「X-ray diffraction device」に関連した英語例文の一覧と使い方 - Weblio英語例文検索

X-RAY DIFFRACTION DEVICE AND MEASUREMENT METHOD BY X-RAY DIFFRACTION例文帳に追加

Ｘ線回折装置及びＸ線回折の測定方法 - 特許庁

X-RAY DIFFRACTION JIG, X-RAY DIFFRACTION DEVICE, AND MEASURING METHOD OF X-RAY DIFFRACTION例文帳に追加

Ｘ線回折用治具、Ｘ線回折装置およびＸ線回折の測定方法 - 特許庁

COMBINATORIAL X-RAY DIFFRACTION DEVICE例文帳に追加

コンビナトリアルＸ線回折装置 - 特許庁

GONIOMETER FOR X-RAY DIFFRACTION DEVICE例文帳に追加

Ｘ線回折装置用ゴニオメータ - 特許庁

IMAGING PLATE X-RAY DIFFRACTION DEVICE例文帳に追加

イメージングプレートＸ線回折装置 - 特許庁

WAVELENGTH DISCRIMINATION X-RAY DIFFRACTION DEVICE例文帳に追加

波長分別型Ｘ線回折装置 - 特許庁

X-RAY DIFFRACTION DEVICE AND MEASURING METHOD OF X-RAY LOCKING CURVE例文帳に追加

Ｘ線回折装置及びＸ線ロッキングカーブの測定方法 - 特許庁

STRESS HOLDING DEVICE AND X-RAY DIFFRACTION DEVICE例文帳に追加

応力保持装置およびＸ線回折装置 - 特許庁

METHOD AND DEVICE FOR X-RAY DIFFRACTION ANALYSIS例文帳に追加

Ｘ線回折分析方法及び装置 - 特許庁

MICRO-PORTION X-RAY IRRADIATION DEVICE AND MICRO-PORTION X-RAY IRRADIATION METHOD OF X-RAY DIFFRACTION DEVICE例文帳に追加

Ｘ線回折装置の微小部Ｘ線照射装置及び微小部Ｘ線照射方法 - 特許庁

SAMPLE REPLACING MACHINE AND X-RAY DIFFRACTION DEVICE例文帳に追加

試料交換機及びＸ線回折装置 - 特許庁

X-RAY DIFFRACTION AND THERMAL ANALYSIS SIMULTANEOUS MEASUREMENT DEVICE例文帳に追加

Ｘ線回折・熱分析同時測定装置 - 特許庁

DEVICE FOR OBSERVING BACK-REFLECTION X-RAY DIFFRACTION IMAGE例文帳に追加

背面反射Ｘ線回折像観察装置 - 特許庁

PROCESSING METHOD OF TWO-DIMENSIONAL X-RAY DETECTION DATA, TWO-DIMENSIONAL X-RAY DETECTION DEVICE, AND X-RAY DIFFRACTION DEVICE例文帳に追加

二次元Ｘ線検出データの処理方法、二次元Ｘ線検出装置、およびＸ線回折装置 - 特許庁

X-RAY DIFFRACTION DEVICE, DATA ANALYSIS METHOD OF X-RAY DIFFRACTION DEVICE, CONTROL METHOD OF X-RAY DIFFRACTION DEVICE AND PROGRAM FOR IMPLEMENTING THE METHOD例文帳に追加

Ｘ線回折装置、Ｘ線回折装置のデータ解析方法、Ｘ線回折装置の制御方法およびその方法を実現するためのプログラム - 特許庁

METHOD FOR CONTROLLING SCATTERING ANGLE OF INCIDENCE X RAY IN X-RAY DIFFRACTION DEVICE例文帳に追加

Ｘ線回折装置における入射Ｘ線の発散角制御方法 - 特許庁

A measuring device 2 performs X-ray diffraction measurement.例文帳に追加

測定装置２はＸ線回折測定を行う。 - 特許庁

SAMPLE STAND-EXCHANGING DEVICE IN X-RAY DIFFRACTION APPARATUS例文帳に追加

Ｘ線回折装置における試料台交換装置 - 特許庁

SAMPLE HOLDING DEVICE AND X-RAY DIFFRACTION APPARATUS USING DEVICE例文帳に追加

試料保持装置および同装置を用いたＸ線回折装置 - 特許庁

ISOTROPIC HIGH-PRESSURE APPLYING DEVICE FOR X-RAY DIFFRACTION ANALYSIS例文帳に追加

Ｘ線回折解析用等方性高圧力印加装置 - 特許庁

The sample for X-ray diffraction measurement is analyzed by an X-ray diffraction device, to thereby measure the asbestos content.例文帳に追加

