accuracy in sampleとは 意味・読み方・使い方

To improve accuracy for measuring the concentration of fine particles in a sample liquid by efficiently separating bubbles from the sample liquid.例文帳に追加

試料液から気泡を効率よく分離し、試料液中の微粒子濃度計測精度を向上する。 - 特許庁

In the two dimensional graph 15, the abscissa shows the analysis result of the accuracy control sample 1, and the ordinate shows the analysis result of the accuracy control sample 2.例文帳に追加

２次元グラフ１５は、横軸が精度管理試料１の分析結果を示し、縦軸が精度管理試料２の分析結果を示す。 - 特許庁

To provide a holding device for an analytical sample and an analytical method for the sample in an analytical device for the sample which can speedily and certainly distinguish a sample position from detected data by scanning the sample without depending on the mechanical accuracy of the device.例文帳に追加

装置の機械精度に依存することなく、試料の走査により、その検出データから迅速に且つ確実に試料の位置を判別できる試料分析装置における試料保持装置および試料分析方法を提供する。 - 特許庁

To control the flow of a sample liquid because there is the case where the measuring accuracy of the sample liquid is damaged by the flow of the sample liquid after the flow of the sample liquid into a measuring region is completed in a sample analyzing chip.例文帳に追加

試料分析チップにおいて測定領域に試料液の流入が完了した後、試料液の流動は、試料液の測定の正確さを損ねる要因となる場合があるので、試料液の流動を制御すること。 - 特許庁

To provide an X-ray analysis method, in which an adhesive sample can be analyzed with high sensitivity and with high accuracy and whose accuracy is enhanced, to provide an auxiliary sample holding implement used for the method and to provide a sample holder.例文帳に追加

粘着性試料を高感度かつ高精度で分析でき、正確度が向上するＸ線分析方法、これに用いる試料保持用の補助具および試料ホルダを提供する。 - 特許庁

To enhance the accuracy in the quantity of laser light at the time of printing by setting a correct sample hold time at all times in sample hold APC.例文帳に追加

サンプルホールドＡＰＣにおいて、常に適正なサンプルホールド時間を設定でき、印字時のレーザ光量の精度を向上させること。 - 特許庁

To correct surface inclination errors of an observation sample, in the installation of the sample on FIB processing sample stand, with high accuracy, in the manufacture of the sample for TEM for thinning a plate by the FIB processing.例文帳に追加

ＦＩＢ加工による薄板化を行うＴＥＭ用観察試料の作製において、ＦＩＢ加工試料台への試料設置における試料表面の傾斜誤差を精度高く補正する。 - 特許庁