powder X‐Ray diffractionの英語

POWDER X-RAY DIFFRACTION DATA MEASURING METHOD USING ONE-DIMENSIONAL OR TWO-DIMENSIONAL DETECTOR例文帳に追加

１次元または２次元検出器を用いた粉末Ｘ線回折データ測定方法 - 特許庁

The peak order is preferably unchanged even when the X-ray diffraction is performed for the powder thereof.例文帳に追加

粉末にしてＸ線回折を行ってもピークの順番が変わらないことが好ましい。 - 特許庁

The crystal of compound A is one in which the characteristic diffraction peak at a diffraction angle 2θ(°) as measured by powder X-ray diffraction has a specified powder X-ray pattern.例文帳に追加

化合物Ａの結晶であって、粉末Ｘ線回折で測定した回折角２θ（°）の特徴的回折ピークが特定の粉末Ｘ線回折パターンを有する結晶。 - 特許庁

The crystal of (2R,4R)-monatin potassium salt shows an X-ray powder diffraction pattern having characteristic peaks at diffraction angles 2θ of 5.5°, 7.2°, 8.1°, 8.9° and 16.3°, by powder X-ray diffraction (Cu-Kα ray).例文帳に追加

Ｃｕ−Ｋα線による粉末Ｘ線回折で得られるＸ線回折パターンにおいて、５．５°、７．２°、８．１°、８．９°および１６．３°に回折角２θの特徴的ピークを有する、（２Ｒ，４Ｒ）−モナティンのカリウム塩結晶。 - 特許庁

This crystal polymorphism gives a powder X-ray diffraction pattern having strong diffraction peaks at the diffraction angles (2θ±0.1) of 10.2, 12.7, 18.4 and 22.3°.例文帳に追加

粉末Ｘ線回折図形で、回折角（２θ±０．１）において、１０．２、１２．７、１８．４及び２２．３度に強い回折ピークを示す結晶多形。 - 特許庁

Intensity (I) of a (200) plane obtained by X-ray diffraction of a rolled surface, after it is recrystallized through annealing satisfies I/I0<20, where (I0) is the intensity of the (200) plane obtained by X-ray diffraction of fine powder copper.例文帳に追加

焼鈍を行って再結晶組織にした後の圧延面のＸ線回折で求めた（２００）面の強度（Ｉ）が、微粉末銅のＸ線回折で求めた（２００）面の強度（Ｉ_０）に対し、 Ｉ／Ｉ_０＜２０である。 - 特許庁

In the expression, I{420} represents an X-ray diffraction intensity of a crystal face {420} on the plate surface of the copper alloy plate material, and I_0{420} represents an X-ray diffraction intensity of the crystal face {420} of a standard powder of pure copper.例文帳に追加

Ｉ｛４２０｝／Ｉ_0｛４２０｝＞１.０ ……（１） ここで、Ｉ｛４２０｝は当該銅合金板材の板面における｛４２０｝結晶面のＸ線回折強度、Ｉ_0｛４２０｝は純銅標準粉末の｛４２０｝結晶面のＸ線回折強度である。 - 特許庁

(2) When a half-value width of a diffraction peak b in which a diffraction angle 2θ in powder X-ray diffraction measurement using CuKα_1 rays exists around 43.5° is FWHMb, an X-ray half-width value ratio XFab value stipulated in a formula (1) below is to be 1 or less.例文帳に追加

（ロ）ＣｕＫα_１線を使用した粉末Ｘ線回折測定における回折角２θが４３．５°付近に存在する回折ピークｂの半価幅をＦＷＨＭｂとした時に、下記式（１）で規定されるＸ線半価幅比ＸＦａｂ値が１以下である。 - 特許庁