「diffracted ray」に関連した英語例文の一覧と使い方(2ページ目) - Weblio英語例文検索

To provide a transmission type X-ray diffraction device capable of excluding an effect of scattered X rays in an incident part to the utmost to detect the diffracted X rays generated in a sample, and an X-ray diffraction method.例文帳に追加

入射部での散乱Ｘ線の影響を極力排して試料で生じた回折Ｘ線を検出できる透過型のＸ線回折装置とＸ線回折方法とを提供する。 - 特許庁

Further, the intensity of diffracted X rays, which are diffracted by a reference specimen when X rays are applied to the reference specimen with its crystal completeness assured, is detected on a wide opening angle condition and on a narrow opening angle condition, with a relative ratio between the two taken as "a diffracted X-ray intensity ratio of the reference specimen".例文帳に追加

また結晶の完全性が保証された参照試料にＸ線を照射したときに参照試料にて回折した回折Ｘ線の強度を、広い開口角条件と狭い開口角条件にて検出して、両者の相対比を「参照試料の回折Ｘ線強度比」とする。 - 特許庁

To provide a fluorescence X-ray analyzer capable of suppressing the generation of higher-order diffracted X rays or escape peaks and to accurately and precisely perform analysis.例文帳に追加

高次の回折Ｘ線やエスケープピークの発生を抑制し、分析を正確に精度よく行うことができる蛍光Ｘ線分析装置を提供する。 - 特許庁

The X-ray diffracting apparatus 1 selects the wavelength of X-rays emergent from an X-ray light source 2 by a monochromator 3, irradiate the sample 10 to be diffracted, detects X-rays diffracted from the sample 10 by a detector 7, and is provided with a ring-shaped slit 6 arranged between the sample 10 and the detector 7.例文帳に追加

Ｘ線回折装置１は、Ｘ線光源２から出射されたＸ線の波長をモノクロメータ３で選択して、回折対象の試料１０に照射し、当該試料１０から回折するＸ線を検出器７で検出するが、試料１０と検出器７との間に環状スリット６が配設されている。 - 特許庁

A positional change in intensity of a diffracted X-ray from the sample crystal 6 is detected via an X-ray image magnifying crystal 10 fixed within a diffraction angle range, using an optical system of an X-ray topograhpy arranged with the X-ray image magnifying crystal 10 in a rear stage of the sample crystal 6 of which the strain is measured.例文帳に追加

ひずみを測定すべき試料結晶６の後段にＸ線像拡大用結晶１０を配置したＸ線トポグラフィの光学系を用いて、試料結晶６からの回折Ｘ線強度の場所的変化を、回折角度範囲に固定されたＸ線像拡大用結晶１０を介して検出する。 - 特許庁

A shield member 13 is arranged between a sample 3 and an X-ray detector 6 so that the light path of X-rays 11 transmitted through the sample is not looked from the X-ray detector 6 without shielding diffracted X-rays.例文帳に追加

試料３とＸ線検出器６との間に、回折Ｘ線５を遮蔽することなく、試料３を透過した透過Ｘ線１１の光路がＸ線検出器６から見えないように遮蔽体１３を配置する。 - 特許庁

The diffracted X rays from the sample 14 and the diffracted X rays from the sample 16 are discriminatively detected at least in the Z-direction by a position responsive type X-ray detector 34 after the diffusion in the Z-direction is restricted by the solar slit 32 on a light detecting side.例文帳に追加

試料１４からの回折Ｘ線と，試料１６からの回折Ｘ線を，受光側のソーラースリット３２でＺ方向の発散を制限してから，少なくともＺ方向に位置感応型のＸ線検出器３４で，区別して検出する。 - 特許庁

This X-ray analyzer has an X-ray source F for generating the characteristic X-ray of Cr emitted to the sample S, a stimulable phosphor plate for receiving the diffracted rays emitted from the sample S, and a helium path 13 arranged between the sample S and the stimulable phosphor plate.例文帳に追加

試料Ｓに照射するＣｒの特性Ｘ線を発生するＸ線源Ｆと、試料Ｓから出る回折線を受光する蓄積性蛍光体プレートと、試料Ｓと蓄積性蛍光体プレートとの間に配置されたヘリウムパス１３とを有するＸ線分析装置である。 - 特許庁

