「surface defect」に関連した英語例文の一覧と使い方(14ページ目) - Weblio英語例文検索

First, defect distribution in the vicinity of the surface of a glass substrate to be polished is inspected by a positron annihilation gamma ray measurement.例文帳に追加

研磨対象のガラス基板に対し、まず、陽電子消滅ガンマ線測定により、表面近傍の欠陥分布の検査を行う。 - 特許庁

An inspection map is prepared by performing a defect detection process 32 to the surface of the substrate, and a data base 34a is provided.例文帳に追加

基板表面に対して欠陥検出プロセス３２を行って検査マップを製作し、またデータベース３４ａを提供する。 - 特許庁

To provide a nitrogen-doped wafer which is substantially non-defect from a surface layer up to 10 μm and to provide its manufacturing method.例文帳に追加

表層から１０μｍまで実質的に無欠陥である窒素をドープしたシリコンウェーハおよびその製造方法を提供する。 - 特許庁

CUTTING TOOL MADE OF SURFACE-COATED WC-BASED CEMENTED CARBIDE EXHIBITING EXCELLENT DEFECT RESISTANCE IN HIGH-SPEED INTERMITTENT CUTTING OF STEEL例文帳に追加

鋼の高速断続切削において優れた耐欠損性を発揮する表面被覆ＷＣ基超硬合金製切削工具 - 特許庁

Next, positions of the foreign matter or the defect on the surface of the memory medium and the servo pattern on the transfer master relative to each other are calculated (step S2).例文帳に追加

続いて、記憶媒体表面の異物又は欠陥と、転写マスタのサーボパターンとの相対位置を計算する（ステップＳ２）。 - 特許庁

To provide a structure reforming method which surely prevents the surface of a casting and a casting defect from being communicated with each other.例文帳に追加

鋳造物の表面と鋳造欠陥とが連通することをより確実に防ぐ組織改質方法を提供する。 - 特許庁

To highly accurately detect a defect in a sample without destructing a metal structure even if the surface of the sample has recessions and protrusions.例文帳に追加

サンプル表面が凹凸である場合でも、金属構造物を破壊することなく高精度でサンプル内の欠陥を検出する。 - 特許庁

To prevent an image defect caused by potential irregularity by extending the control range of the surface potential of a photoreceptor drum by a scorotron electrifier.例文帳に追加

スコロトロン帯電器による感光ドラムの表面電位の制御範囲を広げて、電位ムラに起因する画像不良を防止する。 - 特許庁

To detect with high sensitivity foreign matters adhering to the microscopic patterns formed on the surface of a semiconductor device and the location of the defect, such as an abnormality in the patterns.例文帳に追加

半導体装置の微小パターンに付着した異物やパターンの異常等の欠陥箇所を高感度で検出する。 - 特許庁

To simplify the constitution of a surface defect inspection device for inspection by an interference phase measuring system and a scattered light detection system.例文帳に追加

干渉位相測定系及び散乱光検出系による検査を行う表面欠陥検査装置の構成を簡略化する。 - 特許庁

To provide a liquid crystal display panel inspection illuminator preventing a part hard to see a display defect of a liquid crystal panel from occurring by making incident a uniform illumination beam on a reflection type liquid crystal panel surface.例文帳に追加

反射型液晶ディスプレイパネルの検査において、検査時の視認性を向上できる照明器を設けること。 - 特許庁

To provide an optical disk having no visually conspicuous defect on an image recording surface and having high productivity, and to provide a method for manufacturing optical disks.例文帳に追加

画像記録面に視覚的に目立つ欠陥がなく生産性の高い光ディスクおよびその製造方法を提供する。 - 特許庁

To provide ceramic electronic parts which can suppress the appearance defect as that silver is precipitated onto the surface of a low-temperature baked ceramic.例文帳に追加

低温焼成セラミックス表面へ銀が析出するという外観不良を抑制したセラミック電子部品を提供する。 - 特許庁

A semiconductor device includes a low defect, strained second semiconductor crystalline material over the surface of the first crystalline material.例文帳に追加

