over current testとは 意味・読み方・使い方

Regarding the plurality of good samples, static power supply current (IDDQ) for each test vector is measured while a plurality of test vectors are switched over (S102).例文帳に追加

複数の良品サンプルについて、複数のテストベクタを切り換えながら、テストベクタごとの静的電源電流（ＩＤＤＱ）を測定する（Ｓ１０２）。 - 特許庁

First, a test (20) is performed of items which are assumed to be unrepairable and to be unrecoverable to normal one even if switched over to a redundant cell including the test of circuit current with power supply applied, and a test (30) of a circuit current after writing '0' to all cells is performed.例文帳に追加

まず、セルの切り替えにより修復し良品化することが出来ない項目を電源投入時の回路電流を含んで検査（２０）し、パス品に対して、全セルに「０」を書き込み後の回路電流の検査３０を行う。 - 特許庁

To decide whether an over current protection value of a main current is within a normal range without a special test facility.例文帳に追加

特殊なテスト設備を要せず、メイン電流の過電流保護値が正常範囲に収まっているか判定する。 - 特許庁

To provide a voltage-applied current measurement device which can make accurate measurement even under internal resistance and also is robust over noise, and test equipment using this device.例文帳に追加

半導体内部配線の内部抵抗でも正確でかつノイズに強い電圧印加電流測定装置および試験装置を提供する。 - 特許庁

To provide a surge absorbing circuit which is reduced in size over the entire circuit, suppresses a higher harmonic leak current by keeping a high impedance characteristic over the whole frequency region, operates at a voltage smaller than an insulation test voltage when a lightning surge is applied and does not operate during an insulation test.例文帳に追加

回路全体を小型化し、かつ全周波数領域で高インピーダンス特性を維持して高調波漏れ電流を抑制して、雷サージ印加時には絶縁耐圧試験電圧よりも小さい電圧値で動作し、絶縁耐圧試験時は動作しないサージ吸収回路を得る。 - 特許庁

The light emission current control circuit 121 of the drive control circuit 12 increases a light emission amount of a light emitting element 1, and the gain changeover circuit A changes over to a value corresponding to an operation test or a non operation test and increases a gain of the operation amplifier for amplifying a light receiving signal.例文帳に追加

駆動制御回路１２の発光電流制御回路１２１は発光素子１の発光量を増大ささせ、ゲイン切り替え回路Ａは受光信号を増幅する演算増幅器のゲインを作動試験又は不作動試験帰に対応した値に切り替えて増大させる。 - 特許庁

The high voltage test device 10 consists of a transformer 10a for test, a direct current generator 10b, an impulse generator 10c, a change-over device unit 10e, a drive device 10g, and a universal potential divider 10j, and a bushing unit 10k which have sealed tank structures, respectively.例文帳に追加

高電圧試験装置１０を、それぞれ密閉タンク構造の試験用変圧器１０ａ、直流発生器１０ｂ、インパルス発生器１０ｃ、切り替え装置ユニット１０ｅ、駆動装置１０ｇ、万能分圧器１０ｊ及びブッシングユニット１０ｋによって構成する。 - 特許庁