crystal x ray diffractionとは 意味・読み方・使い方

The α-crystal form of the compound represented by formula (I) shows a characteristic powder X-ray diffraction pattern.例文帳に追加

その粉末Ｘ線回折パターンを特徴とする、式（Ｉ）の化合物のα結晶型。 - 特許庁

SIMPLE METHOD FOR DETERMINING ZIRCONIA CRYSTAL PHASE RATIO BY X-RAY DIFFRACTION PATTERN例文帳に追加

Ｘ線回折パターンによるジルコニア結晶相割合の簡易定量法 - 特許庁

The solid crystal, called COK-7, has a specific X-ray diffraction pattern.例文帳に追加

本発明は、ＣＯＫ−７と称される、特定のＸ線回折図を有する固体結晶に関する。 - 特許庁

A light path of a low-range X-ray beam is shifted by crystal diffraction and superimposed on a high-range X-ray beam.例文帳に追加

低域Ｘ線ビームの光路を結晶回折によってシフトさせ、高域Ｘ線ビームに重畳する。 - 特許庁

The angle of refraction of the condensed X-ray beam generated by the subject is detected by using the X-ray diffraction of a crystal wherein an incident angle is adjusted so that the edge of the angle distribution of the condensed X-ray beam satisfies a diffraction condition.例文帳に追加

集光Ｘ線ビームの角度分布の端が回折条件を満たすように入射角を調整した結晶のＸ線回折を利用して、被写体によって生じた集光Ｘ線ビームの屈折角を検出する。 - 特許庁

Since an X-ray arrives at the curved analyzing crystal 4 while expanded, from the incident side focal point F1, the X-ray efficiently strikes a diffraction face, and the X-ray at a specified wavelength is converged to a focal point F2 to get incident into an X-ray detector 7.例文帳に追加

湾曲分光結晶４にはその入射側焦点Ｆ１からＸ線が拡がりつつ到来するから、効率よく回折面に当たって特定波長のＸ線が焦点Ｆ２に集まってＸ線検出器７に入射する。 - 特許庁

The crystal of compound A is one in which the characteristic diffraction peak at a diffraction angle 2θ(°) as measured by powder X-ray diffraction has a specified powder X-ray pattern.例文帳に追加

化合物Ａの結晶であって、粉末Ｘ線回折で測定した回折角２θ（°）の特徴的回折ピークが特定の粉末Ｘ線回折パターンを有する結晶。 - 特許庁

A positional change in intensity of a diffracted X-ray from the sample crystal 6 is detected via an X-ray image magnifying crystal 10 fixed within a diffraction angle range, using an optical system of an X-ray topograhpy arranged with the X-ray image magnifying crystal 10 in a rear stage of the sample crystal 6 of which the strain is measured.例文帳に追加

ひずみを測定すべき試料結晶６の後段にＸ線像拡大用結晶１０を配置したＸ線トポグラフィの光学系を用いて、試料結晶６からの回折Ｘ線強度の場所的変化を、回折角度範囲に固定されたＸ線像拡大用結晶１０を介して検出する。 - 特許庁