「粗表面散乱」に関連した英語例文の一覧と使い方 - Weblio英語例文検索

数μm〜数百μm程度の表面粗さを有する表面の粗さを、超音波散乱を利用してインプロセスで評価可能な表面粗さ評価方法および評価装置を提供することを課題とする。例文帳に追加

To provide a method of evaluating surface roughness and its evaluation device capable of performing in-process evaluation of surface roughness having surface roughness of the order of a few μm to a few hundreds of μm by using ultrasonic scattering. - 特許庁

ロ　光の散乱を角度の関数として処理することにより表面粗さを測定するものであって、〇・五ナノメートル以下の感度を有するもの例文帳に追加

(b) Measuring devices that measure surface roughness by treating the angles of the scattering of light as functions and that have a sensitivity of 0.5 nanometers or less  - 日本法令外国語訳データベースシステム

研磨パッド１０に設けた開口１８に、入射光の１０％以上を散乱させる表面粗さを有する下面３４を持つ窓３０を固定し、この下面３４と接して散乱防止層５０を形成する。例文帳に追加

A window 30 having a bottom 34 having a surface roughness for scattering at least 10% of incident light is fixed to an opening 18 arranged in a polishing pad 10, and thus a scattering-preventing-layer 50 is formed in contact with the bottom 34. - 特許庁

樹脂１３と該樹脂中に平均粒径が０．５μｍ以上３μｍ以下である粒子１２を分散させた光散乱膜９であって、光散乱膜を形成した後の膜表面のＲａ（中心線平均粗さ）が５０ｎｍ以下であること。例文帳に追加

The center line average height Ra of the film surface after forming the light scattering film is 50nm or less. - 特許庁

試料表面の面粗さや正常な回路パターンからの散乱光の影響を抑制し、かつ、欠陥や異物からの散乱光の利得を高くして、高感度に試料表面の欠陥等を検出することが可能な欠陥検査装置を実現する。例文帳に追加

To provide a flaw inspection device capable of suppressing the influence of scattered light from the roughness of a sample surface and a normal circuit pattern, and detecting a flaw or the like of the sample surface at high sensitivity by increasing the gain of the scattered light from the flaw or a foreign substance. - 特許庁

このとき下地膜部分の粗さ（界面粗さ）はおよそ0.5nm（ＲＭＳ）以下であり多層反射膜３の表面に粗さが反映されて散乱損失の原因となることはない。例文帳に追加

At this time, the roughness (interface roughness) of the base film is about 0.5 nm (RMS) or less so that the scattering loss may be not derived from reflecting the roughness on the surface of the multilayer reflection film 3. - 特許庁

ウエハ表面粗さや酸化膜下の面粗さ、回路パターンからの散乱光を低減して、欠陥散乱光を多く検出するために斜方検出系の仰角を下げると仰角α２＜α１となるがレンズの外径１０ｂはレンズ外径１０ａより小となり散乱光の集光能力が低下する。例文帳に追加

When the elevation angle of a rhombic detection system is reduced in order to detect much flaw scattered light by reducing the scattered light from wafer surface roughness, surface roughness under an oxide film, and the circuit pattern, the elevation angle α2 becomes lower than α1, but the outer diameter 10b of the lens becomes shorter than the lens outer diameter 10a and the condensing capacity of the scattered light decreases. - 特許庁

感光ドラム１の表面に微小なグレージング角θでレーザ光Ｌｂを照射し、その散乱光成分Ｌｂ２を、傷による散乱光領域Ｓ３に配備された受光部材ＳＡ，ＳＢ，ＳＣと、汚れ（表面粗さ）による散乱光領域Ｓ２に配備された受光部材ＳＡＵとで受光する。例文帳に追加

The surface of a photosensitive drum 1 is irradiated with a laser beam Lb at a minute glazing angle θ and the scattered beam component Lb2 thereof is detected by the light detecting members SA, SB and SC arranged on a scattered beam region S3 due to a flaw and the light detecting member SAU arranged on a scattered beam region S2 due to a stain (surface roughness). - 特許庁

被検査表面が粗く、内部の結晶粒が粗大で、かつ音波の散乱減衰が大きい、超音波探傷が比較的困難な被検体に対して好適な、バースト波を用いた超音波探傷方法を提供する。例文帳に追加

