「X-ray diffraction」に関連した英語例文の一覧と使い方 - Weblio英語例文検索

X-RAY DIFFRACTION DEVICE AND MEASUREMENT METHOD BY X-RAY DIFFRACTION例文帳に追加

Ｘ線回折装置及びＸ線回折の測定方法 - 特許庁

X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD例文帳に追加

Ｘ線回折装置及びＸ線回折測定方法 - 特許庁

X-RAY DIFFRACTION METHOD AND X-RAY DIFFRACTION APPARATUS例文帳に追加

Ｘ線回折方法及びＸ線回折装置 - 特許庁

X-RAY DIFFRACTION METHOD AND X-RAY DIFFRACTION APPARATUS例文帳に追加

Ｘ線回折方法およびＸ線回折装置 - 特許庁

X-RAY DIFFRACTION MEASUREMENT METHOD AND X-RAY DIFFRACTION DEVICE例文帳に追加

Ｘ線回折測定方法及びＸ線回折装置 - 特許庁

X-RAY DIFFRACTION DEVICE AND X-RAY DIFFRACTION METHOD例文帳に追加

Ｘ線回折装置およびＸ線回折方法 - 特許庁

X-RAY DIFFRACTION JIG, X-RAY DIFFRACTION DEVICE, AND MEASURING METHOD OF X-RAY DIFFRACTION例文帳に追加

Ｘ線回折用治具、Ｘ線回折装置およびＸ線回折の測定方法 - 特許庁

WAVELENGTH DISCRIMINATION X-RAY DIFFRACTION DEVICE例文帳に追加

波長分別型Ｘ線回折装置 - 特許庁

MINUTE PART X-RAY DIFFRACTION APPARATUS例文帳に追加

微小部Ｘ線回折装置 - 特許庁

SINGLE-CRYSTAL X-RAY DIFFRACTION SYSTEM例文帳に追加

単結晶Ｘ線回折システム - 特許庁

COMBINATORIAL X-RAY DIFFRACTION DEVICE例文帳に追加

コンビナトリアルＸ線回折装置 - 特許庁

X-RAY DIFFRACTION MEASUREMENT METHOD例文帳に追加

Ｘ線回折測定方法 - 特許庁

X-RAY DIFFRACTION MEASURING METHOD例文帳に追加

Ｘ線回折測定方法 - 特許庁

GONIOMETER FOR X-RAY DIFFRACTION DEVICE例文帳に追加

Ｘ線回折装置用ゴニオメータ - 特許庁

X-RAY DIFFRACTION MEASUREMENT DEVICE例文帳に追加

Ｘ線回折測定装置 - 特許庁

X-RAY DIFFRACTION QUANTIFYING DEVICE例文帳に追加

Ｘ線回折定量装置 - 特許庁

X-RAY DIFFRACTION OPTICAL ELEMENT例文帳に追加

Ｘ線回折光学素子 - 特許庁

X-RAY DIFFRACTION DETERMINATION APPARATUS例文帳に追加

Ｘ線回折定量装置 - 特許庁

X-Ray Powder Diffraction Method例文帳に追加

粉末Ｘ線回折測定法 - 厚生労働省

X-RAY DIFFRACTION ANALYSIS SYSTEM AND X-RAY DIFFRACTION ANALYSIS METHOD例文帳に追加

Ｘ線回折分析システム、および、Ｘ線回折分析方法 - 特許庁

X-RAY DIFFRACTION METHOD AND PORTABLE X-RAY DIFFRACTION APPARATUS USING THE SAME例文帳に追加

Ｘ線回折方法及びそれを用いた可搬型Ｘ線回折装置 - 特許庁

X-RAY DIFFRACTION ANALYZER AND X-RAY DIFFRACTION ANALYZING METHOD例文帳に追加

Ｘ線回折分析装置およびＸ線回折分析方法 - 特許庁

X-RAY DIFFRACTION ANALYZING METHOD AND X-RAY DIFFRACTION ANALYZER例文帳に追加

Ｘ線回折分析方法およびＸ線回折分析装置 - 特許庁

ANGLE CORRECTION METHOD IN X-RAY DIFFRACTION MEASUREMENT AND X-RAY DIFFRACTION SYSTEM例文帳に追加

Ｘ線回折測定における角度補正方法及びＸ線回折装置 - 特許庁

X-RAY DIFFRACTION APPARATUS AND MEASURING METHOD OF X-RAY DIFFRACTION PATTERN例文帳に追加

Ｘ線回折装置およびＸ線回折パターンの測定方法 - 特許庁

X-RAY DIFFRACTOMETER AND METHOD FOR X-RAY DIFFRACTION MEASUREMENT例文帳に追加

Ｘ線回折装置及びＸ線回折測定方法 - 特許庁

METHOD OF MEASURING X-RAY DIFFRACTION AND X-RAY DIFFRACTOMETER例文帳に追加

Ｘ線回折測定方法及びＸ線回折装置 - 特許庁

X-RAY DIFFRACTION APPARATUS FOR X-RAY SCATTERING例文帳に追加

Ｘ線散乱用のＸ線回折機器 - 特許庁

X-RAY DIFFRACTION APPARATUS AND X-RAY ADJUSTING METHOD例文帳に追加

Ｘ線回折装置及びＸ線調整方法 - 特許庁

X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTING AND MEASURING METHOD例文帳に追加