A sample 26 is irradiated with parallel beam X-rays 24 and the diffracted X-rays 28 from the sample 26 are reflected by a mirror 18 to be detected by an X-ray detector 20.例文帳に追加

平行ビームのＸ線２４を試料２６に照射して、試料２６からの回折Ｘ線２８をミラー１８で反射させてからＸ線検出器２０で検出する。 - 特許庁

A sample S is irradiated with X-rays in a narrow X-ray irradiation field A by a collimator 1 and X-rays diffracted by the sample S are detected by a storage phosphor 2.例文帳に追加

コリメータ１によって狭いＸ線照射野Ａで試料ＳにＸ線を照射し、試料Ｓで回折するＸ線を蓄積性蛍光体２で検出する。 - 特許庁

The method is employed for evaluating hard tissue enters X rays emitted from an X-ray source 1 into hard tissue 4 and for detecting the X rays by an X-ray detector 5 which are diffracted by the hard tissue 4 and emitted to the permeate side of the hard tissue 4.例文帳に追加

Ｘ線源１から出射したＸ線を硬組織４に入射させ、硬組織４で回折して硬組織４の透過側に出射したＸ線をＸ線検出器５で検出する硬組織の評価方法である。 - 特許庁

The x-ray diffraction apparatus includes: an x-ray emitter 13 for applying an x-ray to a measuring object OB; a table 27 for receiving the x-ray diffracted by the measuring object OB and fixing an imaging plate 28 for recording a diffraction ring; and a laser detection device PUH for applying a laser beam to the imaging plate 28 and reading out a shape of the diffraction ring.例文帳に追加

測定対象物ＯＢにＸ線を照射するＸ線出射器１３、測定対象物ＯＢにて回折したＸ線を受光して回折環を記録するイメージングプレート２８を固定するテーブル２７及びレーザ光をイメージングプレート２８に照射して、回折環の形状を読み取るレーザ検出装置ＰＵＨを設ける。 - 特許庁

An X-ray imaging unit 11 is placed in a position at an approximate Talbot distance L from a diffraction grating for Talbot and is a unit for imaging X-rays diffracted by the diffraction grating for Talbot.例文帳に追加

Ｘ線撮像ユニット１１は、タルボ用回折格子から略タルボ距離Ｌ離れた位置に配置され、タルボ用回折格子によって回折されたＸ線を撮像するためのユニットである。 - 特許庁

Infrared detectors 100 to 104 comprise diffraction gratings 20, 21, and 22 to diffract an infrared ray and an infrared detecting element 3 to detect the infrared ray, both of which are installed in a package 4, and detects the infrared ray with the specific wavelength diffracted by the diffraction gratings 20, 21, and 22 using the infrared detecting element 3.例文帳に追加

赤外線を回折する回折格子２０，２１，２２と、赤外線を感知する赤外線検出素子３とを、同一パッケージ４内に備え、回折格子２０，２１，２２により回折された特定波長の赤外線を、赤外線検出素子３により検出する赤外線検出器１００〜１０４とする。 - 特許庁

To measure the thickness of a thin film by an X-ray diffraction method by performing the parameter fitting of a theoretical rocking curve of diffracted X-ray intensity considering orientation to a measured rocking curve, even when film thickness measurement by an X-ray reflectivity method can not be performed because of a reason as existence of a contiguous layer having an approximate density or the like.例文帳に追加

密度が近い隣接層が存在するなどの理由でＸ線反射率法による膜厚測定ができない場合でも，配向性を考慮した回折Ｘ線強度の理論ロッキングカーブを測定ロッキングカーブにパラメータフィッティングすることで，Ｘ線回折法によって薄膜の膜厚を測定可能にする。 - 特許庁

The X-ray diffraction device comprises: a casing 1 in which the samples are arranged; an X-ray irradiator 2 for radiating X-rays to the samples arranged in casing 1; an X-ray detector 3 for detecting the diffracted X-rays having transmitted through the samples; and the heater 4 that is arranged in the casing 1 and heats the samples arranged in this casing 1.例文帳に追加

