 特許庁
  • DEFECT INSPECTION DEVICE AND METHOD THEREOF, AND DEFECT INSPECTION PROGRAM
    欠陥検査装置及びその方法並びに欠陥検査プログラム - 特許庁
  • DEVICE FOR DETECTING DEFECT OF ALUMINUM FOIL
    アルミ箔不良検出装置 - 特許庁
  • DEFECT DETECTING DEVICE, OPTICAL DISK DEVICE, AND DEFECT DETECTING METHOD
    欠陥検出装置、光ディスク装置及び欠陥検出方法 - 特許庁
  • SEALING METHOD FOR SURFACE DEFECT
    表面欠陥の封止方法 - 特許庁
  • A defect size calculation part 18f measures the size of the defect on the basis of the defect structure point.
    欠損サイズ算出部１８ｆは、欠損構成点に基づいて欠損のサイズを計測する。 - 特許庁
  • DEFECT INSPECTING DEVICE AND METHOD FOR INSPECTING DEFECT OF SEMICONDUCTOR DEVICE
    半導体装置の欠陥検査装置及び欠陥検査方法 - 特許庁
  • DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE OF SURFACE OF OBJECT
    物体表面の欠陥検査方法および欠陥検査装置 - 特許庁
  • FILM OPTICAL DEFECT INSPECTION DEVICE
    フィルム光学欠点検査装置 - 特許庁
  • To provide a defect inspection device and defect inspection method capable of omitting a false defect and inspecting a defect at high inspection sensitivity.
    擬似欠陥を除外して高い検査感度で欠陥検査が可能な欠陥検査装置及び欠陥検査方法を提供する。 - 特許庁
  • REPAIR/IMPROVEMENT METHOD FOR DEFECT/DEFECT IN STRUCTURE INSIDE METAL MEMBER
    金属部材内部の欠陥／組織不良補修・改善方法 - 特許庁
  • COLOR FILTER DEFECT INSPECTION METHOD
    カラーフィルタの欠陥検査方法 - 特許庁
  • CRYSTAL DEFECT-DETECTING APPARATUS AND METHOD FOR DETECTING CRYSTAL DEFECT
    結晶欠陥検出装置及び結晶欠陥検出方法 - 特許庁
  • GLASS SUBSTRATE DEFECT CHECKUP DEVICE AND GLASS SUBSTRATE DEFECT CHECKUP METHOD
    ガラス基板欠陥検査装置及びガラス基板欠陥検査方法 - 特許庁
  • DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD FOR COLOR FILTER SUBSTRATE
    カラーフィルタ基板の欠陥検査装置および欠陥検査方法 - 特許庁
  • DEFECT MARKING METHOD, DEFECT MARKING DEVICE, AND DEFECT DETECTING SYSTEM FOR ANTI-GLARE DIE
    欠陥マーキング方法、欠陥マーキング装置および防眩処理用金型の欠陥検出システム - 特許庁
  • DEFECT CORRECTION METHOD AND DEFECT CORRECTION DEVICE OF REFLECTIVE MASK
    反射型マスクの欠陥修正方法及び欠陥修正装置 - 特許庁
  • DEFECT INSPECTION METHOD OF ANTIREFLECTION FILM AND DEFECT INSPECTION APPARATUS
    反射防止フィルムの欠陥検査方法及び欠陥検査装置 - 特許庁
  • DEFECT INSPECTION METHOD, DEFECT INSPECTION DEVICE AND PATTERN EXTRACTION METHOD
    欠陥検査方法、欠陥検査装置、及びパターン抽出方法 - 特許庁
  • DATA COMPRESSION METHOD, DEFECT INSPECTION METHOD, AND DEFECT INSPECTION DEVICE
    データ圧縮方法、欠陥検査方法および欠陥検査装置 - 特許庁
  • IMAGE DEFECT CORRECTION DEVICE, IMAGE DEFECT CORRECTION METHOD, AND PROGRAM
    画像欠陥補正装置、画像欠陥補正方法、及びプログラム - 特許庁
  • METAL RING DEFECT DETECTOR
    金属リング欠陥検出装置 - 特許庁
  • DEFECT INSPECTION RECIPE CREATING METHOD
    欠陥検査レシピ作成方法 - 特許庁
  • DEFECT DETECTION METHOD AND DEFECT DETECTOR FOR PLATE-SHAPED GLASS
    板状ガラスの欠陥検出方法及び欠陥検出装置 - 特許庁
  • DEFECT DETECTION DEVICE AND METHOD, AND DEFECT DETECTION PROGRAM
    欠陥検出装置及び方法、並びに欠陥検出プログラム - 特許庁
  • DEFECT RELIEF DETERMINATION DEVICE AND DEFECT RELIEF DETERMINATION METHOD
    不良救済判定装置および不良救済判定方法 - 特許庁
  • IMAGING DEVICE, DEFECT CORRECTION APPARATUS, DEFECT CORRECTION METHOD, AND PROGRAM
    撮像装置、欠陥補正装置、欠陥補正方法及びプログラム - 特許庁
  • WIRING PATTERN DEFECT CONFIRMING APPARATUS
    配線パターン欠陥確認装置 - 特許庁
  • DEFECT INSPECTING DEVICE AND METHOD THEREFOR
    欠陥検査装置及び方法 - 特許庁
  • DEFECT INSPECTING DEVICE AND METHOD
    欠陥検査装置および方法 - 特許庁
  • METHOD FOR REPAIRING RECESSED DEFECT PART
    凹状欠陥部の補修方法 - 特許庁
  • DEFECT CORRECTION CIRCUIT OF IMAGING SENSOR
    画像センサの欠陥補正回路 - 特許庁
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