微分干渉顕微鏡の英語

３次元位相計測方法とそれに使われる微分干渉顕微鏡例文帳に追加

THREE-DIMENSIONAL PHASE MEASUREMENT METHOD, AND DIFFERENTIAL INTERFERENCE MICROSCOPE USED FOR SAME - 特許庁

装置構成を小型化できる微分干渉顕微鏡装置を提供する。例文帳に追加

To provide a differential interference microscope capable of miniaturizing a device configuration. - 特許庁

光学顕微鏡、位相差顕微鏡、微分干渉顕微鏡または偏光顕微鏡等の第１の顕微鏡で観察した測定対象物の位置情報等から電子顕微鏡観察における測定対象物の位置を簡単に求めることができる位置決定方法を提供する。例文帳に追加

To provide a position determination method capable of easily determining the position of a measuring object in electron microscope observation from position information or the like of the measuring object acquired by observation by a first microscope such as an optical microscope, a phase contrast microscope, a differential interference microscope or a polarization microscope. - 特許庁

観察物体の位相変化量等を微分干渉顕微鏡により得た微分干渉画像から短時間で検出する装置を提供する。例文帳に追加

To provide a device which detects, in a short period of time, a quantity of phase change of an observation object from a differential interference image obtained by a differential interference microscope. - 特許庁

この光偏向ユニット５を落射投光管、微分干渉顕微鏡、偏光顕微鏡の光路内外に挿脱可能に備えることで、安価で、鋭敏色板等の位相射板を配置するスペースやメカ構造を設けることなく鋭敏色観察を行うことが可能な落射投光管、微分干渉顕微鏡、偏光顕微鏡を達成することができる。例文帳に追加

This optical deflection unit 5 is insertably and removably disposed within the optical paths of the vertically illuminating light projection tube, differential interference microscope and polarizing microscope, by which the inexpensive vertically illuminating light projection tube, differential interference microscope and polarizing microscope capable of making the sharp color observation can be achieved without providing the space and mechanical structure for arranging the phase plate 2, such as the sharp color plate. - 特許庁

機械的な動作などの煩雑な操作を必要とすることなく、観察条件を容易に変更できる微分干渉顕微鏡を提供する。例文帳に追加

To provide a differential interference microscope which permits easy changing of observation conditions without requiring intricate operations, such as mechanical actions. - 特許庁

まず、微分干渉顕微鏡８による透明な実装基板１を介した電極パッド３の観察像を、電子画像データとして得る。例文帳に追加

First of all, an observation image of the electrode pad 3 through a transparent mounting substrate 1 by a differential interference microscope 8 is acquired as electronic image data. - 特許庁

そうして、微分干渉顕微鏡８の観察像から電極パッド３に対する電子部品２の実装位置を検査する。例文帳に追加

The mounted position of the electronic component 2 to the electrode pad 3 is inspected from an observation image of the differential interference microscope 8. - 特許庁