試料が配置されるケーシング1と、ケーシング1内に配置された試料にＸ線を照射するＸ線照射器2と、試料を透過した回折Ｘ線を検出するＸ線検出器3と、ケーシング1内に配置され、このケーシング1内に配置された試料を加熱するヒータ4とを備える。 - 特許庁

An X-ray mask 1 and the member 2 are arranged at such a distance D that X-rays passing through different regions of the X-ray mask 1 are diffracted to cause interference, and the member 2 which has at least its structure forming surface made of a photosensitive material is exposed to the X rays through the X-ray mask 1.例文帳に追加

Ｘ線マスク１と部材２とを、Ｘ線マスク１の異なる領域を通過したＸ線同士が回折により干渉を生じる距離Ｄだけ離して配置し、Ｘ線マスク１を介して、少なくとも構造体形成面が感光性材料からなる部材２に向けてＸ線を露光する。 - 特許庁

A characteristic X-ray emitted from a micro area 3 on the sample 2 in response to irradiation of an electron beam is collected efficiently by the X-ray lens 4 to be converted into a parallel beam, and the X-rays of the same wavelength are diffracted by the plane crystal 6 to be brought into a parallel beam, and is analyzed by an X-ray detector 8.例文帳に追加

電子線の照射に応じて試料２上の微小領域３から放出された固有Ｘ線をＸ線レンズ４で効率良く収集して平行線束に変換し、平板結晶６により同一波長のＸ線が平行線束となるように回折してＸ線検出器８により検出する。 - 特許庁

The method includes the steps of: delivering the X-ray to a single-crystal substrate sealed with a package material; detecting the diffracted X-ray from the single-crystal substrate over the package material; and obtaining the stress of the single-crystal substrate by using a result of the detection step.例文帳に追加

単結晶基板をパッケージ材料で封止した部品にＸ線を照射し、前記単結晶基板からの回折Ｘ線を前記パッケージ材料越しに検出し、前記検出ステップの結果を用いて前記単結晶基板の応力を求める。 - 特許庁

The drawn wire material is irradiated with an X-ray from a target through an incident collimator, using a 2θ-θ method, and the X-ray diffracted from the drawn wire material is made to get incident into a counter through a photoreception side collimator, to measure diffraction peaks in a plurality of crystal faces in the drawn wire material.例文帳に追加

２θ−θ法を用いて、ターゲットからのＸ線を入射コリメータを通して伸線材に当て、伸線材からの回折したＸ線を受光側コリメータを通して計数器に入射して、伸線材の複数の結晶面による回折ピークを測定する。 - 特許庁

In the sample fixing method of X-ray diffraction measurement, a sample is pasted to one surface of a base having a hollow exceeding an X-ray irradiation area for irradiating the sample with X rays from a target and capturing and counting diffracted X rays from the sample.例文帳に追加

Ｘ線回折測定における試料固定方法は、ターゲットからＸ線を試料に照射し、試料からの回折されたＸ線を捕捉して計数するために、Ｘ線照射面積を越える中空を有する土台の片面に試料を貼るものである。 - 特許庁

A filter 16, for causing transmittance of 1.2% or lower X-rays to be diffracted by the sample 1, which have the same wavelength as that of fluorescent X-rays 7 to be measured among X-rays 14 generated by an X-ray tube 13, is positioned between the X-ray tube 13 and the sample 1.例文帳に追加

Ｘ線管13が発生するＸ線14のうち、測定対象の蛍光Ｘ線7 と波長が同一であって試料1 で回折されるＸ線を１．２％以下の透過率で透過させるフィルタ16を、Ｘ線管13と試料1 の間に位置させる。 - 特許庁

The X-ray beam 2' is incident on an XZ surface, and an X-axis is moved to determine the position in the surface of the sample 1 on the basis of X-coordinates X1 and X2 that has diffracted X rays 2a suddenly changed in the intensity.例文帳に追加

Ｘ線ビーム２’をＸＺ面に入射し、Ｘ軸を移動して回折Ｘ線２ａ強度が急変するＸ座標Ｘ１、Ｘ２を基準として試料１面内の位置を決定する。 - 特許庁

A value obtained by dividing "the intensity ratio of the object specimen" by "the intensity ratio of the reference specimen" is taken as "a standardized diffracted X-ray intensity ratio" to analyze a crystalline state from this value.例文帳に追加