Ｘ線回折装置及びＸ線回折測定方法 - 特許庁

X-RAY DIFFRACTION METHOD AND NEUTRON BEAM DIFFRACTION METHOD例文帳に追加

Ｘ線回折方法および中性子線回折方法 - 特許庁

METHOD FOR MANUFACTURING X-RAY TALBOT DIFFRACTION GRATING, X-RAY TALBOT DIFFRACTION GRATING, X-RAY TALBOT INTERFEROMETERS AND X-RAY PHASE IMAGING APPARATUS例文帳に追加

Ｘ線タルボ回折格子の製造方法、Ｘ線タルボ回折格子、Ｘ線タルボ干渉計及びＸ線位相イメージング装置 - 特許庁

X-RAY DIFFRACTION DEVICE, DATA ANALYSIS METHOD OF X-RAY DIFFRACTION DEVICE, CONTROL METHOD OF X-RAY DIFFRACTION DEVICE AND PROGRAM FOR IMPLEMENTING THE METHOD例文帳に追加

Ｘ線回折装置、Ｘ線回折装置のデータ解析方法、Ｘ線回折装置の制御方法およびその方法を実現するためのプログラム - 特許庁

MICRO X-RAY DIFFRACTION MEASURING METHOD AND MICRO X- RAY DIFFRACTOMETER例文帳に追加

微小部Ｘ線回折測定方法及び微小部Ｘ線回折装置 - 特許庁

METHOD FOR CONTROLLING SCATTERING ANGLE OF INCIDENCE X RAY IN X-RAY DIFFRACTION DEVICE例文帳に追加

Ｘ線回折装置における入射Ｘ線の発散角制御方法 - 特許庁

X-RAY DIFFRACTION DEVICE AND MEASURING METHOD OF X-RAY LOCKING CURVE例文帳に追加

Ｘ線回折装置及びＸ線ロッキングカーブの測定方法 - 特許庁

X-RAY DETECTOR AND POWDER X-RAY DIFFRACTION MEASURING METHOD例文帳に追加

Ｘ線検出装置及び粉末Ｘ線回折測定方法 - 特許庁

TRANSMISSION TYPE DIFFRACTION GRATING FOR X-RAY, X-RAY TALBOT INTERFEROMETER AND X-RAY IMAGING APPARATUS例文帳に追加

Ｘ線用透過型回折格子、Ｘ線タルボ干渉計およびＸ線撮像装置 - 特許庁

MICRO-PORTION X-RAY IRRADIATION DEVICE AND MICRO-PORTION X-RAY IRRADIATION METHOD OF X-RAY DIFFRACTION DEVICE例文帳に追加

Ｘ線回折装置の微小部Ｘ線照射装置及び微小部Ｘ線照射方法 - 特許庁

PROCESSING METHOD OF TWO-DIMENSIONAL X-RAY DETECTION DATA, TWO-DIMENSIONAL X-RAY DETECTION DEVICE, AND X-RAY DIFFRACTION DEVICE例文帳に追加

二次元Ｘ線検出データの処理方法、二次元Ｘ線検出装置、およびＸ線回折装置 - 特許庁

A diffraction X-ray 5 diffraction at the sample 3 is measured in its intensity by an X-ray detector 6.例文帳に追加

試料３で回折した回折Ｘ線５は、Ｘ線検出器６でその強度が測定される。 - 特許庁

X-RAY DIFFRACTION MICROSCOPE APPARATUS AND X-RAY DIFFRACTION MEASURING METHOD BY THE SAME例文帳に追加

Ｘ線回折顕微鏡装置およびＸ線回折顕微鏡装置によるＸ線回折測定方法 - 特許庁

MANUFACTURING METHOD FOR X-RAY PHASE TYPE DIFFRACTION GRATING AND AMPLITUDE TYPE DIFFRACTION GRATING USED FOR X-RAY TALBOT INTERFEROMETER例文帳に追加

Ｘ線タルボ干渉計に用いられる位相型回折格子と振幅型回折格子の製造方法 - 特許庁

X-RAY DIFFRACTION MEASURING INSTRUMENT EQUIPPED WITH DEBYE-SCHERRER OPTICAL SYSTEM AND X-RAY DIFFRACTION MEASURING METHOD THEREFOR例文帳に追加

デバイシェラー光学系を備えたＸ線回折測定装置とそのためのＸ線回折測定方法 - 特許庁

To provide an X-ray diffraction measuring method facilitating X-ray diffraction measurement in a transmission method.例文帳に追加

透過法のＸ線回折測定を容易としうるＸ線回折測定方法の提供。 - 特許庁