「diffracted rays」に関連した英語例文の一覧と使い方 - Weblio英語例文検索

Then, X-rays 10 are imported into the crystal member 1, and transmitted X-rays and diffracted X-rays launched after being transmitted or diffracted by the crystal member 1 are superimposed on each other to form a standing wave 30.例文帳に追加

次いで、第１の結晶部材１にＸ線１０を導入し、第１の結晶部材１を透過又は回折して出射された透過Ｘ線及び回折Ｘ線を重畳させて定在波３０を形成する。 - 特許庁

X rays 10 enter the surface of a sample 12 at an incident angle α for measuring intensity in diffracted X rays 14, the incident angle α is changed for obtaining a change in the intensity in the diffracted X rays 14, and a measurement rocking curve is obtained.例文帳に追加

試料１２の表面に対して入射角αでＸ線１０を入射して回折Ｘ線１４の強度を測定し，入射角αを変化させて回折Ｘ線１４の強度の変化を求めて，測定ロッキングカーブを得る。 - 特許庁

A change in scattered or diffracted X rays is suppressed by controlling the crystal structure of a crystal part and the incident azimuth of incident X rays.例文帳に追加

本発明では、結晶部の結晶構造と入射X線の入射方位を制御することで、この散乱または回折X線の変化を抑える。 - 特許庁

The intensity of diffracted X rays, which are diffracted by an object specimen when applying X rays to the object specimen, is detected on a wide opening angle condition and on a narrow opening angle condition, with a relative ratio between the two taken as "a diffracted X-ray intensity ratio of the object specimen".例文帳に追加

対象試料にＸ線を照射したときに対象試料にて回折した回折Ｘ線の強度を、広い開口角条件と狭い開口角条件にて検出して、両者の相対比を「対象試料の回折Ｘ線強度比」とする。 - 特許庁

Since the diffracted X-rays from the single crystal sample plate 21 are not included in the operation of X-ray intensity, X-ray intensity distribution can be accurately calculated in relation to only the diffracted X-rays from the sample S.例文帳に追加

単結晶試料板２１からの回折Ｘ線がＸ線強度の演算に算入されないので、試料Ｓからの回折Ｘ線だけに関して正確にＸ線強度分布を求めることができる。 - 特許庁

On the other hand, 0 order diffracted light λ_02 different from the 1st order diffracted light λ_12 of the rays of light which has passed the grating 12 is made incident on an output place monitoring device 200.例文帳に追加

一方、出力先モニタ装置２００には、グレーティング１２を通過した光のうち、１次回折光λ_１２とは異なる０次回折光λ_０２が入射する。 - 特許庁

To provide a method for manufacturing a cholesteric liquid crystalline film of which the diffracted rays themselves produce specified polarized light.例文帳に追加

回折光自体が特定の偏光を生じるコレステリック液晶性フィルムの製造方法を提供する。 - 特許庁

The x-rays emitted from the emitting surfaces are diffracted by the diffraction grating to form interference patterns.例文帳に追加

出射面から出射されたＸ線は、回折格子で回折されることにより、干渉パターンを形成する。 - 特許庁

The X-ray detector 1 detects the diffracted X rays 9 through the mold and can acquire a rocking curve.例文帳に追加

Ｘ線検出器１は、モールド越しに回折Ｘ線９を検出し、ロッキング曲線を取得することができる。 - 特許庁

Light rays 203, 301 made incident from an EUV light source device 1 are incident upon the mirror 510, and are reflected or diffracted.例文帳に追加

ＥＵＶ光源装置１から入射する光２０３，３０１は、ミラー５１０に入射し、反射または回折する。 - 特許庁

To provide an optical element which is operated as a diffraction grating and can freely change the diffraction angle of the diffracted rays.例文帳に追加

回折格子として作用し回折光の回折角を自在に変更することのできる光学素子を提供する。 - 特許庁

To condense light rays spectrally diffracted without using a spectroscopic element on pixels displaying hues respectively corresponding to them.例文帳に追加

分光素子を使用することなく分光された光を、それぞれに対応する色相を表示する画素へ集光させる。 - 特許庁

A sample 26 is irradiated with parallel beam X-rays 24 and the diffracted X-rays 28 from the sample 26 are reflected by a mirror 18 to be detected by an X-ray detector 20.例文帳に追加