半導体デバイスは、第１の結晶材料の表面上に低欠陥の歪んだ第２の半導体結晶材料を含む。 - 特許庁

To simplify the configuration of a surface defect-inspecting apparatus for inspecting by an interference phase measuring system and a scattered light detection system.例文帳に追加

干渉位相測定系及び散乱光検出系による検査を行う表面欠陥検査装置の構成を簡略化する。 - 特許庁

This skew ion implantation can suppress a crystal defect caused by damage by ion implantation on the surface of the substrate.例文帳に追加

そして、このような斜めイオン注入によれば、基板表面にイオン注入のダメージによる結晶欠陥を抑制できる。 - 特許庁

To obtain a casting having uniform shape without a shrinkage hole in the inner part of a cast block and surface defect such as crack and remarkable ruggedness.例文帳に追加

鋳塊内部に引け巣がなく表面欠陥、例えばクラック、激しい凹凸のない均一形状の鋳造物を得る。 - 特許庁

To detect a fine defect with higher sensitivity, in a surface inspection device for detecting automatically the fine defect generated on the surface by imaging by an image sensor the surface which is an inspection object irradiated with parallel light by a surface light source device, and by detecting that an image signal level is lowered from a high signal level corresponding to the normal surface.例文帳に追加

面光源装置により平行光を照射された検査対象となる表面をイメージセンサで撮像して、その画像信号レベルが、正常な表面に対応する高信号レベルから低下するのを検出して表面に生じている微小欠陥を自動的に検知するための表面検査装置において、微小欠陥をさらに高感度で検出可能にする。 - 特許庁

A known standard defect 9 is provided in a sample 2, the defect appearing on a surface of the sample 2 is detected, and prescribed processing recipe evaluation information that varies in response to difference in a processing recipe used in the prescribed production process is acquired, based on a detection result of the standard defect 9.例文帳に追加

試料２に既知の標準欠陥９を設けて、試料２の表面に現れる欠陥を検出し、所定の製造プロセスで使用された処理レシピの相違に応じて変化する所定の処理レシピ評価情報を、標準欠陥９の検出結果に基づいて取得する。 - 特許庁

To provide a defect detection method of a roller bearing by torque monitoring, which detects accurately a fine defect existing on the rolling contact surface or on a roller of the roller bearing of a finished product, also detects stably a large defect by which rotation is locked, and shortens a time required for detection.例文帳に追加

完成品でのころ軸受の転走面やころに存在する微少な欠陥を精度良く検出でき、また回転がロックしてしまう大欠陥も安定して検出でき、検出の所要時間も短縮できるトルク監視によるころ軸受の欠陥検出方法を提供する。 - 特許庁

A defect inspection method for inspecting the defect of the surface of a sample, includes the step of detecting the defect by addition processing of a detecting signal in which the amount of the misalignment of a pixel of detection signals calculated by comparing the distribution of Haze signal and predetermined light quantity distribution is corrected.例文帳に追加

試料の表面の欠陥を検査する欠陥検査方法であって、Ｈａｚｅ信号の分布と予め定めた光量分布とを比較して算出した検出信号の画素ずれ量を補正した検出信号を加算処理して欠陥を検出する工程を有する欠陥検査方法。 - 特許庁

To provide a method for detecting a defect and a defect detection device in a continuously cast slab for a thin steel sheet which can estimate and detect a cracking defect generated on the surface of a slab to be formed into the stock of a continuously cast thin steel sheet with high accuracy in a stage directly after casting.例文帳に追加

連続鋳造した薄鋼板の素材となる鋳片（スラブ）表面に発生した割れ性の欠陥を、鋳造特後の段階で、精度よく予測し、検出することが可能な薄鋼板用の連続鋳造鋳片の欠陥検出方法と欠陥検出装置を提供する。 - 特許庁

In the production of silicon wafer, size of grown-in defect is made small by doping nitrogen when silicon ingot is pulled up and a defect-free layer is formed on the surface of wafer and oxygen deposit is produced in high density in the interior and whisker-like defect is produced by carrying out heat treatment.例文帳に追加

