微分干渉の英語

所望のビームパターンを生成する微分干渉計例文帳に追加

DIFFERENTIAL INTERFEROMETER PRODUCING DESIRED BEAM PATTERN - 特許庁

微分干渉観察方法及び顕微鏡例文帳に追加

DIFFERENTIAL INTERFERENCE OBSERVATION METHOD AND MICROSCOPE - 特許庁

透過照明型微分干渉顕微鏡例文帳に追加

TRANSMITTED ILLUMINATION TYPE DIFFERENTIAL INTERFERENCE MICROSCOPE - 特許庁

微分干渉顕微鏡及び欠陥検査装置例文帳に追加

DIFFERENTIAL INTERFERENCE MICROSCOPE AND DEFECT INSPECTING DEVICE - 特許庁

表面欠陥検査装置は、被検査物１の微分干渉光学像を形成する微分干渉光学系と前記微分干渉光学像を撮像して微分干渉画像を得る撮像部とを有する微分干渉画像取得部２と、前記微分干渉画像を処理して、被検査物１の表面における欠陥を検出する処理部３と、を備える。例文帳に追加

A surface defect inspection device includes a differential interference image acquisition part 2 containing a differential interference optical system for forming a differential interference optical image of the workpiece 1 and a photographing part for acquiring a differential interference image by photographing the differential interference optical image, and a processing part 3 for processing the differential interference image and detecting the defect on the surface of the workpiece. - 特許庁

画像合成に際し、第１の微分干渉像と第２の微分干渉像とを２乗和処理して画像合成を行う。例文帳に追加

In image composition, the first differential interference image and the second differential interference image are composed by sum-of-squares processing, whereby they are composed. - 特許庁

観察物体の位相変化量等を微分干渉顕微鏡により得た微分干渉画像から短時間で検出する装置を提供する。例文帳に追加

To provide a device which detects, in a short period of time, a quantity of phase change of an observation object from a differential interference image obtained by a differential interference microscope. - 特許庁

画像処理装置、微分干渉顕微鏡、および、画像処理方法例文帳に追加

IMAGE PROCESSOR, DIFFERENTIAL INTERFERENCE MICROSCOPE AND IMAGE PROCESSING METHOD - 特許庁