平行ビームのＸ線２４を試料２６に照射して、試料２６からの回折Ｘ線２８をミラー１８で反射させてからＸ線検出器２０で検出する。 - 特許庁

A sample S is irradiated with X-rays in a narrow X-ray irradiation field A by a collimator 1 and X-rays diffracted by the sample S are detected by a storage phosphor 2.例文帳に追加

コリメータ１によって狭いＸ線照射野Ａで試料ＳにＸ線を照射し、試料Ｓで回折するＸ線を蓄積性蛍光体２で検出する。 - 特許庁

Further, the intensity of diffracted X rays, which are diffracted by a reference specimen when X rays are applied to the reference specimen with its crystal completeness assured, is detected on a wide opening angle condition and on a narrow opening angle condition, with a relative ratio between the two taken as "a diffracted X-ray intensity ratio of the reference specimen".例文帳に追加

また結晶の完全性が保証された参照試料にＸ線を照射したときに参照試料にて回折した回折Ｘ線の強度を、広い開口角条件と狭い開口角条件にて検出して、両者の相対比を「参照試料の回折Ｘ線強度比」とする。 - 特許庁

The diffracted X rays from the sample 14 and the diffracted X rays from the sample 16 are discriminatively detected at least in the Z-direction by a position responsive type X-ray detector 34 after the diffusion in the Z-direction is restricted by the solar slit 32 on a light detecting side.例文帳に追加

試料１４からの回折Ｘ線と，試料１６からの回折Ｘ線を，受光側のソーラースリット３２でＺ方向の発散を制限してから，少なくともＺ方向に位置感応型のＸ線検出器３４で，区別して検出する。 - 特許庁

The incident beams are incident on the semiconductor wafer as an evaluation object to measure the diffracted rays, and the electric characteristics of the semiconductor wafer as the corresponding evaluation object are estimated based on the measurement results and the diffracted rays/characteristic relationship.例文帳に追加

そして、評価対象となる半導体ウェーハに対し入射線ビームを入射させて回折線の測定を行ない、その測定結果と回折線／特性関係とに基づいて、当該評価対象となる半導体ウェーハの電気的特性を推定する。 - 特許庁

In addition, an interlocking means 10 by which the spectral element exchanger 14 and the semiconductor detector 8 are interlocked in such a way that, while the wavelength of the spectrally diffracted fluorescent X-rays 7 is being changed, the spectrally diffracted fluorescent X-rays 7 are incident on the semiconductor detector 8.例文帳に追加

さらに、分光される蛍光Ｘ線7 の波長を変えながら、その分光された蛍光Ｘ線7 が半導体検出器8 に入射するように、分光素子交換器14および半導体検出器8 を連動させる連動手段10を備えている。 - 特許庁

A power of the diffracted rays 100 detected by the photodetector 24 is supplied to a controller 50 and the recording laser power is adjusted.例文帳に追加

フォトディテクタ２４で検出された回折光１００のパワーはコントローラ５０に供給され、記録レーザパワーが調整される。 - 特許庁

Diffracted X-rays 5 by the membrane 1 pass through an emission angle restriction means 8 to be guided to an X-ray detector 6.例文帳に追加

薄膜１による回折Ｘ線５は、出射角制限手段８を通過してＸ線検出器６に導かれている。 - 特許庁

Diffracted X-rays from each position on the sample 28 are detected respectively on different positions on the X-ray detector 30.例文帳に追加

試料２８上の各位置からの回折Ｘ線は、Ｘ線検出器３０上において別個の位置でそれぞれ検出される。 - 特許庁

The photodetecting section 15 detects the difference between the respective focal positions of the two diffracted light rays, by which the focusing error signal FE is obtained.例文帳に追加

そして、受光部１５は、２つの回折光の各焦点位置の差を検出することにより、フォーカシングエラー信号ＦＥを得る。 - 特許庁

A measured rocking curve is obtained by measuring the intensity of diffracted X-rays by making X rays impinge on the surface of the thin film by an incident angle α with respect to the surface, and performing those measurements changing the incident angle α.例文帳に追加

薄膜の表面に対して入射角αでＸ線を入射して回折Ｘ線の強度を測定し，入射角αを変化させて測定ロッキングカーブを得る。 - 特許庁

For the photomask, the dimensions of the plurality of opening patterns and complex amplitude transmittance of a non-transparent region are set so that the amplitudes of three diffracted light rays, among the diffracted light rays from the photomask, set to pass through the pupil of the projection optical system are set equal to one another.例文帳に追加