そして、「対象試料の回折Ｘ線強度比」を、「参照試料の回折Ｘ線強度比」で除算した値を、「規格化された回折Ｘ線強度比」としこの値から結晶状態を解析する。 - 特許庁

A method for measuring the warpage on a single crystal substrate includes a generation step to generate an X ray with an angle spread, an irradiation step to irradiate the single crystal substrate with the X ray with the angle spread, and a detection/measurement step that detects the X ray diffracted from the single crystal substrate to measure the warpage on the single crystal substrate.例文帳に追加

単結晶基板の反り測定方法であって、角度広がりを持つＸ線を発生させる発生ステップと、前記角度広がりを持つＸ線を単結晶基板に照射する照射ステップと、前記単結晶基板からの回折Ｘ線を検出して、前記単結晶基板の反りを測定する検出・測定ステップと、を含むようにする。 - 特許庁

In the analyzing method of the X-ray absorbing fine structure for analyzing the X-ray absorbing fine structure of a sample 13 by spectrally diffracting X-rays by a polychromater to irradiate the sample 13 with spectrally diffracted X-rays, vibration is applied to the sample 13 in a measuring time by an ultrasonic generator 7.例文帳に追加

ポリクロメータでＸ線を分光して、分光したＸ線をサンプル１３に照射することにより、サンプル１３のＸ線吸収微細構造を分析するＸ線吸収微細構造分析方法において、測定時間内に、超音波発生装置７によりサンプル１３に振動を与える。 - 特許庁

An X-ray intensity measuring device 17 changes glancing angle of incident X-rays 12B so as to measure the intensity characteristic of the diffracted X-rays 14D before and after the removal of the thin film on the basis of a detection signal S15.例文帳に追加

Ｘ線強度測定装置１７は、入射Ｘ線１２Ｂの視斜角θを変化させて検出信号Ｓ１５に基づいて薄膜の除去前後の回折Ｘ線１４Ｄの強度特性を測定する。 - 特許庁

Three angles 2θ, ω, ϕ detectable by the diffracted X-ray are measured relative to at least three Miller indices by using the three-axis goniometer and the two slits 50, 52, and the lattice constant is calculated based thereon.例文帳に追加

この３軸ゴニオメータと二つのスリット５０，５２を用いて，少なくとも三つのミラー指数について，回折Ｘ線が検出できる三つの角度２θ，ω，φを測定し，それに基づいて格子定数を算出する。 - 特許庁

The ink composition comprises a colorant composed of a pseudo- one-dimensionally crystallizable color organic pigment having a diffracted wave showing a maximum intensity and its n-th order diffracted wave (wherein n is an integer of ≥2) as the major peaks in the X-ray diffraction spectrum, a water-soluble organic solvent, a surface active agent, and a water-soluble resin.例文帳に追加

Ｘ線回折スペクトルにおいて、最大強度を示す回折線とそのｎ次（ｎ：２以上の整数）の回折線を主要ピークとして有する擬１次元結晶性カラー有機顔料からなる着色剤、水溶性有機溶剤、界面活性剤および水溶性樹脂を含有することを特徴とするインク組成物により、上記の課題を解決する。 - 特許庁

Since the refractive indexes of the double refraction medium layer and of the homogeneous refractive index transparent material are different when the abnormal ray polarization is incident to the objective optical element OBJ1, the abnormal ray polarization is diffracted at a saw-tooth uneven section, and the transmission wave surface is changed in accordance with this diffraction, then a divergent angle or convergent angle is changed.例文帳に追加

対物光学素子ＯＢＪ１に異常光偏光が入射すると複屈折媒質層と均質屈折率透明材料の屈折率が異なるので、異常光偏光は鋸歯状の凹凸部で回折され、それに応じて透過波面が変化し発散角もしくは収束角が変化する。 - 特許庁

