average primary particleとは 意味・読み方・使い方

The negative electrode active material has an average particle size of 0.1-100 μm, and its primary particles have an average particle size of 0.01-10 μm.例文帳に追加

前記負極活物質は、１次粒子の平均粒子径が０．０１〜１０μｍである蓄電デバイス用負極活物質。 - 特許庁

Preferably, the average primary particle size of the fumed silica is at most 50 nm.例文帳に追加

また、ヒュームドシリカの平均一次粒子径は５０ｎｍ以下であることが好ましい。 - 特許庁

(Carbon black A) average primary particle size: 10 to 40 nm, 100 mass parts.例文帳に追加

（カーボンブラックＡ）平均一次粒径：１０ｎｍ乃至４０ｎｍ、１００質量部。 - 特許庁

An average value of the primary particle diameters of the silica fine particles is 50 nm or less.例文帳に追加

該シリカ微粒子の一次粒子直径の平均値が５０ｎｍ以下である。 - 特許庁

The coating material for forming the transparent conductive film comprises a ruthenium fine particle whose primary particle has an average particle size of 1-30 nm and a tin-doped indium oxide fine particle whose primary particle has an average particle size of 35-70 nm.例文帳に追加

本発明の透明導電膜形成用塗料は、１次粒子の平均粒径が１〜３０ｎｍのルテニウム微粒子と、１次粒子の平均粒径が３５〜７０ｎｍのスズ添加酸化インジウム微粒子とを含有してなることを特徴とする。 - 特許庁

The toner is prepared by using a colorant having a number average primary particle diameter of 30 nm to 200 nm and having a number average particle diameter included in the toner as 1.1 to 2.5 times as the number average primary particle diameter.例文帳に追加

数平均１次粒径が３０ｎｍ以上２００ｎｍ以下であり、トナー中に含有されているときの数平均粒径が数平均１次粒径の１．１倍以上２．５倍以下となる着色剤を用いるトナー。 - 特許庁

Silica particles whose primary number average particle diameter is ≤30 nm are located on the surfaces of toner particles and additive particles whose primary number average particle diameter is ≤50 nm and larger than the primary number average particle diameter of the silica particles are located on the surfaces of carrier particles.例文帳に追加

１次個数平均粒子径が３０ｎｍ以下のシリカ粒子をトナー粒子表面に外添すると共に、１次個数平均粒子径が５０ｎｍ以下で、シリカ粒子の１次個数平均粒子径より大きい外添粒子をキャリア粒子表面に外添する。 - 特許庁

The slurry is provided so as to include a ceramic particle having a particle size of two times or more than the average particle size of the primary particle at a predetermined ratio.例文帳に追加

前記スラリーは一次粒子の平均粒子径の２倍以上の粒子径を有するセラミック粒子が所定の割合で含まれるようにする。 - 特許庁