このＸ線回折測定用試料をＸ線回折装置で分析しアスベスト含有量を測定する。 - 特許庁

X-RAY DIFFRACTION DEVICE AND MEASURING METHOD OF SAMPLE USING THIS DEVICE例文帳に追加

Ｘ線回折装置及び該装置を用いた試料の測定方法 - 特許庁

To provide an X-ray diffraction device excellent in angle resolving power, reduced in the lowering of X-ray intensity and simplified in its structure in an X-ray diffraction method using a parallel beam method, and the X-ray diffraction method.例文帳に追加

平行ビーム法を用いたＸ線回折法において、角度分解能が優れていて、Ｘ線強度の低下が少なく、構造が簡素化されたＸ線回折装置およびＸ線回折方法を提供する。 - 特許庁

STRESS EVALUATION METHOD AND STRESS EVALUATION DEVICE BY X-RAY DIFFRACTION例文帳に追加

Ｘ線回折による応力評価方法及び応力評価装置 - 特許庁

METHOD AND APPARATUS FOR CONTROLLING CCD SENSOR AND X-RAY DIFFRACTION DEVICE例文帳に追加

ＣＣＤセンサの制御方法及び装置並びにＸ線回折装置 - 特許庁

MEASURING METHOD FOR METAL SURFACE OXIDE AND X-RAY DIFFRACTION DEVICE例文帳に追加

金属材表面酸化物の測定方法およびＸ線回折装置 - 特許庁

The X-ray diffraction device comprises an X-ray diffraction device 1, a sample-mounting section 5 for supporting the sample S, and a fixation section 30 that can be moved and fixed to the sample-mounting section.例文帳に追加

Ｘ線回折装置１、試料Ｓを支持する試料取付け部５と、試料取付け部に対して移動及び固定可能な固定部３０を有する。 - 特許庁

CONTROL METHOD OF GONIOMETER, GONIOMETER, FOUR-AXIS GONIOMETER AND X-RAY DIFFRACTION DEVICE例文帳に追加

ゴニオメータの制御方法、ゴニオメータ、４軸ゴニオメータ、およびＸ線回折装置 - 特許庁

The X-ray diffraction device 5 is stopped at an arbitrary measuring spot on the rail 1, and an X-ray irradiation point on the head top face 1d is irradiated with the X-ray generated by an X-ray generation device 3 from an X-ray irradiation part 6.例文帳に追加

レール１上の任意の測定箇所でＸ線回折装置５を停止させて、Ｘ線発生装置３が発生するＸ線をＸ線照射部６から頭頂面１ｄのＸ線照射点に照射する。 - 特許庁

In this X-ray diffraction device, an X-ray radiated from an X-ray source F is regulated by a divergence slit 2 and irradiated to the sample S, and a diffraction line R_2 emitted from the sample S is detected by an X-ray detector 10.例文帳に追加

Ｘ線源Ｆから放射されたＸ線を発散スリット２によって規制して試料Ｓに照射し、試料Ｓから出た回折線Ｒ_２をＸ線検出器１０によって検出するＸ線回折装置である。 - 特許庁

To provide an X-ray analysis device, such as a fluorescent X-ray analysis device of a wavelength dispersion type, an X-ray diffraction device or the like, capable of making a prompt and accurate analysis by continuous scan.例文帳に追加

波長分散型の蛍光Ｘ線分析装置やＸ線回折装置等のＸ線分析装置において、連続スキャンで迅速かつ正確な分析を行える装置を提供する。 - 特許庁

METHOD AND APPARATUS FOR ACQUIRING MEASURING DATA OF CCD SENSOR AND X-RAY DIFFRACTION DEVICE例文帳に追加

ＣＣＤセンサの測定データ取得方法及び装置並びにＸ線回折装置 - 特許庁

STRUCTURE FACTOR TENSOR ELEMENT DETERMINATION METHOD, AND X-RAY DIFFRACTION DEVICE UTILIZATION METHOD THEREFOR例文帳に追加

構造因子テンソル要素決定法及びそのためのＸ線回折装置利用法 - 特許庁

To provide an X-ray diffraction device and an X-ray diffraction system which is easily portable and handleable, having an inexpensive structure, and capable of imaging simply an image of a diffraction ring.例文帳に追加

取扱いが容易で安価な構造であり持ち運びに便利で簡単に回折環の画像を撮像することができるＸ線回折装置及びＸ線回折システムを提供する。 - 特許庁

To provide a transmission type X-ray diffraction device capable of excluding an effect of scattered X rays in an incident part to the utmost to detect the diffracted X rays generated in a sample, and an X-ray diffraction method.例文帳に追加