The imaging device comprises an X-ray source 110, a diffraction grating 130 for diffracting X-rays emitted from the X-ray source 110, a shielding grating 150 for shielding a part of the X-rays diffracted by the diffraction grating 130 and a detector 170 for detecting intensity distribution of the X-rays having passed through the shielding grating 150.例文帳に追加

撮像装置はＸ線源１１０とＸ線源１１０から出射したＸ線を回折する回折格子１３０と回折格子１３０によって回折されたＸ線の一部を遮る遮蔽格子１５０と遮蔽格子１５０を経たＸ線の強度分布を検出する検出器１７０とを有する。 - 特許庁

The reflected X-ray measuring means 6 is moved along the track obtained by setting an emitted X-ray vector in the same direction as the incident vector of incident X-rays to a reference point (zero point) to rotate the same centering around the normal line T from the center of the surface of the measuring sample to detect the diffracted light from the surface of the sample.例文帳に追加

入射Ｘ線の入射ベクトルと同方向の射出Ｘ線ベクトルを基準点（０点）として、前記測定試料表面の中心からの法線Ｔの周りに前記射出ベクトルを回転して得た軌跡に沿って、前記反射Ｘ線測定手段６を移動し、試料表面からの回折光を検出する。 - 特許庁

The transmission type X-ray diffraction device is equipped with a sample chamber 100 forming a closed space for arranging the sample 10, a heating means 900 for heating the sample 10 in the sample chamber 100, and an X-ray detecting part 200 for detecting diffracted X rays which are generated by irradiating the sample 10 with X rays outside the sample chamber 100.例文帳に追加

試料10を配置するための閉鎖された空間を構成する試料室100と、試料室100内の試料10を所定温度に加熱する加熱手段900と、Ｘ線が試料10に照射されて生じる回折Ｘ線を試料室100の外部で検出するＸ線検出部200とを備える透過型Ｘ線回折装置である。 - 特許庁

To extract X-ray beams selectively which are diffracted with various surface indexes, by forming two or more kinds of reflecting surface pairs on a common single crystal block, and by switching the reflection surface pair only by rotating a channel-cut monochromator.例文帳に追加

共通の単結晶ブロックに少なくとも２種類の反射面ペアを形成して、チャンネルカットモノクロメータを回転させるだけで反射面ペアを切り換えて、いろいろな面指数で回折させたＸ線ビームを選択的に取り出すことができるようにする。 - 特許庁

To perform accurate qualitative analysis by accurately performing the comparison of the measured data of the intensity of diffracted X-rays and standard data even in such a case that a measuring condition of the measured data and the standard data is different, especially, a diffusion slit is different in the X-ray diffraction device.例文帳に追加

Ｘ線回折装置において、回折Ｘ線強度の測定データと標準データの測定条件、特に、発散スリットが異なる場合でも、測定データと標準データの比較を正確に行い正確な定性分布を行う。 - 特許庁

To provide a high performance X-ray absorption fine structure measuring cell using an X-ray transmitting window that can resist to high temperature and high pressure, is safeness without venomousness, is inoxidizable in oxidation environment, can perform XAFS measuring with high reliability becouse of less effect from diffracted X-rays, is planarizable and is inexpensive.例文帳に追加

高温高圧に耐えることができ、毒性がなく安全で、酸化雰囲気で酸化されにくく、回折Ｘ線の影響が少なくＸＡＦＳ測定を高い信頼性で行うことができ、Ｘ線透過性に優れ、平坦な形状とすることができ、しかも安価なＸ線透過窓を用いた高性能なＸ線吸収微細構造測定用セルを提供する。 - 特許庁

In addition, the objective lens has at least a diffraction pattern at least on one surface, and, when the light fluxes from the light sources having the different wavelengths are converged on an information recording surface, the first order diffracted ray from the diffraction pattern is used in reproduction of a plurality of recording media together.例文帳に追加

また、対物レンズは少なくとも１つの面に回折パターンを有し、異なる波長の光源からの光束を情報記録面に集光させるとき、複数の記録媒体の再生において、共に前記回折パターンからの１次回折光を用いる。 - 特許庁

The FZP 16 may be substituted with a phase modulation type FZP applied with X-ray nontransmissible processing in a portion other than a Fresnel zone worked part, and light other than objective diffracted light may be shielded by a shielding means provided in the vicinity of a focal point of the FZP 16.例文帳に追加