To provide an ultrasonic flaw detection method using a burst wave, suitable for an object to be inspected relatively difficult to ultrasonically detect a flaw because the surface to be inspected is rough and internal crystal particles are coarse and the scattering attenuation of a sonic wave is large. - 特許庁

これは、視野近接表面の表面粗度を事前適応させるか又は変更することにより、及び／又は特別にターゲットを定めた光散乱特性を有する光学要素を瞳平面に設置することにより有利に達成される。例文帳に追加

This can be achieved advantageously by adapting in advance or changing surface roughness of a surface in the vicinity of the visual field, and/or by providing a specially targeted optical element having a light scattering characteristic on a pupil plane. - 特許庁

試料３表面からの散乱光を、順次、結像レンズ４、ＣＣＤ５を経て、電気信号に変換させ、ＣＣＤ画像を記録、解析し、試料の表面粗さまたは表面形状を表す数値化されたデータを得、試料表面のマイクロラフネスを評価する。例文帳に追加

The scattered light from the surface of the sample 3 is successively converted into an electrical signal through an image forming lens 4 and a CCD 5 and a CCD image is recorded and analyzed to obtain data where the surface roughness or surface shape of the sample is shown as a numerical value for evaluating the microroughness of the surface of the sample. - 特許庁

被検査体表面に対して光を照射する光源と、前記被検査体表面で反射した反射光の後方散乱成分を受光する受光手段と、該受光手段で受光した光量にもとづいて、前記被検査体の表面粗さを算出する信号処理装置とを備える。例文帳に追加

This device is equipped with a light source for irradiating the inspection object surface with light, a light receiving means for receiving a back-scattering component of reflected light reflected by the inspection object surface, and a signal processing device for calculating surface roughness of the inspection object based on the light quantity received by the light receiving means. - 特許庁

この光学素子１は中心線表面平均粗さＲａが５ｎｍ以下である光学面１ａ，１ｂを両面に有することにより、特に、５００ｎｍ以下の短波長の光に対して散乱光を減じることができる。例文帳に追加

In the optical element 1, scattering of light in a short wavelength region, particularly ≤500 nm, can be decreased by forming optical faces 1a, 1b having ≤5 nm center line surface average roughness on the both surfaces. - 特許庁

光学薄膜の表面粗さを従来よりも低減して、散乱やフレアー等の光学性能劣化現象を防止した樹脂接合型光学素子とその製造方法を提供すること。例文帳に追加

To prevent optical performance deterioration phenomenon such as scattering, flare or the like by reducing the surface roughness of an optical thin film more than before in the conventional element. - 特許庁

透明板状の導光板１の小口面２に、ＬＥＤ等より成る光源４を配置し、光源４を配置した小口面２を除く表面の一部又は全部を、粗面加工を施して光散乱面３とする。例文帳に追加

A light source 4 consisting of a LED is arranged on an edge surface 2 of a transparent plate light guide 1 and all or part of the surface except the edge surface 2 on which the light source 4 is arranged is formed as a light scattering surface 3 by applying roughening work thereto. - 特許庁

基板の少なくとも片面に、散乱層および低抵抗化層をこの順に設けてなり、該低抵抗化層上の表面粗さが５〜２０ｎｍである膜付き基板。例文帳に追加

The substrate with film has a scattering layer and a low resistance layer provided on at least one side of a substrate in this order, and the surface roughness of the low resistance layer is 5-20 nm. - 特許庁

テラヘルツ波濾波材の赤外線レーザ光入射側表面に、赤外線レーザ光の波長程度の粗さの赤外光散乱層を形成したテラヘルツ波濾波器を備える。例文帳に追加

The terahertz wave generating device has a terahertz wave filter which is formed with an infrared light scattering layer on a surface on incident side of the infrared laser light of a terahertz filtering material, the layer having a roughness of about a wavelength of the infrared laser light. - 特許庁

たとえば屈折面や反射面の表面粗さなどに起因する散乱光の影響を実質的に受けることなく、有効結像領域の全体に亘って所望線幅のパターン像を得ることのできる投影光学系。例文帳に追加

To provide a projection optical system which can obtain pattern images of a desired line width over an effective image formation area without being substantially affected by scattered lights caused by the surface roughness, etc. of a refraction face or reflection face, for example. - 特許庁