入射部での散乱Ｘ線の影響を極力排して試料で生じた回折Ｘ線を検出できる透過型のＸ線回折装置とＸ線回折方法とを提供する。 - 特許庁

X-RAY DIFFRACTION DEVICE EQUIPPED WITH TWO-DIMENSIONAL DETECTOR, AND DELETION METHOD OF ITS BLANK INTENSITY例文帳に追加

２次元検出器を備えたＸ線回折装置とそのブランク強度の削除方法 - 特許庁

To provide a method and device for X-ray transmission diffraction analysis remarkably improved in particle statistics.例文帳に追加

粒子統計が著しく改善されたＸ線透過回折分析方法および装置の提供。 - 特許庁

The skin 1 is irradiated with X rays through a beam passing hole 47 to perform measurement by an X-ray diffraction device.例文帳に追加

Ｘ線回折装置によってビーム通過孔４７を通して皮膚１にＸ線を照射して計測が行われる。 - 特許庁

To provide an X-ray diffraction device which miniaturizes a heater and enlarges the burning region for heating a sample without adversely affecting the measurement result of X-ray diffraction, and to simultaneously apply X-ray diffraction measurement to a plurality of samples.例文帳に追加

Ｘ線回折の測定結果に悪影響を及ぼすことなく、ヒータの小型化が図れながら試料を加熱する均熱領域を広くできるＸ線回折装置を提供し、複数の試料に対して同時にＸ線回折測定が良好に行えるようにする。 - 特許庁

An X-ray diffraction device is equipped with: an X-ray source; a movable holding table which holds samples; a two-dimensional detector which detects X-rays to be emitted by diffraction from samples; and a control processing part which controls the X-ray source and the two-dimensional detector.例文帳に追加

Ｘ線回折装置は、Ｘ線源と、試料を保持し、移動可能な保持台と、試料から回折により出射されるＸ線を検出する２次元検出器と、Ｘ線源と保持台と２次元検出器とを制御する制御処理部とを備える。 - 特許庁

To provide an X-ray diffraction device capable of acquiring sufficient diffraction line intensity in a 2θ high angle domain where the diffraction line intensity is weakened, when the sample quantity is small, and maintaining accurately relative X-ray intensity of a diffraction peak in a 2θ middle angle domain and in a 2θ low angle domain where the X-ray irradiation width is widened.例文帳に追加

試料の量が少ない場合に、回折線強度が弱くなる２θ高角度領域で十分な回折線強度を獲得でき、Ｘ線照射幅が広くなる２θ中角度領域及び２θ低角度領域において回折ピークの相対Ｘ線強度を正しく維持できるＸ線回折装置を提供する。 - 特許庁

The x-ray diffraction apparatus includes: an x-ray emitter 13 for applying an x-ray to a measuring object OB; a table 27 for receiving the x-ray diffracted by the measuring object OB and fixing an imaging plate 28 for recording a diffraction ring; and a laser detection device PUH for applying a laser beam to the imaging plate 28 and reading out a shape of the diffraction ring.例文帳に追加

測定対象物ＯＢにＸ線を照射するＸ線出射器１３、測定対象物ＯＢにて回折したＸ線を受光して回折環を記録するイメージングプレート２８を固定するテーブル２７及びレーザ光をイメージングプレート２８に照射して、回折環の形状を読み取るレーザ検出装置ＰＵＨを設ける。 - 特許庁

The powder X-ray diffraction diagram is measured by using an X'Celerator detector and a PANalytical X' Pert Pro diffracting device and the diagram is represented by items of ray position, ray height, ray range, ray width in half height and face-to-face dimension.例文帳に追加

Ｘ’Ｃｅｌｅｒａｔｏｒ検出器とともにＰＡＮａｌｙｔｉｃａｌ Ｘ’Ｐｅｒｔ Ｐｒｏ回折装置を用いて測定され、光線位置、光線高、光線範囲、半分の高さにおける光線幅および面間距離の項目で表される。 - 特許庁

To fix a sample with an arbitrary shape and thickness regardless of the shape and thickness of the sample in an X-ray diffraction device.例文帳に追加

Ｘ線回折装置において、試料の形状や厚みに係わらず任意の形状や厚みの試料を固定する。 - 特許庁

The name of an element, characteristic X-ray type and diffraction order for state analysis are input to an input device 12.例文帳に追加

入力装置１２から状態分析を行う元素の元素名、特性Ｘ線種及び回折次数を入力する。 - 特許庁