「particle sample」に関連した英語例文の一覧と使い方 - Weblio英語例文検索

SAMPLE HOLDER AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料ホルダ及び荷電粒子線装置 - 特許庁

SAMPLE HOLDER FOR CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子線装置用の試料ホルダ - 特許庁

SAMPLE STAGE AND CHARGED PARTICLE RAY APPARATUS例文帳に追加

試料ステージ及び荷電粒子線装置 - 特許庁

SAMPLE HOLDER, USAGE OF THIS SAMPLE HOLDER, AND CHARGED PARTICLE DEVICE例文帳に追加

試料ホールダ，該試料ホールダの使用法、及び荷電粒子装置 - 特許庁

SAMPLE SUPPORTING DEVICE FOR CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子線装置の試料支持装置 - 特許庁

SAMPLE HOLDING APPARATUS FOR CHARGED PARTICLE BEAM APPARATUS例文帳に追加

荷電粒子線装置用試料保持装置 - 特許庁

SAMPLE SCANNING MECHANISM FOR CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子ビーム装置の試料走査機構 - 特許庁

SAMPLE TRANSFERRING DEVICE FOR CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子線装置用試料移動装置 - 特許庁

PARTICLE OPTICAL DEVICE FOR OBSERVING SAMPLE SIMULTANEOUSLY USING PARTICLE AND PHOTON例文帳に追加

粒子と光子で同時に試料を観察する粒子光学装置 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND METHOD OF IRRADIATING SAMPLE WITH CHARGED PARTICLE BEAM BY USING CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子線装置及びそれを用いた試料への荷電粒子照射方法 - 特許庁

SAMPLE STAGE DEVICE AND CHARGED PARTICLE RADIATION DEVICE例文帳に追加

試料ステージ装置、及び荷電粒子線装置 - 特許庁

SAMPLE MICROMOTION SYSTEM, AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料微動システム、及び荷電粒子線装置 - 特許庁

SAMPLE MOUNTING DEVICE AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料設置装置、及び荷電粒子ビーム装置 - 特許庁

SAMPLE HOLDING DEVICE AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料保持装置および荷電粒子線装置 - 特許庁

SAMPLE POSITIONING DEVICE OF CHARGED PARTICLE BEAM APPARATUS例文帳に追加

荷電粒子線装置の試料位置決め装置 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD例文帳に追加

荷電粒子線装置および試料観察方法 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND SAMPLE MANUFACTURING METHOD例文帳に追加

荷電粒子ビーム装置及び試料作製方法 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND SAMPLE PROCESSING METHOD例文帳に追加

荷電粒子ビーム装置及び試料加工方法 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND SAMPLE MANUFACTURING METHOD例文帳に追加

荷電粒子線装置及び試料作製方法 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND METHOD OF MANUFACTURING SAMPLE例文帳に追加

荷電粒子線装置及び試料作製方法 - 特許庁

SAMPLE CONDITIONER FOR MEASUREMENT PARTICLE IN OIL例文帳に追加

油中の粒子測定用試料調整装置 - 特許庁

CHARGED PARTICLE BEAM EQUIPMENT AND SAMPLE MANUFACTURING EQUIPMENT例文帳に追加

荷電粒子線装置および試料作製装置 - 特許庁

SAMPLE MEASURING METHOD AND CHARGED PARTICLE BEAM APPARATUS例文帳に追加

試料測定方法、及び荷電粒子線装置 - 特許庁

SAMPLE HOLDER, SAMPLE CARRYING MECHANISM WITH SAMPLE HOLDING MECHANISM, AND CHARGED PARTICLE RADIATION DEVICE例文帳に追加

試料ホルダ、及び試料保持機構を備えた試料搬送機構並びに荷電粒子線装置 - 特許庁

CHARGED PARTICLE BEAM DEVICE, AND METHOD OF PREPARING SAMPLE例文帳に追加

荷電粒子ビーム装置、および試料作成方法 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION TECHNIQUE USING CHARGED PARTICLE BEAM例文帳に追加

荷電粒子線装置および荷電粒子線を用いた試料観察手法 - 特許庁

CHARGED PARTICLE BEAM DEVICE, AND SAMPLE IMAGE DISPLAYING METHOD例文帳に追加

荷電粒子線装置及び試料像表示方法 - 特許庁

SAMPLE IMAGE ROTATING METHOD, AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料像回転方法、及び荷電粒子線装置 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND SAMPLE IMAGE OBSERVATION METHOD例文帳に追加

荷電粒子線装置及び試料像観察方法 - 特許庁

SAMPLE IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料像形成方法及び荷電粒子線装置 - 特許庁

SAMPLE IMAGE FORMATION METHOD AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料像形成方法及び荷電粒子線装置 - 特許庁

SAMPLE CONTAINER MOVING METHOD IN SAMPLE PREPARATION PART OF PARTICLE SIZE DISTRIBUTION MEASURING DEVICE例文帳に追加

粒径分布測定装置の試料調整部における試料容器移動方法 - 特許庁

SAMPLE HEIGHT ADJUSTMENT METHOD, SAMPLE OBSERVATION METHOD, SAMPLE PROCESSING METHOD, AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料高さ調整方法と試料観察方法と試料加工方法および荷電粒子ビーム装置 - 特許庁

Each reference vector represents a particle size or range of a particle size distribution of the sample colloid.例文帳に追加

各参照ベクトルは、サンプルコロイドの粒径もしくは粒径分布の範囲を表す。 - 特許庁

CHARGED PARTICLE BEAM APPLICATION DEVICE, AND SAMPLE INSPECTION METHOD例文帳に追加

荷電粒子線応用装置、及び試料検査方法 - 特許庁

INSPECTION OF SAMPLE, MEASURING METHOD, AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料の検査，測定方法、及び荷電粒子線装置 - 特許庁

SAMPLE UNEVENNESS DETERMINING METHOD AND CHARGED PARTICLE BEAM APPARATUS例文帳に追加

試料の凹凸判定方法、及び荷電粒子線装置 - 特許庁

CHARGED PARTICLE BEAM DEVICE, AND SAMPLE PROCESSING/OBSERVING METHOD例文帳に追加

荷電粒子線装置、及び試料加工観察方法 - 特許庁

The calibration sample may have a standard particle.例文帳に追加

前記校正試料は、標準粒子を具備してもよい。 - 特許庁

CHARGED PARTICLE BEAM APPLICATION DEVICE AND SAMPLE OBSERVATION METHOD例文帳に追加

荷電粒子線応用装置及び試料観察方法 - 特許庁

METHOD FOR MEASURING AEROSOL PARTICLE IN GAS SAMPLE例文帳に追加

ガス状試料中のエアゾ−ル粒子を測定する方法 - 特許庁

SAMPLE DIMENSION MEASURING METHOD AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

試料寸法測定方法及び荷電粒子線装置 - 特許庁

METHOD AND SYSTEM FOR MEASURING PARTICLE IN LIQUID SAMPLE例文帳に追加

液体試料中の粒子の測定の方法およびシステム - 特許庁

IRREGULARITY DETERMINATION METHOD OF SAMPLE, AND CHARGED PARTICLE RADIATION DEVICE例文帳に追加

試料の凹凸判定方法、及び荷電粒子線装置 - 特許庁

METHOD FOR TRANSFERRING SAMPLE IN CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM DEVICE AND SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPE例文帳に追加

荷電粒子ビーム装置における試料移設方法及び荷電粒子ビーム装置並びに透過電子顕微鏡用試料 - 特許庁