low-voltage observationとは 意味・読み方・使い方

Thereby, a high-resolution image can be observed even in an observation condition of a low-acceleration voltage with a simple structure and without carrying out complicated control.例文帳に追加

そのため、簡単な構造で且つ複雑な制御を行うことなく、低加速電圧の観察条件においても高分解能の像観察が可能となる。 - 特許庁

To realize a high resolution observation by a low acceleration voltage of 5 kV or less while the pressure of the testpiece chamber is kept high.例文帳に追加

試料室圧力が高い状態において、５ｋＶ以下の低加速電圧で高分解能観察を実現する。 - 特許庁

To provide an ultrasonic probe in which a low-voltage signal is transmitted to a signal transmission cable between an ultrasonic vibrator and an observation device, the signal is boosted near the ultrasonic vibrator and the boosted voltage is applied to the vibrator.例文帳に追加

超音波振動子と観測装置の間の信号伝送ケーブルに低電圧信号を伝送し、超音波振動子近傍で昇圧して、その昇圧電圧を振動子に印加する超音波プローブを提供する。 - 特許庁

An electron beam converged to, for example, about 1 nm diameter is incident to an observation sample support member for supporting a sample to be observed with a relatively low acceleration voltage to generate X-ray from the observation sample support member, and the X-ray is detected by a detector disposed in the opposite side of the incident side of the electron beam.例文帳に追加

本発明では、例えば直径１ｎｍ程度に収束させた電子線を、観察試料を支持する観察試料支持部材に比較的低加速電圧で入射させて該観察試料支持部材からＸ線を発生させ、電子線入射側とは反対側に配置された検出器によりＸ線を検知する。 - 特許庁

To provide an electron microscope device using a short focus objective lens that enables acquiring a good image of high resolution without any distortion in a wide range from low magnification to high magnification at the observation in low acceleration voltage condition.例文帳に追加

短焦点の対物レンズを用いた電子顕微鏡装置において、低加速電圧条件での観察時に、低倍率から高倍率までの広い倍率範囲において高解像度で歪みのない良好な画像の取得を可能とする電子顕微鏡装置を提供する。 - 特許庁

The observation condition includes the working distance, vacuum, addition/subtraction of the detection signals from a reflection electron detection element divided into a plurality, the voltage being applied to the bias electrode of a low vacuum secondary electron detector, and the mixing ratio of signals when displaying a mixing image.例文帳に追加

観察条件には、ワーキングディスタンス，真空度，複数に分割された反射電子検出素子の検出信号の加減算操作、低真空二次電子検出器のバイアス電極に印加する電圧、ミキシング画像を表示する際の信号の混合比がある。 - 特許庁

To arrange an electron microscope and a sample so that the distance therebetween is optimum, in a device which prepares a thin sample by focused ion beam for use in observation by a transmission electron microscope (TEM) and removes a damaged layer on the sample surface using a gaseous ion beam at a low acceleration voltage.例文帳に追加

集束イオンビームでＴＥＭ観察用の薄片化試料を作製し、低加速電圧の気体イオンビームで試料表面のダメージ層を除去する装置において、電子顕微鏡と試料とを最適な距離に配置すること。 - 特許庁