NEAR FIELD SCANNING OPTICAL MICROSCOPEとは 意味・読み方・使い方

CANTILEVER FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPE AND ITS MANUFACTURE AS WELL AS SCANNING NEAR-FIELD OPTICAL MICROSCOPE例文帳に追加

走査型近接場光学顕微鏡用のカンチレバーとその製造方法及び走査型近接場光学顕微鏡 - 特許庁

PRECISION MACHINING METHOD USING NEAR FIELD SCANNING OPTICAL MICROSCOPE例文帳に追加

近接場走査光学顕微鏡を用いた精密加工方法 - 特許庁

SCANNING NEAR FIELD OPTICAL MICROSCOPE AND PROBE FOR IT例文帳に追加

近接場光学顕微鏡および近接場光学顕微鏡用探針 - 特許庁

To provide a scanning near-field optical microscope capable of detecting a near-field signal with a superior S/N ratio.例文帳に追加

近接場信号を良好なＳ／Ｎで検出できる走査型近接場光顕微鏡を提供する。 - 特許庁

To provide a probe sharpening method capable of arbitrarily forming the taper angle of the leading end of a probe for STM(scanning tunnel microscope), AFM(atomic force microscope) and SNOM(scanning near field optical microscope).例文帳に追加

ＳＴＭ、ＡＦＭ、ＳＮＯＭ用のプローブ先端のテーパー角を任意に形成可能なプローブの尖鋭化方法を提供する。 - 特許庁

OPTICAL WAVEGUIDE PROBE, ITS MANUFACTURING METHOD AND SCANNING-TYPE NEAR FIELD MICROSCOPE例文帳に追加

光導波路プローブおよびその製造方法、ならびに走査型近視野顕微鏡 - 特許庁

CALIBRATION METHOD FOR NEAR FIELD SCANNING OPTICAL MICROSCOPE LASER PROCESSING DEVICE AND DEVICE THEREFOR例文帳に追加

ニアフィールド走査光学顕微鏡レーザ加工装置の較正方法および装置 - 特許庁

GENERATING METHOD OF NEAR-FIELD LIGHT, MASK FOR NEAR-FIELD EXPOSURE, NEAR-FIELD EXPOSING METHOD AND DEVICE, NEAR FIELD LIGHT HEAD, SCANNING NEAR-FIELD OPTICAL MICROSCOPE, AND RECORDING/REPLAYING DEVICE例文帳に追加

近接場光の発生方法、近接場露光用マスク、近接場露光方法、近接場露光装置、近接場光ヘッド、近接場光学顕微鏡、記録・再生装置 - 特許庁