「Charged」に関連した英語例文の一覧と使い方(10ページ目) - Weblio英語例文検索

CHARGED PARTICLE BEAM EXPOSURE DEVICE AND ADJUSTING METHOD OF CHARGED PARTICLE BEAM EXPOSURE DEVICE例文帳に追加

荷電粒子線露光装置及び荷電粒子線露光装置の調整方法 - 特許庁

CHARGED PARTICLE BEAM DRAWING DEVICE AND DRAWING METHOD OF CHARGED PARTICLE BEAM例文帳に追加

荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法 - 特許庁

MEASURING METHOD OF CHARGED PARTICLE BEAM AND CHARGED PARTICLE BEAM SCANNING DEVICE例文帳に追加

荷電粒子線の測定方法、荷電粒子線走査式装置 - 特許庁

CONTROL METHOD OF CHARGED PARTICLE ENERGY AND CHARGED PARTICLE ACCELERATOR例文帳に追加

荷電粒子エネルギーの制御方法および荷電粒子加速装置 - 特許庁

METHOD OF IRRADIATION OF CHARGED PARTICLE BEAM, AND CHARGED PARTICLE BEAM APPARATUS例文帳に追加

荷電粒子線の照射方法及び荷電粒子線装置 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND DISLOCATION CORRECTION METHOD OF CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子ビーム装置及び荷電粒子ビーム装置の位置ずれ補正方法 - 特許庁

MASK FOR CHARGED PARTICLE BEAM EXPOSURE AND CHARGED PARTICLE BEAM ALIGNER例文帳に追加

荷電粒子線露光用マスク及び荷電粒子線露光装置 - 特許庁

ADJUSTMENT METHOD OF CHARGED PARTICLE BEAM AXIS AND CHARGED PARTICLE BEAM APPLICATION APPARATUS例文帳に追加

荷電粒子ビーム軸の調整方法及び荷電粒子ビーム応用機器 - 特許庁

CHARGED PARTICLE BEAM ALIGNER AND CHARGED PARTICLE BEAM EXPOSURE METHOD例文帳に追加

荷電粒子ビーム露光装置及び荷電粒子ビーム露光方法 - 特許庁

CHARGED PARTICLE BEAM EXPOSURE METHOD AND CHARGED PARTICLE BEAM ALIGNER例文帳に追加

荷電粒子ビーム露光方法及び荷電粒子ビーム露光装置 - 特許庁

CHARGED PARTICLE BEAM APPLICATION DEVICE AND CHARGED PARTICLE BEAM APPLICATION METHOD例文帳に追加

荷電粒子線応用装置及び荷電粒子線応用方法 - 特許庁

CHARGED BATTERY, CHARGED BATTERY PACK AND CALCULATION METHOD OF REMAINING CAPACITY例文帳に追加

充電電池、充電電池パックおよび充電電池の残量算出方法 - 特許庁

CHARGED PARTICLE BEAM LITHOGRAPHY SYSTEM AND ELECTRICALLY CHARGED PARTICLE BEAM DRAWING METHOD例文帳に追加

荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法 - 特許庁

CHARGED PARTICLE BEAM LITHOGRAPHIC SYSTEM AND ELECTRICALLY CHARGED PARTICLE BEAM LITHOGRAPHY METHOD例文帳に追加

荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法 - 特許庁

METHOD FOR ADJUSTING CHARGED PARTICLE BEAM OPTICAL SYSTEM, AND CHARGED PARTICLE BEAM OPTICAL SYSTEM例文帳に追加

荷電粒子線光学系の調整方法及び荷電粒子線露光装置 - 特許庁

To prevent an insulator in a charged particle beam device from being electrostatically charged.例文帳に追加

荷電粒子線装置における絶縁体への帯電を防止することである。 - 特許庁

DEFLECTION UNIT OF ELECTRICALLY-CHARGED PARTICLE BEAM AND ELECTRICALLY-CHARGED PARTICLE BEAM APPARATUS例文帳に追加

荷電粒子ビームの偏向ユニット及び荷電粒子ビーム装置 - 特許庁

CHARGED PARTICLE BEAM IRRADIATION SYSTEM AND METHOD FOR EMITTING CHARGED PARTICLE BEAM例文帳に追加

荷電粒子ビーム照射システム及び荷電粒子ビーム出射方法 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION TECHNIQUE USING CHARGED PARTICLE BEAM例文帳に追加

