characteristics equationとは 意味・読み方・使い方

On the basis of the variation distribution of process sensitivity parameters, the characteristics distribution of the semiconductor integrated circuits is extracted by mathematical analysis using a polynomial equation.例文帳に追加

プロセス感度パラメータのばらつき分布に基づいて、多項式を用いた数学的解析により半導体集積回路の特性分布を抽出する。 - 特許庁

With an arbitrary electronic component mounted on the testing implement, electric characteristics are measured concerning the non-independent ports, a measured value by the reference implement is calculated by using the second mathematical equation.例文帳に追加

任意の電子部品を試験治具に実装した状態で非独立ポートについて電気特性を測定し、第２の数式を用いて基準治具測定値を算出する。 - 特許庁

Tire distortion energy U is calculated, by using a configuration equation (storage modulus of elasticity) for indicating the distortion dependency of viscoelasticity characteristics also coping with the small distorted region of a tire (10).例文帳に追加

タイヤの歪エネルギーＵを、タイヤの小歪領域をも対処可能な粘弾性特性の歪依存性を表す構成方程式（貯蔵弾性率）を用いて計算する（10）。 - 特許庁

The inclination and intercept of a linear equation showing power detection level characteristics are calculated, and the calculated inclination and intercept are separately stored in memories (a) and (b) of a non-volatile memory 10.例文帳に追加

電力検知レベル特性を示す一次方程式の傾きと切片を演算し、演算した傾きと切片を不揮発メモリ10のメモリａ，ｂにそれぞれ記憶させる。 - 特許庁

In the light scattering characteristics F (θ) that show the relations between a scattering angle θ and intensity F of scattered light, when taking the light scattering characteristics of X axis direction as Fx (θ) and taking the light scattering characteristics of Y axis direction as Fy (θ), the anisotropic light scattering film satisfies the following equation.例文帳に追加

異方性光散乱フィルムは、散乱角θと散乱光強度Ｆとの関係を示す光散乱特性Ｆ（θ）において、Ｘ軸方向の光散乱特性をＦｘ（θ）、Ｙ軸方向の光散乱特性をＦｙ（θ）とするとき、下記式を充足する。 - 特許庁

All formulae (comprising also a formula for a flow rate and the same for a boundary condition) in a diagram summarizing 5 sets of multi-accelerations flow definitions in addition to a one-dimensional Poisson equation are employed whereby the electric characteristics and the distribution of electric characteristics in the semiconductor device are estimated.例文帳に追加

1次元ポアソン方程式に併せて、5つの多重加速流定義をまとめた図８中のすべての式（流速の式と境界条件の式も含む）を用いることによって、半導体デバイス内部の電気的特性並びに電気的特性分布を推定する。 - 特許庁

The method of analyzing electrodeposition coating performed by determining the deposited quantity of a coating film on the surface of a material 4 to be coated based on a prediction equation formed by inputting a current density obtained by potential analysis and at least one of a coating material temperature, a coating material characteristics and the characteristics of a material to be coated is provided.例文帳に追加

電位解析によって得られた電流密度と、塗料温度、塗料特性または被塗装物特性の少なくとも一つとを入力とした予測式に基づいて、被塗装物４の表面の塗膜析出量を求める電着塗装解析方法を提供する。 - 特許庁

Then, when the focusing characteristics of the projection optics system are actually measured using a measuring reticle or the like, target adjustment volume of the specific lenses is calculated by using actual measurement data of the focusing characteristics, and a relation equation between the parameter group and the target adjustment volume of the specific lenses by a main controller 50.例文帳に追加

そして、計測用レチクル等を用いて投影光学系の結像特性が実測されると、主制御装置５０により、結像特性の実測データと前記パラメータ群と特定のレンズの目標調整量との関係式を用いて、特定のレンズの目標調整量が算出される。 - 特許庁