「film- thickness」に関連した英語例文の一覧と使い方(11ページ目) - Weblio英語例文検索

The thickness of the film 66 immediately before the tenter is measured along the width direction of the film 66 by a first thickness measuring instrument 115 and the thickness of the film 66 after drying is measured along the width direction of the film 66 by the second thickness measuring instrument 133.例文帳に追加

テンタの直前のフィルム６６の厚みを幅方向に沿って第１厚み測定機１１５により測定するとともに、乾燥後のフィルム６６の厚みを幅方向に沿って第２厚み測定機１３３により測定する。 - 特許庁

COATING SYSTEM AND METHOD FOR CONTROLLING THICKNESS OF COATING FILM例文帳に追加

塗布装置及び塗布膜厚制御方法 - 特許庁

To provide a coating apparatus capable of making a film thickness constant.例文帳に追加

塗膜の厚さを一定にしうる塗布装置を提供する。 - 特許庁

To produce a gray hue without increasing a film thickness.例文帳に追加

膜厚を厚くすることなくグレーの色相を得る。 - 特許庁

SUBSTRATE TREATMENT DEVICE AND METHOD OF MEASURING THICKNESS OF FILM例文帳に追加

基板処理装置および膜厚測定方法 - 特許庁

Also, the sensor 50 receives from a controller 60 a desired film-thickness value of the semiconductor layer, and receives a film-thickness value (=an excess film-thickness value) of the semiconductor layer which is related to its film thickness grown in the reaction vessel 10 after the feed of its raw-material gas is stopped.例文帳に追加