荷電粒子線装置および荷電粒子線を用いた試料観察手法 - 特許庁

CHARGED PARTICLE BEAM DRAWING METHOD, AND CHARGED PARTICLE BEAM DRAWING SYSTEM例文帳に追加

荷電粒子ビーム描画方法および荷電粒子ビーム描画装置 - 特許庁

CHARGED PARTICLE BEAM DRAWING METHOD AND CHARGED PARTICLE BEAM LITHOGRAPHY SYSTEM例文帳に追加

荷電粒子ビーム描画方法及び荷電粒子ビーム描画装置 - 特許庁

CHARGED PARTICLE BEAM IMAGE DRAWING DEVICE, AND CHARGED PARTICLE BEAM IMAGE DRAWING METHOD例文帳に追加

荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法 - 特許庁

CHARGED PARTICLE BEAM DRAWING DEVICE, AND CHARGED PARTICLE BEAM DRAWING METHOD例文帳に追加

荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法 - 特許庁

CHARGED STATE INSPECTION TOOL FOR LENS AND CHARGED STATE INSPECTION METHOD FOR LENS例文帳に追加

レンズ用帯電状態検査具およびレンズの帯電状態検査方法 - 特許庁

CHARGED PARTICLE BEAM DEVICE, AND IMAGE CREATION METHOD IN CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子線装置、及び荷電粒子線装置における画像生成方法 - 特許庁

CHARGED PARTICLE BEAM OPTICAL APPARATUS, AND METHOD OF CONTROLLING CHARGED PARTICLE BEAM例文帳に追加

荷電粒子ビーム光学装置、及び荷電粒子ビーム制御方法 - 特許庁

OPTICAL AXIS CONTROL METHOD OF CHARGED PARTICLE BEAM AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子線の光軸調整方法、及び荷電粒子線装置 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD OF CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子線装置及び荷電粒子線装置の制御方法 - 特許庁

AXIS ALIGNMENT DEVICE OF CHARGED PARTICLE OPTICAL SYSTEM AND CHARGED PARTICLE OPTICAL DEVICE例文帳に追加

荷電粒子光学系の軸合装置および荷電粒子光学装置 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND METHOD OF GENERATING CHARGED PARTICLE BEAM IMAGE例文帳に追加

荷電粒子線装置および荷電粒子線像生成方法 - 特許庁

HOLLOW APERTURE FOR CHARGED PARTICLE BEAM SYSTEM AND CHARGED PARTICLE BEAM EXPOSURE SYSTEM例文帳に追加

荷電粒子線装置用ホローアパーチャ及び荷電粒子線露光装置 - 特許庁

CHARGED PARTICLE BEAM PLOTTING METHOD, CHARGED PARTICLE BEAM PLOTTER, AND PROGRAM例文帳に追加

荷電粒子ビーム描画方法、荷電粒子ビーム描画装置及びプログラム - 特許庁

CHARGED-PARTICLE BEAM WRITING METHOD AND CHARGED-PARTICLE BEAM WRITING APPARATUS例文帳に追加

荷電粒子ビーム描画方法及び荷電粒子ビーム描画装置 - 特許庁

CHARGED-PARTICLE BEAM WRITING APPARATUS AND CHARGED-PARTICLE BEAM WRITING METHOD例文帳に追加

荷電粒子ビーム描画装置および荷電粒子ビーム描画方法 - 特許庁

CHARGED-PARTICLE BEAM PROCESSING METHOD, AND CHARGED-PARTICLE BEAM PROCESSING DEVICE例文帳に追加

荷電粒子ビーム加工方法および荷電粒子ビーム加工装置 - 特許庁

CHARGED PARTICLE DETECTING METHOD, CHARGED PARTICLE CONTROL METHOD USING IT例文帳に追加

荷電粒子検出方法、これを用いる荷電粒子制御方法 - 特許庁

CORRECTOR FOR CHARGED PARTICLE BEAM ABERRATION, AND CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子ビーム用軌道補正器、及び、荷電粒子ビーム装置 - 特許庁

CHARGED PARTICLE BEAM LITHOGRAPHY DEVICE AND CHARGED PARTICLE BEAM LITHOGRAPHY METHOD例文帳に追加

荷電粒子ビーム描画装置および荷電粒子ビーム描画方法 - 特許庁

CHARGED PARTICLE BEAM EMITTING DEVICE AND CHARGED PARTICLE BEAM EMITTING METHOD例文帳に追加

荷電粒子ビーム出射装置及び荷電粒子ビーム出射方法 - 特許庁

CHARGED PARTICLE LINE EXPOSURE DEVICE AND CHARGED PARTICLE LINE EXPOSURE METHOD例文帳に追加

荷電粒子線露光装置および荷電粒子線露光方法 - 特許庁

CHARGED PARTICLE BEAM-DRAWING DEVICE AND CHARGED PARTICLE BEAM-DRAWING METHOD例文帳に追加

荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法 - 特許庁

CHARGED PARTICLE BEAM-DRAWING METHOD AND CHARGED PARTICLE BEAM-DRAWING DEVICE例文帳に追加

荷電粒子ビーム描画方法および荷電粒子ビーム描画装置 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD OF CHARGED PARTICLE BEAM DEVICE例文帳に追加

荷電粒子ビーム装置及び荷電粒子ビーム装置の制御方法 - 特許庁

CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM PICTURE FORMATION METHOD例文帳に追加

荷電粒子線装置及び荷電粒子線画像生成方法 - 特許庁

CALIBRATION METHOD OF CHARGED BEAM ALIGNER AND THE CHARGED BEAM ALIGNER例文帳に追加

荷電ビーム露光装置の較正方法及び荷電ビーム露光装置 - 特許庁