フォトマスクからの回折光のうち、投影光学系の瞳を通過するように設定される３個の回折光の振幅が等しくなるように、フォトマスクは、複数の開口パターンの寸法と非透明領域の複素振幅透過率とが設定される。 - 特許庁

The defect inspection device is also provided with a spatial filter arranged on a Fourier transformation face for shutting out diffracted rays from the linear part of the circuit pattern.例文帳に追加

更に、回路パターンの直線部分からの回折光を遮光するためにフーリエ変換面上に設けた空間フィルタを有する。 - 特許庁

Electric characteristics of a semiconductor wafer are measured, while measuring diffracted rays derived from a prescribed crystal face from a semiconductor single crystal substrate when incident beams of fixed wavelength which cause a diffraction phenomenon due to a semiconductor crystal lattice are incident on a main surface of the semiconductor wafer, and a relation (diffracted rays/characteristic relationship) between measurement information of the diffracted rays and the electric characteristics is determined.例文帳に追加

半導体ウェーハの電気的特性を測定する一方、該半導体ウェーハの主表面に、半導体結晶格子により回折現象を起こしうる一定波長の入射線ビームを入射させたときの、該半導体単結晶基板からの特定結晶面に由来する回折線の測定を行ない、該回折線の測定情報と電気的特性との関係（回折線／特性関係）を決定する。 - 特許庁

To accurately measure diffracted rays generated from a sample with a wide angle when executing X-ray analysis using a characteristic X-ray of Cr.例文帳に追加

Ｃｒの特性Ｘ線を用いてＸ線分析を行う際に試料から広角度に発生する回折線を正確に測定する。 - 特許庁

The coordinate position where the diffracted X-rays issued from the single crystal sample plate 21 are detected by the two-dimensional X-ray detector is recognized as a blank region not allowed to contribute to the operation of the diffracted X-ray intensity distribution.例文帳に追加

単結晶試料板２１から出る回折Ｘ線が２次元Ｘ線検出器２によって検出される座標位置を、回折Ｘ線強度分布の演算に寄与させないブランク領域として認識する。 - 特許庁

To provide a transmission type X-ray diffraction device capable of excluding an effect of scattered X rays in an incident part to the utmost to detect the diffracted X rays generated in a sample, and an X-ray diffraction method.例文帳に追加

入射部での散乱Ｘ線の影響を極力排して試料で生じた回折Ｘ線を検出できる透過型のＸ線回折装置とＸ線回折方法とを提供する。 - 特許庁

To highly accurately detect diffraction angles of diffracted X rays going out of a specimen in various directions with the direction of the specimen kept unchanged as far as possible relative to incident X rays.例文帳に追加

入射Ｘ線に対して試料の向きをできるだけ変化させることなく，かつ，試料からいろいろな方向に出ていく回折Ｘ線について，その回折角を高精度で検出できるようにする。 - 特許庁

To provide a method for manufacturing a polarized light diffraction element of which the diffracted rays themselves produce specified polarized light such as circularly polarized light or linearly polarized light.例文帳に追加

回折光自体が円偏光や直線偏光のような特定の偏光を生じる偏光回折素子の製造方法を提供する。 - 特許庁

The intensity lost from diffracted rays appears as diffuse background intensity, and the incident electrons can gain or lose energy of the order of kT. 例文帳に追加

回折線から失われる強度は散漫なバックグラウンド強度として現れ、そして入射電子はkTのオーダーのエネルギーを増すかまたは失う。 - 科学技術論文動詞集

A filter 16, for causing transmittance of 1.2% or lower X-rays to be diffracted by the sample 1, which have the same wavelength as that of fluorescent X-rays 7 to be measured among X-rays 14 generated by an X-ray tube 13, is positioned between the X-ray tube 13 and the sample 1.例文帳に追加

Ｘ線管13が発生するＸ線14のうち、測定対象の蛍光Ｘ線7 と波長が同一であって試料1 で回折されるＸ線を１．２％以下の透過率で透過させるフィルタ16を、Ｘ線管13と試料1 の間に位置させる。 - 特許庁

To provide a method for manufacturing a cholesteric liquid crystalline film of which the diffracted rays themselves produce specified polarized light such as circularly polarized light or linearly polarized light.例文帳に追加

