Dark Defectとは 意味・読み方・使い方

To make a pixel dot defect by a light emitting element becoming a dark dot inconspicuous.例文帳に追加

滅点となった発光素子による画素の点欠陥を視認させ難くする。 - 特許庁

This defect detection device is constituted by using the dark field illumination device.例文帳に追加

また、このような暗視野照明装置を用いて、欠陥検出装置を構成する。 - 特許庁

Each photovoltaic cell defect is classified according to defect types and a shape of the dark region is compared with the defect types (S50), and the presence or absence of the defect is determined to determine whether the photovoltaice cells are good or not.例文帳に追加

太陽電池セルの欠陥をタイプごとに分け、暗部の形状を各タイプと比較して解析し（Ｓ５０）欠陥の有無を判定し、太陽電池セルの良否判断を行う。 - 特許庁

To detect both of a light defect and a dark defect and reduce a process time for detecting the defects.例文帳に追加

明欠陥に限らず暗欠陥も検出でき、さらに欠陥を検出する際の処理時間を短くすることを目的とする。 - 特許庁

Also, when short circuit parts are produced in the auxiliary capacitance part 13 between adjacent pixel electrodes 11, a luminous-dot defect can be made to be a dark-dot defect similarly.例文帳に追加

隣接する画素電極11間の補助容量部13に短絡部が発生した場合も同様に暗点欠陥にできる。 - 特許庁

Furthermore, the semiconductor photo detector 1 is reduced in dark current defect, resulting in an increase in yield.例文帳に追加

また、半導体受光素子１は暗電流不良が低減されているので、歩留りが良い。 - 特許庁

The defect classification means (36) includes first classification means (50) for identifying a defect image having a specific shape and second classification means (51) for identifying a punctate low-brightness defect image and a light-dark brightness defect image.例文帳に追加

欠陥分類手段は、特有の形状を有する欠陥像を識別する第１の分類手段（５０）と、点状の低輝度欠陥像や明暗輝度の欠陥像を識別する第２の分類手段（５１）とを有する。 - 特許庁

The defect classification means includes: a first classification means (50) of identifying an image of the defect having a specific shape; and a second classification means (51) of identifying the image of a punctate low-brightness defect and an image of a light-dark brightness defect.例文帳に追加

欠陥分類手段は、特有の形状を有する欠陥像を識別する第１の分類手段（５０）と、点状の低輝度欠陥像や明暗輝度の欠陥像を識別する第２の分類手段（５１）とを有する。 - 特許庁