シリコンウェーハ製造に際し、シリコンインゴット引上げ時に窒素をドープすることにより、Ｇｒｏｗｎ−ｉｎ欠陥のサイズを小さくし、熱処理を行うことによりウェーハ表面に無欠陥層を形成し、内部に高密度に酸素析出物を生成させかつヒゲ状欠陥を生成させる。 - 特許庁

To provide a surface treating method of a coating defect article which can perform the repairing work of the coating defect part of the coating defect article uniformly and independently of workers, in a short time, by generating no variation or irregularity and by generating no environmental problems or raising the cost as before.例文帳に追加

塗装不良品の塗装欠陥部の補修作業を、従来のような環境問題や高コスト化を引き起こすことなく、作業者によらず均一に、かつ短時間で、バラツキやムラを生ずることなく行うことができる塗装不良品の表面処理方法を提供する。 - 特許庁

To provide a painting defect inspection method, capable of determining accurately and easily existence of a painting defect, when irradiating with light, a base material having an irregular surface, on which a paint film is formed on the irregular surface, and when detecting reflected light from the paint film, to thereby detect a painting defect based on intensity of the reflected light.例文帳に追加

凹凸面を有しこの凹凸面に塗膜が形成された基材に対して光を照射すると共に前記塗膜からの反射光を検出し、この反射光の強度に基づいて塗装不良を検出するにあたり、塗装不良の有無を正確且つ容易に判定することができる塗装不良検査方法を提供する。 - 特許庁

To provide an inspection device capable of obtaining a focused and clear enlarged image of a surface of a metal mold for anti-glare treatment having surface unevenness, and thereby capable of detecting a defect and determining whether the metal mold is a defect or not, with high accuracy.例文帳に追加

表面凹凸を有する防眩処理用金型の表面について焦点の合った鮮明な拡大画像を取得することができ、もって、欠陥の検出および欠陥か否かの判別を精度良く行なうことができる検査装置を提供する。 - 特許庁

To provide a method for manufacturing a silicon single crystal, by which the silicon single crystal, characterized in that the variation of the crystal defect distribution in the radial direction is small over the whole crystal length and the whole surface of a cut surface cut in the radial direction has one kind of crystal defect area, can be easily manufactured.例文帳に追加

結晶全長にわたって径方向の結晶欠陥分布の変化が小さく、径方向の切断面の全面が１種類の結晶欠陥領域であるシリコン単結晶を容易に製造できるシリコン単結晶製造方法を提供する。 - 特許庁

The presence/absence of an anisotropic defect 6 on the surface 2a of a semiconductor wafer 1' is detected by scanning the surface 2a of the wafer 1' with light L along the longitudinal direction of the defect 6 on the basis of the direction of semiconductor crystals constituting the wafer 1'.例文帳に追加

半導体ウェーハ１′を構成する半導体の結晶の方向を基準にして、異方性を有した欠陥６の長手方向に沿って光Ｌを走査し、半導体ウェーハ表面２ａに存在する異方性を有した欠陥６の有無を検出する。 - 特許庁

Consequently, the surface layer is heated at a temperature equal to or higher than 1,350°C and lower than the fusion point, so that the dislocation in the STI region is prevented to reduce or eliminate the polishing damage, the local unevenness defect of the wafer surface caused by polishing or a microcrystal defect.例文帳に追加

これにより、表層が１３５０℃以上融点未満で加熱されるので、ＳＴＩ領域の転位発生を防ぎ、研磨ダメージやウェーハ表面の研磨起因の局所的な凹凸欠陥あるいは微小結晶欠陥を低減または消滅できる。 - 特許庁

A ZnO film 2 of a prescribed thickness is deposited on the surface of the primary seed crystal 21 by a vapor phase growth process (VPE) for the purpose of preventing the influence of the crystal defect regions, by which the arrival of the crystal defect regions at the surface of the ZnO film 2 is prevented.例文帳に追加

