Raman spectrophotometerとは 意味・読み方・使い方

TEMPERATURE MEASURING METHOD USING MICRO-RAMAN SPECTROPHOTOMETER例文帳に追加

顕微ラマン分光光度計を用いた温度測定方法 - 特許庁

To provide a temperature measuring method using a microscopic Raman spectrophotometer capable of calculating the temperature accurately from a Raman spectrum measured by using the Raman spectrophotometer even in the case of having a hard error in measuring caused by an ambient temperature or the like of the microscopic Raman spectrophotometer and a measuring error caused by difference of a sample.例文帳に追加

顕微ラマン分光光度計の周囲温度などに起因するハード的な測定誤差、および試料の違いによる測定誤差がある場合でも、ラマン分光光度計を用いて測定したラマンスペクトルから精度良く温度を算出できる顕微ラマン分光光度計を用いた温度測定方法を提供する。 - 特許庁

The peak intensity ratio (I_2260/I_4135) of 2260 cm-1 to 4135 cm-1 in Raman scattered light measured by a laser Raman spectrophotometer is controlled to ≤0.02.例文帳に追加

レーザラマン分光光度計で測定されるラマン散乱光強度のうち、２２６０ｃｍ^−１と４１３５ｃｍ^−１のピーク強度比（Ｉ_２２６０／Ｉ_４１３５）を０．０２以下にした。 - 特許庁

To provide a surface intensified Raman spectrophotometric method which enables the measurement of the concentration of a substance to be inspected with high precision even if metal fine particles having shape anisotropy such as gold nanorods or the like are not fixed in the same direction, and a surface intensified Raman spectrophotometer.例文帳に追加

金ナノロッド等の形状異方性を有する金属微粒子が同一方向で固定化されていなくとも、高精度に被検物質の濃度が測定することができる表面増強ラマン分光方法および装置を提供する。 - 特許庁

Further, the measuring device of permittivity in a photosensitive layer includes: a correlation data storage unit 12 for storing correlation data between the intensity of characteristic Raman scattering peaks of the photosensitive layer and permittivity that have been measured in advance; and a permittivity operation unit 13 for calculating permittivity based on the correlation data by extracting intensity of characteristic Raman scattering peaks from the Raman scattering light spectra obtained by the Raman spectrophotometer.例文帳に追加

さらに、予め測定された、感光層の特徴的なラマン散乱ピークの強度と誘電率との相関データとを格納する相関データ格納部１２と、ラマン分光測定装置で得られたラマン散乱光スペクトルから特徴的なラマン散乱ピークの強度を抽出して、相関データに基づき誘電率を演算する誘電率演算部１３とを備える。 - 特許庁