表示パネル用導光板１での少なくとも受光面３ａに対向する側面３ｃと表面２の縁部２ａでのこの側面３ｃ側の部分６とが梨地粗面とされており、これら側面３ｃと部分６とで反射された光は、梨地粗面６，７により、散乱光となる。例文帳に追加

At least a side face opposed to the light receiving surface 3a and a portion 6 on the side face 3c side in an edge part 2a of a surface, of the light guiding plate 1 for display panel are treated into frosted rough faces, and light reflected by the side face 3c and the portion 6 is made into scattered light by frosted rough faces 6 and 7. - 特許庁

複屈折がなく、高屈折率を示すペロブスカイト型化合物を主成分とする透光性セラミックにおいて、研磨効率に優れるメカノケミカル研磨加工を行っても表面粗さが小さく、表面散乱による透過率低下の懸念の少ない透光性セラミックを得る。例文帳に追加

To obtain a translucent ceramic having small surface roughness even if a mechanochemical polishing having excellent polishing efficiency is performed and with little possibility of deterioration of transmittance due to surface scattering in a translucent ceramic consisting essentially of a perovskite type compound which has no birefringence and exhibits high refractive index. - 特許庁

記録媒体にレーザ光を照射し、表面散乱により生成されるスペックルを画像センサで測定し、得られたスペックル情報をＦＦＴ変換し、記録媒体の表面の粗さによる固有パターンから、記録媒体の紙質を判別する。例文帳に追加

A laser beam is radiated on the recording medium, a speckle generated by surface scattering is measured by an image sensor, speckle information obtained is subjected to FFT transform, and a paper quality of the record medium is discriminated from a peculiar pattern due to roughness of the surface of the record medium. - 特許庁

光を散乱する粗い凹凸構造と、周期が可視光の波長以下である微細凹凸構造とからなるマルチ凹凸構造を陽極酸化によって表面に形成できるスタンパの製造方法及び該スタンパを用いた成形体の製造方法を提供する。例文帳に追加

To provide a method of manufacturing a stamper by which a multi-rugged structure comprising a coarse rugged structure scattering light and a fine rugged structure having a period equal to or below the wavelength of visible light is formed on the surface by the anodization, and to provide a method of manufacturing a formed product using the stamper. - 特許庁

色素増感半導体電極２と対極３との間に電解質層５を有する光電変換素子、例えば色素増感湿式太陽電池において、対極３の電解質層５に面する側に、表面粗さＲ_a が３０ｎｍ〜１０μｍの光散乱反射層４を形成する。例文帳に追加

In the photoelectric conversion element having an electrolyte layer 5 between a dye-sensitized semiconductor electrode 2 and a counterelectrode 3, such as, for example, a dye-sensitized wet solar cell, a light scattering reflective layer 4 whose surface roughness R_a is 30 nm to 10 μm is formed on a side opposed to the electrolyte layer 5 of the counterelectrode 3. - 特許庁

シート部材と記録層との間に反射層を設け、この反射層の記録層に接する表面の十点平均粗さＲｚを読み出し光の波長より小さくすることで、反射層の凹凸による光の散乱が顕著に抑制される。例文帳に追加

The reflecting layer is provided between the sheet member and recording layer and 10-point mean roughness Rz of the surface of the reflecting layer which is in contact with the recording layer is made smaller than the wavelength of readout light to remarkably suppress scatter of light due to unevenness of the reflecting layer. - 特許庁

本発明は、基板と多孔質膜の接合性の向上に、基板と電解質の直接的な接触を遮断することによるエネルギー転換効率の向上及び、基板の粗表面での光散乱を防止することによる高い透光度を有する光電極を含む色素増感太陽電池用の光電極（ｐｈｏｔｏ−ｅｌｅｃｔｒｏｄｅ）及びその製造方法を提供するためのものである。例文帳に追加

To provide a photoelectrode for a dye sensitized solar cell including a photoelectrode having a high degree of light transmission by improving the bondability between a substrate and a porous membrane, improving energy conversion efficiency by breaking the direct contact between the substrate and an electrolyte, and preventing light from being scattered on the rough surface of the substrate, and to provide a manufacturing method of the photoelectrode. - 特許庁