回折光自体が円偏光や直線偏光のような特定の偏光を生じるコレステリック液晶性フィルムの製造方法を提供する。 - 特許庁

To measure warpage of a single-crystal substrate in a component sealed with a package material by diffracted X-rays through the package material without destroying the component.例文帳に追加

パッケージ材料で封止した部品中の単結晶基板の反りを、部品を破壊することなくパッケージ材料越しに回折Ｘ線を用いて測定する。 - 特許庁

To provide a luminous flux dividing element which emits an even number of diffracted rays of light and has enhanced diffraction efficiency.例文帳に追加

偶数本の回折光を発生する光束分割素子であって、回折効率を従来の素子よりも高めることができる光束分割素子を提供すること。 - 特許庁

To provide a fluorescence X-ray analyzer capable of suppressing the generation of higher-order diffracted X rays or escape peaks and to accurately and precisely perform analysis.例文帳に追加

高次の回折Ｘ線やエスケープピークの発生を抑制し、分析を正確に精度よく行うことができる蛍光Ｘ線分析装置を提供する。 - 特許庁

In the region B, the inclined angle is selected to result in the maximum diffraction efficiency of the first-order diffracted light for the principal rays incident perpendicular to the grating plane face.例文帳に追加

領域Ｂは格子面に垂直に入射する主光線に対して１次回折光の回折効率が最大になるよう上記傾斜角を選ぶ。 - 特許庁

The helium path 13 has a first window 54a for passing the diffracted rays emitted from the sample S, and a second window positioned in front of the stimulable phosphor plate.例文帳に追加

また、ヘリウムパス１３は試料Ｓから出る回折線を通過させる第１窓５４ａと蓄積性蛍光体プレートの前に位置する第２窓とを有する。 - 特許庁

For a crystal of known lattice spacing d, X-rays of a specific wavelength λ will be diffracted at an angle θ given by the well-known Bragg equation. 例文帳に追加

知られている格子間隔dの結晶について、特定の波長λのX線は、良く知られているブラッグの式で与えられる角度θで回折される。 - 科学技術論文動詞集

A diffraction optical element 13 which generates 0-th diffracted light and ±1st diffracted rays of light, a condenser lens 18, a cylindrical lens 19 and a photo detector 20 are provided as a return-path optical system in the optical system of an optical head 104.例文帳に追加

光ヘッド１０４の光学系１０における復路光学系として、０次回折光及び±１次回折光を発生させる回折光学素子１３と、集束レンズ１７と、シリンドリカルレンズ１８と、光検出器２０とを設ける。 - 特許庁

A shield member 13 is arranged between a sample 3 and an X-ray detector 6 so that the light path of X-rays 11 transmitted through the sample is not looked from the X-ray detector 6 without shielding diffracted X-rays.例文帳に追加

試料３とＸ線検出器６との間に、回折Ｘ線５を遮蔽することなく、試料３を透過した透過Ｘ線１１の光路がＸ線検出器６から見えないように遮蔽体１３を配置する。 - 特許庁

The X-ray diffractometer 1 is equipped with a measuring instrument 2 for irradiating a sample with the X rays emitted from an X-ray source and detecting the X rays, which are diffracted by the sample, by an X-ray detector.例文帳に追加

Ｘ線源から発生したＸ線を試料に照射すると共にその試料で回折したＸ線をＸ線検出器によって検出する測定装置２を備えたＸ線回折装置１である。 - 特許庁

By using a detector 15 and a detector 16, diffracted X-rays 14D and specularly reflected X-rays 14R of the sample 14 in which a thin film is formed on a crystal substrate and those of the sample after the removal of the thin film are detected.例文帳に追加

検出器１５，１６は、結晶基板上に薄膜が形成された前記試料と前記薄膜を除去した後の前記試料の回折Ｘ線１４Ｄおよび鏡面反射Ｘ線１４Ｒを検出する。 - 特許庁

An X-ray intensity measuring device 17 changes glancing angle of incident X-rays 12B so as to measure the intensity characteristic of the diffracted X-rays 14D before and after the removal of the thin film on the basis of a detection signal S15.例文帳に追加

Ｘ線強度測定装置１７は、入射Ｘ線１２Ｂの視斜角θを変化させて検出信号Ｓ１５に基づいて薄膜の除去前後の回折Ｘ線１４Ｄの強度特性を測定する。 - 特許庁