また、ＦＺＰ１６をフレネルゾーン加工部以外の部分にＸ線不透過処理を施した位相変調型ＦＺＰとしたり、ＦＺＰ１６の焦点近傍に設けた遮蔽手段により目的とする回折光以外の光を遮断するようにした。 - 特許庁

In addition, the objective lens has at least a diffraction pattern at least on one surface, and, when the light fluxes from the light sources having different wavelengths are converged on an information recording surface, the first-order diffracted ray from the diffraction pattern is used in reproduction of a plurality of recording mediums together.例文帳に追加

また、対物レンズは少なくとも１つの面に回折パターンを有し、異なる波長の光源からの光束を情報記録面に集光させるとき、複数の記録媒体の再生において、共に前記回折パターンからの１次回折光を用いる。 - 特許庁

The parallel moving direction of the second slit 12b by the slit position moving device 9 is a direction for displacing the X-ray passing part B of the slit 12b in the advance direction of X rays diffracted by the crystal analyzer 19 when the crystal analyzer 19 is supported by the analyzer support device 13.例文帳に追加

スリット位置移動装置９による第２スリット１２ｂの平行移動方向は、アナライザ支持装置１３が結晶アナライザ１９を支持したときにその結晶アナライザ１９で回折するＸ線が進む方向にスリット１２ｂのＸ線通過部Ｂを変位させる方向である。 - 特許庁

Thus, variation in diffracted X-ray intensity due to difference of the sample holder is prevented in blank measuring without sample, so that the blank measurement is required only for one sample holder (filter and base plate), and the number of measurements can be significantly reduced.例文帳に追加

これにより、試料無しの場合のブランク測定の際に試料ホルダの相違による回折Ｘ線強度のばらつきがなくなるので、１つの試料ホルダ（フィルタ及び基底板）についてのみブランク測定を行えばよくなり、測定回数を大幅に減らすことが可能である。 - 特許庁

With this constitution, a blast angle and a rotary angle can be respectively optimized independently, and the crystal azimuth 12 is accurately and easily adjusted, with respect to the respective directions of incident X rays 2A and diffracted X rays 3A and enables measurement of the X-ray diffraction pattern of the lattice surface 11 of the single-crystal substrate 10 with high accuracy.例文帳に追加

これにより、あおり角と回転角とをそれぞれ独立して最適化することができ、入射Ｘ線２Ａおよび回折Ｘ線３Ａの各方向に対して結晶方位１２を正確かつ容易に調整し、単結晶基板１０の格子面１１におけるＸ線回折パターンを高精度に測定することができる。 - 特許庁

In the X-ray spectrometric method performed using a spectroscopic channel cut crystal (20) having two opposed cut surfaces formed thereto and known in its lattice constant, X rays are diffracted in respective arrangements wherein the spectroscopic channel cut crystal (20) becomes (-, +) and (+, -) and the absolute wavelength of X rays is determined from the difference between the angles of rotation of the crystal in the respective arrangements.例文帳に追加

対向する２つのカット面が形成され、格子定数が既知である分光用チャンネルカット結晶（２０）を用いて行うＸ線分光測定方法であって、分光用チャンネルカット結晶（２０）が（−，＋）および（＋，−）となる各配置においてＸ線を回折させ、各配置における結晶回転角度の差からＸ線の絶対波長を決定する。 - 特許庁

The Cu-Ni-Sn-P copper alloy sheet has a specified composition, and dislocation density determined as the quotient of the half-value breadth of X-ray diffracted intensity peak from the {200} face of the copper alloy sheet surface divided by the height of the peak is a given level or greater to thereby attain an enhancement of stress relaxation resistance property and press punchability demanded for terminal/connector.例文帳に追加

特定組成のＣｕ−Ｎｉ−Ｓｎ−Ｐ系の銅合金板であって、この銅合金板表面の｛２００｝面からのＸ線回折強度ピークの半価幅をそのピーク高さで割った値で測定される転位密度を、一定量以上有するようにして、端子・コネクタとして要求される耐応力緩和特性とプレス打ち抜き性とを向上させる。 - 特許庁