X-ray diffraction intensityとは 意味・読み方・使い方

To provide an X-ray diffraction device excellent in angle resolving power, reduced in the lowering of X-ray intensity and simplified in its structure in an X-ray diffraction method using a parallel beam method, and the X-ray diffraction method.例文帳に追加

平行ビーム法を用いたＸ線回折法において、角度分解能が優れていて、Ｘ線強度の低下が少なく、構造が簡素化されたＸ線回折装置およびＸ線回折方法を提供する。 - 特許庁

(Co.fcc)≤0.1, where I(Co.hcp) denotes the X-ray diffraction intensity in the (101) face of Co with an hcp structure, and I(Co.fcc) denotes the X-ray diffraction intensity in the (111) face of Co with an fcc structure.例文帳に追加

０≦Ｉ(Co・hcp)／Ｉ(Co・fcc)≦０．１ ここで、Ｉ(Co・hcp)はhcp 構造のＣｏの(101) 面におけるＸ線回折強度で、Ｉ(Co・fcc)はfcc 構造のＣｏの(111) 面におけるＸ線回折強度である。 - 特許庁

In the resultant cubical boron nitride sintered compact, the ratio I_220/I_111 of X-ray diffraction intensity I_220 in (220) plane to X-ray diffraction intensity I_111 in (111) plane is ≥0.1.例文帳に追加

得られた立方晶窒化ホウ素焼結体の（２２０）面のＸ線回折強度Ｉ_220と、（１１１）面のＸ線回折強度Ｉ_111との比Ｉ_220／Ｉ_111は０．１以上である。 - 特許庁

X-RAY DIFFRACTION DEVICE EQUIPPED WITH TWO-DIMENSIONAL DETECTOR, AND DELETION METHOD OF ITS BLANK INTENSITY例文帳に追加

２次元検出器を備えたＸ線回折装置とそのブランク強度の削除方法 - 特許庁

The integrated intensity of the diffracted X-ray on the X-ray recording region is determined in a region inside the intensity calculation frame 26, and the result is used as the intensity of the diffraction spot 34.例文帳に追加

強度算出枠２６の内側の領域で，Ｘ線記録領域上の回折Ｘ線の積分強度を求めて，これを回折斑点３４の強度とする。 - 特許庁

To provide an X-ray diffraction device capable of acquiring sufficient diffraction line intensity in a 2θ high angle domain where the diffraction line intensity is weakened, when the sample quantity is small, and maintaining accurately relative X-ray intensity of a diffraction peak in a 2θ middle angle domain and in a 2θ low angle domain where the X-ray irradiation width is widened.例文帳に追加

試料の量が少ない場合に、回折線強度が弱くなる２θ高角度領域で十分な回折線強度を獲得でき、Ｘ線照射幅が広くなる２θ中角度領域及び２θ低角度領域において回折ピークの相対Ｘ線強度を正しく維持できるＸ線回折装置を提供する。 - 特許庁

Alternatively, in the range of discharge depth of 50-90%, the relationship of a minimum value I1 of X-ray diffraction intensity of at least one or more X-ray diffraction peak to X-ray diffraction intensity I0 at 100% of discharge depth satisfies I1/I0>0.5.例文帳に追加

または、放電深度５０％〜９０％の範囲内において、少なくとも１以上のＸ線回折ピークのＸ線回折強度の最小値Ｉ_1 が放電深度１００％でのＸ線回折強度Ｉ_0 に対しＩ_1／Ｉ_0＞０．５なる関係を満たす。 - 特許庁

The X-ray intensity data are improved by measuring diffraction X rays from the metallic phase contained in the plated layer at a plurality of positions to the same Debey ring and integrating the obtained diffraction X-ray intensity data.例文帳に追加

めっき層に含まれる金属相からの回折Ｘ線を、同一のデバイ環に対して複数の位置で測定し、得られる回折Ｘ線強度データを積算することにより、Ｘ線強度データを高める。 - 特許庁