この結晶欠陥領域の影響を防止するために気相成長法（ＶＰＥ）によって、１次種結晶２１の表面に所定厚さのＺｎＯ膜２を成膜し、結晶欠陥領域がＺｎＯ膜２の表面まで到達しないようにする。 - 特許庁

Consequently, the protective layer 20C is deformed, and stress is caused in the surface of the protective layer 20C, with the result that a defect may be caused in the surface of the protective layer 20C due to the stress, ending up cracking or distorting the fixing belt 20 from this defect.例文帳に追加

これにより、保護層２０Ｃが変形し、保護層２０Ｃの表面に応力が生じてこの応力によって保護層２０Ｃの表面に欠陥が生じ、この欠陥を起点として定着ベルト２０に亀裂や捩じれが生じることが考えられる。 - 特許庁

The surface inspection apparatus irradiates an outer peripheral surface to be an inspecting surface of an object to be inspected with an optical beam from a light source through light irradiation means, receives reflected light from the inspecting surface by light receiving means and detects a defect existing on the inspecting surface based on the light quantity of the received reflected light.例文帳に追加

光源からの光ビームを光照射手段を介して被検査物の被検査面である外周面に照射し、受光手段により被検査面からの反射光を受光し、受光した反射光の光量に基づいて被検査面上に存在する欠陥を検出する装置である。 - 特許庁

In Fig. 15, showing the actuator of a magnetic disk, when nine surfaces except a servo surface 52 among ten recording surfaces in total are used as the parallel recording type of two surfaces in one set, one surface is odd, and this surface is used as an alternative surface, when one surface of one set of two surfaces has a defect.例文帳に追加

磁気ディスクのアクチュエータを示す図１５において、合計１０面の記録面のうち、サーボ面５２を除く残り９面を、２面１組のパラレル記録形とすると、１面が半端となるが、これを、２面１組の中の１面が欠陥をもつとき、その代替として使用する。 - 特許庁

The light receiving surface of the front surface of the semiconductor substrate 11 has a specific texture structure having a top portion formed in flat, and its surface area is reduced compared to a conventional general texture structure having a pointed top portion, and thus, as the amount of defect on the surface front surface of the semiconductor substrate 11 decreases, the more amount of incident lights increases.例文帳に追加

半導体基板１１の表面の受光面は、頂部が平坦に形成された特定のテクスチャ構造とされており、従来一般の頂部が尖ったテクスチャ構造に較べて表面積が減少しているため、その分、半導体基板１１の表面欠陥量が減少する。 - 特許庁

To provide a surface-treated steel plate having excellent wet resin adhesiveness and corrosion resistance without using Cr, and free from occurrence of any striation surface defect, and to provide a manufacturing method of the surface-treated steel plate, and to provide a resin-coated steel plate using the surface-treated steel plate.例文帳に追加

Crを用いず、優れた湿潤樹脂密着性と耐食性を有し、筋状の表面欠陥が発生することのない表面処理鋼板、その製造方法およびこの表面処理鋼板を用いた樹脂被覆鋼板を提供する。 - 特許庁

To stabilize the quality of an annealed wafer by reliably decreasing SSDs (surface shallow defects which are recessed defects of an extremely wide and shallow shape on the surface), while ensuring generation of void defects other than the SSDs and generation of BMDs (bulk micro defects) indispensable as a gettering source in the bulk.例文帳に追加

アニールウェーハにとって必要不可欠なウェーハ表面におけるＳＳＤ（表面の非常に幅広く、浅い形状の凹状欠陥；Surface Shallow Defect）以外のボイド欠陥の低減や、バルク内のゲッタリング源としてのＢＭＤ（バルク微細欠陥；Bulk micro defect）の生成を保証しつつ、ＳＳＤを確実に低減させるようにして、アニールウェーハの品質を安定させる。 - 特許庁

To provide a practical method and detector for detecting a micro surface roughness and defect, capable of detecting surely such the micro surface roughness and defect having about several μm of roughness difficult generally to be visually confirmed, and difficult to be automatically detected, as detected by grinding using a grinding stone, in an objective specimen with a coarse surface roughness.例文帳に追加