また、検出器５０は、制御装置６０から半導体層の目標膜厚と、原料ガスを停止して反応容器１０内で成長する半導体層の膜厚（＝過剰膜厚）とを受ける。 - 特許庁

OPTICAL METHOD AND DEVICE FOR MONITORING FILM THICKNESS例文帳に追加

光学式膜厚監視方法および装置 - 特許庁

METHOD AND APPARATUS FOR MEASURING FILM THICKNESS AND CONTACT STATE例文帳に追加

膜厚・接触状態計測方法及び装置 - 特許庁

METHOD AND APPARATUS FOR MEASUREMENT OF FILM THICKNESS THEREOF例文帳に追加

薄膜の膜厚測定方法及びその測定装置 - 特許庁

MEASURING METHOD AND DEVICE OF THICKNESS OF FILM DURING RUNNING例文帳に追加

走行中のフィルム厚みの測定方法および装置 - 特許庁

To alleviate film thickness unevenness of a carrier transport layer.例文帳に追加

キャリア輸送層の膜厚むらを低減する。 - 特許庁

To easily form a thin film of small thickness distribution.例文帳に追加

膜厚分布の小さい薄膜を容易に形成する。 - 特許庁

APPARATUS AND METHOD FOR FILM THICKNESS MEASUREMENT例文帳に追加

膜厚測定装置及び膜厚測定方法 - 特許庁

FILM-THICKNESS-DETECTING DEVICE OF VACUUM VAPOR-DEPOSITION FACILITY例文帳に追加

真空蒸着設備の膜厚検出装置 - 特許庁

To easily manufacture a film by suppressing thickness variation trouble.例文帳に追加

厚みムラ故障を抑えつつ、フイルムを容易に製造する。 - 特許庁

MEASUREMENT METHOD OF LAYER THICKNESS FOR THIN FILM STACK例文帳に追加

薄膜積層体の膜厚計測方法 - 特許庁

METHOD AND APPARATUS FOR INSPECTING THICKNESS OF COATING FILM例文帳に追加

塗装膜厚検査方法および装置 - 特許庁

INSTRUMENT AND METHOD FOR MEASURING FILM THICKNESS AND REFRACTIVE INDEX例文帳に追加

膜厚及び屈折率測定装置及びその測定方法 - 特許庁

METHOD AND APPARATUS FOR MEASURING THICKNESS OF OXIDE FILM ON SURFACE OF SHEET STEEL例文帳に追加

鋼板表面の酸化膜厚計測方法及び装置 - 特許庁

FILM THICKNESS MONITORING METHOD AND DEVICE例文帳に追加

膜厚監視方法および膜厚監視装置 - 特許庁

The thickness of the carbon film may be smaller than 300 nm.例文帳に追加

炭素膜は、３００ナノメートルより薄くてもよい。 - 特許庁

FILM THICKNESS MEASURING METHOD AND STEP MEASURING METHOD例文帳に追加

膜厚測定方法及び段差測定方法 - 特許庁

FILM THICKNESS AND CALCULATION METHOD OF OPTICAL CONSTANT例文帳に追加

膜厚および光学定数の算出方法 - 特許庁

WET FILM THICKNESS MEASUREMENT METHOD AND INSTRUMENT例文帳に追加

湿潤膜厚測定方法および装置 - 特許庁

After the thickness of a film is measured in the film thickness measuring region 42 by the film thickness measuring device, the film thickness measuring region 42 is exposed to light by an exposure device as annexed to an edge exposure region 41.例文帳に追加

膜厚測定装置により当該膜厚測定領域４２にて膜厚測定を行った後、露光装置によりエッジ露光領域４１に加えて膜厚測定領域４２を露光する。 - 特許庁

DEPOSITED FILM THICKNESS MEASURING METHOD AND DEVICE THEREOF例文帳に追加

蒸着膜厚測定方法及びその装置 - 特許庁

APPARATUS AND METHOD FOR MEASUREMENT OF FILM THICKNESS例文帳に追加

膜厚測定装置及び膜厚測定方法 - 特許庁

APPARATUS AND METHOD FOR MEASUREMENT OF FILM THICKNESS例文帳に追加

膜厚測定装置および膜厚測定方法 - 特許庁

COLORED FILM THICKNESS VARIATIONS INSPECTION METHOD AND APPARATUS例文帳に追加

着色膜厚ムラ検査方法および装置 - 特許庁

FILM THICKNESS CONTROL METHOD IN ATMOSPHERE PRESSURE PLASMA TREATMENT METHOD例文帳に追加

常圧プラズマ処理法における膜厚制御方法 - 特許庁

1-50 nm is desirable for film thickness of the non-magnetic layer 5.例文帳に追加

非磁性層５の膜厚は１〜５０ｎｍが好ましい。 - 特許庁

FILM THICKNESS INSPECTION APPARATUS AND INSPECTION METHOD例文帳に追加

膜厚の検査装置および検査方法 - 特許庁

APPARATUS AND METHOD FOR FILM THICKNESS MEASUREMENT例文帳に追加

膜厚計測装置および膜厚計測方法 - 特許庁

To uniformize the film thickness of the function layer of each pixel.例文帳に追加

各画素における機能層の膜厚を均一化する。 - 特許庁

IMAGE FORMING APPARATUS AND FILM THICKNESS MEASURING METHOD例文帳に追加

画像形成装置及び膜厚測定方法 - 特許庁

METHOD FOR CONTROLLING COATING FILM THICKNESS AND ITS SYSTEM例文帳に追加

塗装膜厚制御方法及びそのシステム - 特許庁

A film thickness control device 3 is connected to the crystal oscillator 2.例文帳に追加

膜厚制御装置３を水晶振動子２に接続する。 - 特許庁

FILM THICKNESS MEASURING METHOD AND SHEET MANUFACTURING METHOD例文帳に追加

膜厚測定方法およびシートの製造方法 - 特許庁

INSTRUMENT AND METHOD FOR MEASURING THICKNESS OF COATING FILM例文帳に追加

塗膜膜厚計測装置及び方法 - 特許庁

METHOD FOR MEASURING THICKNESS OF FILM ON STRUCTURE SUCH AS PIPING例文帳に追加

配管等構造体における膜厚測定方法 - 特許庁

CONTACT-TYPE FILM THICKNESS MEASURING INSTRUMENT AND METHOD FOR USING THE SAME例文帳に追加

接触式膜厚測定機およびその使用方法 - 特許庁

METHOD AND INSTRUMENT FOR MEASURING FILM THICKNESS AND OPTICAL CONSTANT例文帳に追加

膜厚及び光学定数の測定方法及び装置 - 特許庁

METHOD FOR PRODUCING DRIED FILM HAVING UNIFORM THICKNESS例文帳に追加

厚み均等な乾燥膜の製造方法 - 特許庁

APPARATUS FOR MEASURING THICKNESS OF FILM AND APPARATUS FOR GRINDING SUBSTRATE例文帳に追加

膜厚測定装置及び基板研磨装置 - 特許庁

FILM THICKNESS MEASURING DEVICE AND METHOD例文帳に追加

膜厚測定装置及び膜厚測定方法 - 特許庁