表面粗さの粗い被検査対象物において通常視認困難で、砥石がけ検査により検出しているような自動検出が困難な凹凸が数μm程度の微小凹凸欠陥を確実に検出できる実用的な微小凹凸表面欠陥の検出方法及び装置を提供することを目的とする。 - 特許庁

To use an existing reproduction system for detecting an error by using the reflected light of a recorded light reflected on a recording surface when optical information is recorded in the recording surface of an optical disk, and to determine whether the defect on the surface of the optical disk is a defect or not to cause the recording mistake of the optical information in one RUB.例文帳に追加

光ディスクの記録面に光情報を記録する時に記録面で反射された記録光の反射光を用いることでエラー検出に既存の再生系を利用可能にし、光ディスクの表面に付けられた欠陥が１ＲＵＢ内で光情報の記録ミスを生じさせる欠陥か否かを判定する。 - 特許庁

To aim at a removal of a surface defect layer existing on the surface of an anode of a CCM board, protection of the anode surface, and, by extension, at prevention of rise of drive voltage of an organic EL element as well as maintenance of luminous uniformity.例文帳に追加

ＣＣＭ基板の陽極表面に存在する表面不良層を除去し、陽極表面を保護し、ひいては、有機ＥＬ素子の駆動電圧の上昇防止や発光均一性の維持を目的とする。 - 特許庁

In the method for repairing a surface defect which is an affected layer of the surface of a single crystal wafer used for a semiconductor, a MEMS and an optical lens, etc., the surface of the single crystal is irradiated with a pulse laser one time.例文帳に追加

半導体やＭＥＭＳや光学レンズに使用されている単結晶ウエハーの表面の加工変質層である表面欠陥の修復方法において、単結晶表面にパルスレーザーを１回照射する。 - 特許庁

In the defect selecting apparatus 15a, the candidates of slender-shaped outer-layer and surface defects among which the rolling direction is taken as a long side is decided on the basis of the informations from the defect detecting apparatus 13a as the objects of removal.例文帳に追加

欠陥選択装置１５ａは、欠陥検出装置１３ａからの情報を基に、圧延方向が長辺となる細長形状の表層・表面欠陥候補を除去対象として決定する。 - 特許庁

A signal processing circuit 60 discriminates between the surface defect and the internal defect of the substrate 1 from the intensity difference between the scattered light received by the first light receiving system and the scattered light received by the second light receiving system.例文帳に追加

信号処理回路６０は、第１の受光系が受光した散乱光と第２の受光系が受光した散乱光との強度の違いから、基板１の表面の欠陥と内部の欠陥とを弁別する。 - 特許庁

To prevent occurrence of a reading defect or a feeding defect by pressing originals of a plurality of thickness such as of thick paper and thin paper with a considerably difference in thickness on a glass surface of an image sensor with appropriate pressures.例文帳に追加

厚さに大きな違いがある厚紙、薄紙等の複数の厚さを有する原稿を、適切な押圧力でイメージセンサのガラス面に押し付けることができるようにし、読み取り不良や送り不良の発生を防止する。 - 特許庁

To provide a highly reliable defect inspection device for thoroughly detecting even an irregularly-shaped defect of a small curvature change caused on the surface of a transparent sheet-like object and formable at low cost and in a space saving manner.例文帳に追加

透明体シート状物表面に発生した曲率変化の小さな凹凸状欠陥でも漏れなく検出し、低コスト、かつ、省スペースで構成できる信頼性の高い欠陥検査装置を提供する。 - 特許庁

To provide a method for detecting a shape defect of a molded article capable of detecting a defect on a lower surface of the molded article with high accuracy, and detecting general deformation such as a warpage of the molded article.例文帳に追加

成形品の下面の欠陥を精度高く検出することができ、しかも成形品の反りなどの全体的な変形についても検出することができる成形品の形状欠陥検出方法を提供する。 - 特許庁